NACHWEIS DER ZUVERLAESSIGKEIT VON T-SCHALTERN 3AC. = LA FIABILITE DES DISJONCTEURS T 3ACBAUMGART H; SINNECKER G.1977; SIEMENS Z.; DTSCH.; DA. 1977; VOL. 51; NO 5; PP. 422-427; ABS. ANGL.; BIBL. 12 REF.Article

Störungsanalyse und Vorbeugemassnahmen zur Gewährleistung der Betriebssicherheit kommunaler Kläranlagen = Analyse de perturbation et mesures préventives pour garantir la sécurité de service des stations des eaux d'égoût = Investigation on breakdown in sewage treatment plants and preventive measures to service the running of the plantBAUMGART, H. C.Gas- und Wasserfach. Wasser, Abwasser. 1987, Vol 128, Num 11, pp 569-575, issn 0016-3651Article

HIGH-RESOLUTION REAL-TIME X-RAY TOPOGRAPHY OF DISLOCATION GENERATION IN SILICONSHIH LIN CHANG; QUEISSER HJ; BAUMGART H et al.1982; PHILOSOPHICAL MAGAZINE. A. DEFECTS AND MECHANICAL PROPERTIES; ISSN 0141-8610; GBR; DA. 1982; VOL. 46; NO 6; PP. 1009-1013; BIBL. 12 REF.Article

ELECTRICAL AND STRUCTURAL PROPERTIES OF P-N JUNCTIONS IN CW LASER ANNEALED SILICONMAIER M; BIMBERG D; FERNHOLZ G et al.1982; J. APPL. PHYS.; ISSN 0021-8979; USA; DA. 1982; VOL. 53; NO 8; PP. 5904-5907; BIBL. 9 REF.Article

SEEDED OSCILLATORY GROWTH OF SI OVER SIO₂ BY CW LASER IRRADIATIONCELLER GK; TRIMBLE LE; NG KK et al.1982; APPLIED PHYSICS LETTERS; ISSN 0003-6951; USA; DA. 1982; VOL. 40; NO 12; PP. 1043-1045; BIBL. 11 REF.Article

Raman scattering characterization of the microscopic structure od semi-insulating polycrystalline Si thin filmsOLEGO, D. J; BAUMGART, H.Journal of applied physics. 1988, Vol 63, Num 8, pp 2669-2673, issn 0021-8979, 1Article

PICOSECOND LASER PULSE IRRADIATION OF CRYSTALLINE SILICONMERKLE KL; BAUMGART H; UEBBING RH et al.1982; APPL. PHYS. LETT.; ISSN 0003-6951; USA; DA. 1982; VOL. 40; NO 8; PP. 729-731; BIBL. 12 REF.Article

Autolacke im aggressiven klima von Jacksonville = Automotive finishes in the aggressive climate of JacksonvilleSCHULZ, U; TRUBIROHA, P; SCHERNAU, U et al.Farbe + Lack. 2000, Vol 106, Num 1, pp 8-9, issn 0014-7699, 10 p.Article

Rezidivierende Pankreatitis bei kindlicher Colitis Ulcerosa : ein Fallbericht = Recurrent pancreatitis in childlike ulcerative colitis : A case reportLÄNGLER, A; BAUMGART, H; GEISSLER, J et al.Klinische Pädiatrie. 1998, Vol 210, Num 2, pp 81-84, issn 0300-8630Article

Strains in Si-on-SiO₂ structures formed by oxygen implantation: Raman scattering characterizationOLEGO, D. J; BAUMGART, H; CELLER, G. K et al.Applied physics letters. 1988, Vol 52, Num 6, pp 483-485, issn 0003-6951Article

The effects of acid rain on the appearance of automotive paint systems studied outdoors and in a new artificial weathering testSCHULZ, U; TRUBIROHA, P; SCHERNAU, U et al.Progress in organic coatings. 2000, Vol 40, Num 1-4, pp 151-165, issn 0300-9440Article

Thermomechanisch gewalzte bainitische Staehle mit Streckgrenzen von 500 bis 700 N/mm² fuer Grobblech und Warmbreitband = Thermomechanically rolled bainitic steels with yield points of 500 to 700 N/mm² for heavy plate and hot wide stripBAUMGART, H; BOER DE, H; MUESGEN, B et al.Stahl und Eisen (1881). 1985, Vol 105, Num 13, pp 709-716, issn 0340-4803Article

Mechanical and structural characterization of atomic layer deposition-based ZnO filmsTAPILY, K; GU, D; BAUMGART, H et al.Semiconductor science and technology. 2011, Vol 26, Num 11, issn 0268-1242, 115005.1-115005.7Article

Moderne Prüftechnik in der BMW Antriebsentwicklung : Drei neue Spezialprüfstände = Modern testing technics in the BMW engine development: three new special testing benchesPFEIFFER, G; ZUBER-GOOS, F; SEIBEL, M et al.ATZ. Automobiltechnische Zeitschrift. 1997, Vol 99, Num 7-8, pp 446-454, issn 0001-2785Article

Interferometric optical isolator with Si gudiing layer operated in unidirectional magnetic fieldYOKOI, Hideki.Proceedings - Electrochemical Society. 2005, pp 450-457, issn 0161-6374, isbn 1-56677-460-8, 8 p.Conference Paper

Evaluation of commercial ultra-thin SOI substrates using laser confocal inspection systemOGURA, Atsushl; OKABAYASHI, Osamu.Proceedings - Electrochemical Society. 2003, pp 19-24, issn 0161-6374, isbn 1-56677-402-0, 6 p.Conference Paper

Interfacial tunneling oxide: Impact on electrical characterization of unipolar Si/Si bonded junctionsSTUCHINSKY, V. A.Proceedings - Electrochemical Society. 2003, pp 195-202, issn 0161-6374, isbn 1-56677-402-0, 8 p.Conference Paper

Advanced SOI structures based on wafer bonding: A short reviewGHYSELEN, B.Proceedings - Electrochemical Society. 2003, pp 96-109, issn 0161-6374, isbn 1-56677-402-0, 14 p.Conference Paper

Semiconductor wafer bonding VIII : science, technology, and applications (Quebec PQ, 15-20 May 2005)Hobart, K.D; Bengtsson, S; Baumgart, H et al.Proceedings - Electrochemical Society. 2005, issn 0161-6374, isbn 1-56677-460-8, X, 462 p, isbn 1-56677-460-8Conference Proceedings

Role of surface morphology in wafer bondingMASZARA, W. P; JIANG, B.-L; YAMADA, A et al.Journal of applied physics. 1991, Vol 69, Num 1, pp 257-260, issn 0021-8979Article

Substrate damage prevention and simultaneous ZMR in stacked SOI layersTHEUNISSEN, M. J. J; BAUMGART, H; HAISMA, J et al.Japanese journal of applied physics. 1988, Vol 27, Num 10, pp L1938-L1941, issn 0021-4922, 2Article

Applications of bonding SOI technology to high performance LSI circuitsYOSHIMI, Makoto; LETERTRE, Fabrice; CAYREFOURCQ, Ian et al.Proceedings - Electrochemical Society. 2005, pp 9-19, issn 0161-6374, isbn 1-56677-460-8, 11 p.Conference Paper

In-line critical leak rate testing of vacuum-sealed and backfilled resonating MEMS devicesRELNERT, Wolfgang; KÄHLER, Dirk; OLDSEN, Marten et al.Proceedings - Electrochemical Society. 2005, pp 233-240, issn 0161-6374, isbn 1-56677-460-8, 8 p.Conference Paper

Mechanics aspects of wafer bondingTURNER, K. T; SPEARING, S. M.Proceedings - Electrochemical Society. 2005, pp 241-252, issn 0161-6374, isbn 1-56677-460-8, 12 p.Conference Paper

Direct bonding of thick film polysilicon to glass substratesLUOTO, H; SUNI, T; HENTTINEN, K et al.Proceedings - Electrochemical Society. 2005, pp 194-204, issn 0161-6374, isbn 1-56677-460-8, 11 p.Conference Paper