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au.\*:("BASHARA NM")

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ZIRCALOY OXIDE THICKNESS MEASUREMENT BY ELLIPSOMETRYPENG YK; BASHARA NM.1980; J. NUCL. MATER.; NLD; DA. 1980-09; VOL. 92; NO 2/3; PP. 306-312; BIBL. 13 REF.Article

AVERAGE POLARIZATION OF PARTIALLY POLARIZED LIGHT.AZZAM RMA; BASHARA NM.1974; J. OPT. SOC. AMER.; U.S.A.; DA. 1974; VOL. 64; NO 3; PP. 398-399; BIBL. 12 REF.Article

APPLICATION OF GENERALIZED ELLIPSOMETRY TO ANISOTROPIC CRYSTALS.AZZAM RMA; BASHARA NM.1974; J. OPT. SOC. AMER.; U.S.A.; DA. 1974; VOL. 64; NO 2; PP. 130-133; BIBL. 26 REF.Article

DETERMINATION OF RATIO OF COMPLEX EIGENVALUES OF OPTICAL SYSTEMS WITH KNOWN EIGENPOLARIZATIONS BY ELLIPSOMETRY.AZZAM RMA; BASHARA NM.1974; OPT. ACTA; G.B.; DA. 1974; VOL. 21; NO 6; PP. 497-507; ABS. FR. ALLEM.; BIBL. 7 REF.Article

OPTICAL PROPERTIES OF ZIRCALOY AND ZIRCALOY OXIDE BY ELLIPSOMETRY = ETUDE PAR ELLIPSOMETRIE DES PROPRIETES OPTIQUES DU ZIRCALOY ET DE L'OXYDE DU ZIRCALOYBASHARA NM; PENG YK.1980; APPL. OPT.; ISSN 0003-6935; USA; DA. 1980; VOL. 19; NO 18; PP. 3245-3251; BIBL. 5 REF.Article

CHARACTERIZATION OF A VERY THIN UNIAXIAL FILM ON A NONABSORBING SUBSTRATE BY MULTIPLE WAVELENGTH ELLIPSOMETRY: PALMITIC ACID ON WATERAYOUB GT; BASHARA NM.1978; J. OPT. SOC. AMER.; USA; DA. 1978; VOL. 68; NO 7; PP. 978-983; BIBL. 15 REF.Article

ZIRCALOY OXIDE THICKNESS MEASUREMENT BY ELLIPSOMETRYPENG YK; BASHARA NM.1980; J. NUCL. MATER.; ISSN 0022-3115; NLD; DA. 1980; VOL. 92; NO 2-3; PP. 306-312; BIBL. 13 REF.Article

IN PROCESS ELLIPSOMETER AZIMUTH ANGLE CALIBRATION.ADAMS JR; BASHARA NM.1976; APPL. OPT.; U.S.A.; DA. 1976; VOL. 15; NO 12; PP. 3179-3184; BIBL. 12 REF.Article

DETERMINATION OF THE COMPLEX REFRACTIVE INDEX PROFILES IN P31+ ION IMPLANTED SILICON BY ELLIPSOMETRY.ADAMS JR; BASHARA NM.1975; SURF. SCI.; NETHERL.; DA. 1975; VOL. 49; NO 2; PP. 441-458; BIBL. 1 P. 1/2Article

ANALYSIS OF SYSTEMATIC ERRORS IN ROTATING-ANALYZER ELLIPSOMETERS.AZZAM RMA; BASHARA NM.1974; J. OPT. SOC. AMER.; U.S.A.; DA. 1974; VOL. 64; NO 11; PP. 1459-1469; BIBL. 43 REF.Article

OPTIMIZING NULL ELLIPSOMETRY FOR OXIDIZED SILICONBU ABBUD GH; BASHARA NM.1981; APPL. OPT.; ISSN 0003-6935; USA; DA. 1981; VOL. 20; NO 16; PP. 2815-2818; BIBL. 11 REF.Article

PARAMETER CORRELATION AND PRECISION IN MULTIPLE-ANGLE ELLIPSOMETRYBU ABBUD GH; BASHARA NM.1981; APPL. OPT.; ISSN 0003-6935; USA; DA. 1981; VOL. 20; NO 17; PP. 3020-3080; 8 P.; BIBL. 5 REF.Article

TRAJECTORIES DESCRIBING THE EVOLUTION OF POLARIZED LIGHT IN HOMOGENEOUS ANISOTROPIC MEDIA AND LIQUID CRYSTALSAZZAM RMA; MERRILL BE; BASHARA NM et al.1973; APPL. OPT.; U.S.A.; DA. 1973; VOL. 12; NO 4; PP. 764-771; BIBL. 8 REF.Serial Issue

INFRARED ELLIPSOMETRY - MEASUREMENT OF THE OPTICAL PROPERTIES OF THIN SILVER AND GOLD FILMS AT 1.15, 3.39 AND 10 MU MADAMS JR; ZEIDLER JR; BASHARA NM et al.1975; OPT. COMMUNIC.; NETHERL.; DA. 1975; VOL. 15; NO 1; PP. 115-120; BIBL. 19 REF.Miscellaneous

THE FIXED-POLARIZER NULLING SCHEME IN GENERALIZED ELLIPSOMETRYAZZAM RMA; BUNDY TL; BASHARA NM et al.1973; OPTICS COMMUNIC.; NETHERL.; DA. 1973; VOL. 7; NO 2; PP. 110-115; BIBL. 6 REF.Serial Issue

SIO2-SI-SUBSTRATE SINGLE-REFLECTION RETARDERS FOR DIFFERENT MERCURY SPECTRAL LINES.ZAGHLOUL ARM; AZZAM RMA; BASHARA NM et al.1978; OPT. ENGNG; U.S.A.; DA. 1978; VOL. 17; NO 2; PP. 180-184; BIBL. 4 REF.Article

ELLIPSOMETER NULLING: CONVERGENCE AND SPEED.CONFER DL; AZZAM RMA; BASHARA NM et al.1976; APPL. OPT.; U.S.A.; DA. 1976; VOL. 15; NO 10; PP. 2568-2575; BIBL. DISSEM.Article

POLARIZER-SURFACE-ANALYZER NULL ELLIPSOMETRY FOR FILM-SUBSTRATE SYSTEMS.AZZAM RMA; ZAGHLOUL ARM; BASHARA NM et al.1975; J. OPT. SOC. AMER.; U.S.A.; DA. 1975; VOL. 65; NO 12; PP. 1464-1471; BIBL. 17 REF.Article

BEAM DEVIATION ERRORS IN ELLIPSOMETRIC MEASUREMENTS; AN ANALYSIS.ZEIDLER JR; KOHLES RB; BASHARA NM et al.1974; APPL. OPT.; U.S.A.; DA. 1974; VOL. 13; NO 8; PP. 1938-1945; BIBL. 21 REF.Article

DESIGN OF FILM-SUBSTRATE SINGLE-REFLECTION LINEAR PARTIAL POLARIZERS.AZZAM RMA; ZAGHLOUL ARM; BASHARA NM et al.1975; J. OPT. SOC. AMER.; U.S.A.; DA. 1975; VOL. 65; NO 12; PP. 1472-1474; BIBL. 5 REF.Article

DESIGN OF FILM-SUBSTRATE SINGLE-REFLECTION RETARDERS.ZAGHLOUL ARM; AZZAM RMA; BASHARA NM et al.1975; J. OPT. SOC. AMER.; U.S.A.; DA. 1975; VOL. 65; NO 9; PP. 1043-1049; BIBL. 13 REF.Article

ELLIPSOMETRIC FUNCTION OF A FILM-SUBSTRATE SYSTEM. APPLICATIONS TO THE DESIGN OF REFLECTION-TYPE OPTICAL DEVICES AND TO ELLIPSOMETRY.AZZAM RMA; ZAGHLOUL ARM; BASHARA NM et al.1975; J. OPT. SOC. AMER.; U.S.A.; DA. 1975; VOL. 65; NO 3; PP. 252-260; BIBL. DISSEM.Article

AN ANGLE-OF-INCIDENCE TUNABLE, SIO2-SI (FILM-SUBSTRATE) REFLECTION RETARDER FOR THE UV NERCURY LINE LAMBDA =2537 A.ZAGHLOUL ARM; AZZAM RMA; BASHARA NM et al.1975; OPT. COMMUNIC.; NETHERL.; DA. 1975; VOL. 14; NO 2; PP. 260-262; BIBL. 3 REF.Article

HIGH PRECISION ALIGNMENT PROCEDURE FOR AN ELLIPSOMETER.ZEIDLER JR; KOHLES RB; BASHARA NM et al.1974; APPL. OPT.; U.S.A.; DA. 1974; VOL. 13; NO 5; PP. 1115-1120; BIBL. 20 REF.Article

COMBINED-REFLECTION AND TRANSMISSION THIN-FILM ELLIPSOMETRY: A UNIFIED LINEAR ANALYSIS.AZZAM RMA; ELSHAZLY ZAGHLOUL M; BASHARA NM et al.1975; APPL. OPT.; U.S.A.; DA. 1975; VOL. 14; NO 7; PP. 1652-1663; BIBL. 26 REF.Article

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