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Etude des mécanismes de décharges partielles dans les cavités gazeuses au contact de solides ou de liquides isolants : relations avec le phénomène de gassing des liquidesBezborodko, Pierre; Tobazeon, Robert.1988, 110 p.Thesis

Self-stabilized avalanche process in MIS structures under non-stationary conditions. I: Generation of carriers due to illumination = Processus d'avalanches self-stabilisées dans les structures MIS dans les conditions non stationnairesUSIKOV, V. D.Physica status solidi. A. Applied research. 1989, Vol 113, Num 2, pp 667-675, issn 0031-8965Article

The statistical distribution of the number of electrons in avalanches followed by successorsKONDO, Y; KAJITA, S; USHIRODA, S et al.Journal of physics. D, Applied physics (Print). 1984, Vol 17, Num 7, pp 1361-1367, issn 0022-3727Article

Analyse des caractéristiques d'un ozoneur avec un modèle d'avalanche d'électrons de Townsend = Analysis of characteristics of ozonizer using the Townsend avalanche modelSUGIMITSU, H; MORIWAKI, T; OKAZAKI, S et al.Journal de chimie physique. 1984, Vol 81, Num 5, pp 355-359, issn 0021-7689Article

Rayon critique de l'avalanche électronique lors du claquage streamer du néonGUSHCHIN, E. M; LEBEDEV, A. N; SOMOV, S. V et al.Fizika plazmy (Moskva, 1975). 1983, Vol 9, Num 6, pp 1278-1281, issn 0134-5052Article

Model of the avalanche multiplication in MIS structuresBOGDANOV, S. V; KRAVCHENKO, A. B; PLOTNIKOV, A. F et al.Physica status solidi. A. Applied research. 1986, Vol 93, Num 1, pp 361-367, issn 0031-8965Article

Electron avalanches influenced by detachment and conversion processesWEN, C; WETZER, J. M.IEEE transactions on electrical insulation. 1988, Vol 23, Num 6, pp 999-1008, issn 0018-9367Article

Distribution of the number of electrons in electron avalanches at voltages in excess of the sparking valueKONDO, Y.Journal of applied physics. 1985, Vol 57, Num 3, pp 995-996, issn 0021-8979Article

The effect of humidity on avalanche growth and streamer initiationALLEN, N. L.Journal of physics. D, Applied physics (Print). 1985, Vol 18, Num 1, pp 47-52, issn 0022-3727Article

Laser initiated electron avalanches observed in a laser microprobe mass spectrometerHUTT, K. W; WALLACH, E. R.Journal of applied physics. 1989, Vol 66, Num 5, pp 2223-2225, issn 0021-8979Article

LES PHENOMENES DE CLAQUAGE DANS LES SEMI-CONDUCTEURS.HERNANDEZ D.1975; CENTRE NATION. ET. SPATIALES, NOTE TECH.; FR.; DA. 1975; NO 23; PP. 1-26; ABS. ANGL.; BIBL. 8 REF.Serial Issue

DEVELOPPEMENT DES AVALANCHES ELECTRONIQUES ET DES STREAMERSLOZANSKIJ EH D.1975; USP. FIZ. NAUK; S.S.S.R.; DA. 1975; VOL. 117; NO 3; PP. 493-521; BIBL. 2 P. 1/2Article

VARIATION EN FONCTION DE LA FREQUENCE ET DE LA TEMPERATURE DE L'IONISATION PAR AVALANCHE DANS LES CORPS SOLIDES SOUS L'ACTION D'UN CHAMP ELECTROMAGNETIQUEEPIFANOV AS; MANENKOV AA; PROKHOROV AM et al.1975; PIS'MA ZH. EKSPER. TEOR. FIZ.; S.S.S.R.; DA. 1975; VOL. 21; NO 8; PP. 483-486; BIBL. 8 REF.Article

MICROSCOPIC EVOLUTION OF THE IONIZING COLLISION FREQUENCY IN TOWNSEND AVALANCHES.VIDAL G; LACAZE J; MAUREL J et al.1974; J. PHYS. D; G.B.; DA. 1974; VOL. 7; NO 12; PP. 1684-1698; BIBL. 16 REF.Article

AVALANCHE SWITCHING IN JUNCTION TRANSISTORS.CHATURVEDI PK.1974; J. INSTIT. ELECTRON. TELECOMMUNIC. ENGRS; INDIA; DA. 1974; VOL. 20; NO 5; PP. 198-202; BIBL. 10 REF.Article

ON THE AVALANCHE INITIATION PROBABILITY OF AVALANCHE DIODES ABOVE THE BREAKDOWN VOLTAGE = SUR LA PROBABILITE D'AMORCAGE D'AVALANCHES DANS DES DIODES A AVALANCHE, AU-DESSUS DE LA TENSION DE CLAQUAGEMCINTYRE RJ.1973; I.E.E.E. TRANS. ELECTRON DEVICES; U.S.A.; DA. 1973; VOL. 20; NO 7; PP. 637-641; BIBL. 19 REF.Serial Issue

SUBSURFACE BREAKDOWN DEVICE RELIABILITYMAR J.1973; I.E.E.E. TRANS. ELECTRON DEVICES; U.S.A.; DA. 1973; VOL. 20; NO 3; PP. 330-331; BIBL. 4 REF.Serial Issue

TRIGGERING PHENOMENA IN AVALANCHE DIODESOLDHAM WG; SAMUELSON RR; ANTOGNETTI P et al.1972; I.E.E.E. TRANS. ELECTRON DEVICES; U.S.A.; DA. 1972; VOL. 19; NO 9; PP. 1056-1060; BIBL. 19 REF.Serial Issue

ANALYSE DES MECANISMES DE FORMATION DU STREAMERBAYLE P; SCHMIED H.1972; CERN-72-9; SUISSE; DA. 1972; PP. (34 P.); BIBL. 21 REF.Report

ANALYTICAL SOLUTIONS FOR AVALANCHE-BREAKDOWN VOLTAGES OF SINGLE-DIFFUSED GAUSSIAN JUNCTIONSSHENAI K; LIN HC.1983; SOLID-STATE ELECTRONICS; ISSN 0038-1101; GBR; DA. 1983; VOL. 26; NO 3; PP. 211-216; BIBL. 11 REF.Article

CURRENT MULTIPLICATION RATE AT THE PERIPHERIES OF BURIED JUNCTIONS.TAKUMIYA S; KONDO A; SHIRAHATA K et al.1974; JAP. J. APPL. PHYS.; JAP.; DA. 1974; VOL. 13; NO 4; PP. 743-744; BIBL. 4 REF.Article

SUR LA THEORIE DES PHENOMENES MICROPLASMIQUES DANS LES JONCTIONS P-NALADINSKIJ VK.1972; FIZ. TEKH. POLUPROVODN.; S.S.S.R.; DA. 1972; VOL. 6; NO 10; PP. 2034-2041; BIBL. 14 REF.Serial Issue

AVALANCHE BREAKDOWN VOLTAGE OF A MICROWAVE PIN DIODE.RATNAKUMAR KN.1976; SOLID-STATE ELECTRON.; G.B.; DA. 1976; VOL. 19; NO 7; PP. 655-656; BIBL. 3 REF.Article

ELECTRONIC SWITCHING IN PYRANTHRONE THIN FILM.SAKAI Y; SADAOKA Y.1975; CHEM. LETTERS; JAP.; DA. 1975; NO 5; PP. 455-458; BIBL. 8 REF.Article

ETUDE DES DOMAINES LOCAUX DE CHARGE NEGATIVE DANS LE SYSTEME MOSSHIRSHOV YU M; FROLOV OS; GAL'KA IM et al.1974; MIKROELEKTRONIKA; S.S.S.R.; DA. 1974; VOL. 3; NO 4; PP. 332-336; BIBL. 8 REF.Article

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