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Resolving atlas obsolescence problems : Lessons learned and new opportunitiesNEAG, Ion A; HYDE, Jack; RAMACHANDRAN, Narayanan et al.Autotestcon 2004. 2004, pp 226-232, isbn 0-7803-8449-0, 1Vol, 7 p.Conference Paper

A/MS BISTs: The FACTS, just the factsFRISCH, Arnold.Proceedings - International Test Conference. 2002, issn 1089-3539, isbn 0-7803-7542-4, p. 1201Conference Paper

Optimal Self-Testing Embedded parity checkersNIKOLOS, D.IEEE transactions on computers. 1998, Vol 47, Num 3, pp 313-321, issn 0018-9340Article

Ansi mezzanine modules facilitate flexible reconfigurationHARRISON, Fred.Autotestcon 2004. 2004, pp 321-324, isbn 0-7803-8449-0, 1Vol, 4 p.Conference Paper

FST : A good investmentVOIGT, Karl A.Autotestcon 2004. 2004, pp 540-545, isbn 0-7803-8449-0, 1Vol, 6 p.Conference Paper

IVI drivers : New requirements for IVI conformanceHULETT, Jeff.Autotestcon 2004. 2004, pp 181-184, isbn 0-7803-8449-0, 1Vol, 4 p.Conference Paper

Increasing the testability of object-oriented frameworks with built-in testsTAEWOONG JEON; SUNGYOUNG LEE; HYONWOO SEUNG et al.Lecture notes in computer science. 2002, pp 169-182, issn 0302-9743, isbn 3-540-43968-4, 14 p.Conference Paper

Enhancing BIST based single/multiple stuck-at fault diagnosis by ambiguous test setTAKAHASHI, Hiroshi; YAMAMOTO, Yukihiro; HIGAMI, Yoshinobu et al.Asian test symposium. 2004, pp 216-221, isbn 0-7695-2235-1, 1Vol, 6 p.Conference Paper

Pre-emptive management of instrument obsolescenceKNOWLES, John; MACLENNAN, Doug.Autotestcon 2004. 2004, pp 52-57, isbn 0-7803-8449-0, 1Vol, 6 p.Conference Paper

CAEN-BIST : Testing the nanofabricBROWN, Jason G; BLANTON, R. D.International Test Conference. 2004, pp 462-471, isbn 0-7803-8580-2, 1Vol, 10 p.Conference Paper

A modular wrapper enabling high speed BIST and repair for small wide memoriesAITKEN, Robert C.International Test Conference. 2004, pp 997-1005, isbn 0-7803-8580-2, 1Vol, 9 p.Conference Paper

X-tolerant signature analysisMITRA, Subhasish; LUMETTA, Steven S; MITZENMACHER, Michael et al.International Test Conference. 2004, pp 432-441, isbn 0-7803-8580-2, 1Vol, 10 p.Conference Paper

Techniques de Test pour Circuits à Courants Commutés = Test Techniques for Switched-Current CircuitsBodin, Jean-Charles; Bertrand, Yves.1999, 159 p.Thesis

Resolving Test Ambiguity with IEEE 1641 Part 34 in a series of tutorials on instrumentation and measurementHULME, Ashley.IEEE instrumentation & measurement magazine. 2011, Vol 14, Num 5, pp 18-26, issn 1094-6969, 9 p.Article

Defect level vs. yield and fault coverage in the presence of an unreliable BISTNAKAMURA, Yoshiyuki; SAVIR, Jacob; FUJIWARA, Hideo et al.IEICE transactions on information and systems. 2005, Vol 88, Num 6, pp 1210-1216, issn 0916-8532, 7 p.Article

Automated diagnosis and probing flow for fast fault localization in ICMARTIN, D; DESPLATS, R; HALLE, G et al.Microelectronics and reliability. 2004, Vol 44, Num 9-11, pp 1553-1558, issn 0026-2714, 6 p.Conference Paper

At-speed built-in self-repair analyzer for embedded word-oriented memoriesXIAOGANG DU; REDDY, Sudhakar M; CHENG, Wu-Tung et al.International Conference on Embedded Systems DesignInternational Conference on VLSI Design. 2004, pp 895-900, isbn 0-7695-2072-3, 1Vol, 6 p.Conference Paper

Practical instrumentation integration considerationsANDERSON, Thomas J.International Test Conference. 2004, pp 1078-1080, isbn 0-7803-8580-2, 1Vol, 3 p.Conference Paper

RF testing on a mixed signal testerBROWN, Dana; FERRARIO, John; WOLF, Randy et al.International Test Conference. 2004, pp 793-800, isbn 0-7803-8580-2, 1Vol, 8 p.Conference Paper

Scan-based BIST using an improved scan forest architectureDONG XIANG; CHEN, Ming-Jing; LI, Kai-Wei et al.Asian test symposium. 2004, pp 88-93, isbn 0-7695-2235-1, 1Vol, 6 p.Conference Paper

Intelligent agents and BIST/BISR: Working together in distributed systemsMICLEA, Liviu; SZILARD, Enyedi; BENSO, Alfredo et al.Proceedings - International Test Conference. 2002, pp 940-946, issn 1089-3539, isbn 0-7803-7542-4, 7 p.Conference Paper

A built-in self-test method for diagnosis of synchronous sequential circuitsPOMERANZ, Irith; REDDY, Sudhakar M.IEEE transactions on very large scale integration (VLSI) systems. 2001, Vol 9, Num 2, pp 290-296, issn 1063-8210Article

Built-in self-test design of current-mode algorithmic analog-to-digital convertersWEY, C.-L.IEEE transactions on instrumentation and measurement. 1997, Vol 46, Num 3, pp 667-671, issn 0018-9456Article