au.\*:("BARTH PW")
Results 1 to 1 of 1
Selection :
A DUAL-GATE DEEP-DEPLETION TECHNIQUE FOR GENERATION LIFETIME MEASUREMENTBARTH PW; ANGELL JB.1980; IEEE TRANS. ELECTRON DEVICES; ISSN 0018-9383; USA; DA. 1980; VOL. 27; NO 12; PP. 2252-2255; BIBL. 6 REF.Article