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COMPARISON OF THAI'S THEORY WITH EXPERIMENTAL BORON DOPING PROFILES IN SILICON, DIFFUSED FROM BORON NITRIDE SOURCESFROHMADER KP; BAUMBAUER L.1980; SOLID-STATE ELECTRON.; ISSN 0038-1101; GBR; DA. 1980; VOL. 23; NO 12; PP. 1263-1265; BIBL. 17 REF.Article

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