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au.\*:("BAUN WL")

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MULTIPLE SCATTERING FEATURES IN NEON ION SCATTERING SPECTRA (ISS) FROM POLYCRYSTALLINE MATERIALS.BAUN WL.1978; SURF. SCI.; NETHERL.; DA. 1978; VOL. 72; NO 3; PP. 536-544; BIBL. 14 REF.Article

FINE FEATURES IN ION SCATTERING SPECTRA (ISS).BAUN WL.1977; APPL. SURF. SCI.; NETHERL.; DA. 1977; VOL. 1; NO 1; PP. 81-102; BIBL. 1 P.Article

CHARACTERIZATION OF TUNGSTEN IMPREGNATED DISPENSER CATHODES USING ISS AND SIMSBAUN WL.1980; APPL. SURF. SCI.; NLD; DA. 1980; VOL. 4; NO 3-4; PP. 374-384; BIBL. 15 REF.Conference Paper

ISS/SIMS CHARACTERIZATION OF UV/O3 CLEANED SURFACES = CARACTERISATION PAR ISS ET SIMS DE SURFACES NETTOYES PAR INTERATION UV/O3BAUN WL.1980; APPL. SURF. SCI.; ISSN 0378-5963; NLD; DA. 1980; VOL. 6; NO 1; PP. 39-46; BIBL. 6 REF.Article

STUDY OF ADHESIVE BONDING AND BOND FAILURE SURFACE USING ISS-SIMS. = ETUDE DES JOINTS COLLES ET DES DEFAUTS DES INTERFACES PAR ISS-SIMSBAUN WL.1977; IN: CHARACT. MET. POLYM. SURF. SYMP. ADV. CHARACT. MET. POLYM. SURF.; NEW YORK; 1976; NEW YORK; ACADEMIE PRESS; DA. 1977; VOL. 2; PP. 375-393; BIBL. 8 REF.Conference Paper

OSCILLATIONS IN SCATTERED 4HE+ ION YIELD CURVES FROM HGCDTEBAUN WL.1980; SURF. SCI.; ISSN 0039-6028; NLD; DA. 1980; VOL. 100; NO 3; PP. L491-L494; BIBL. 8 REF.Article

MULTIPLE SCATTERING FEATURES IN ARGON AND HELIUM ION SCATTERING SPECTRA (ISS) FROM POLYCRYSTALLINE MATERIALS.BAUN WL.1978; SURF. SCI.; NLD; DA. 1978; VOL. 75; NO 1; PP. 141-146; BIBL. 9 REF.Article

ELECTRON MICROBEAM PROBE DIAGNOSTICS ON ION SCATTERING CRATERS.BAUN WL.1976; APPL. SPECTROSC.; U.S.A.; DA. 1976; VOL. 30; NO 2; PP. 233-234; BIBL. 3 REF.Article

USE OF ION SCATTERING AND SECONDARY ION MASS SPECTROMETRY TO CHARACTERIZE APPARENT "ADHESIVE" FAILURE IN AN ADHESIVE BOND.BAUN WL.1976; J. ADHESION; U.S.A.; DA. 1976; VOL. 7; NO 4; PP. 261-267; BIBL. 8 REF.Article

EMULSIONS FOR EXO-ELECTRON PHOTOGRAPHY.BAUN WL.1975; REV. SCI. INSTRUM.; U.S.A.; DA. 1975; VOL. 46; NO 9; PP. 1283-1284; BIBL. 3 REF.Article

SPECTRUM SUBTRACTION TECHNIQUES IN ION SCATTERING SPECTROMETRYBAUN WL; SOLOMON JS.1976; ANAL. CHEM.; U.S.A.; DA. 1976; VOL. 48; NO 6; PP. 931-933; BIBL. 4 REF.Article

EXCITATION-ENERGY-DEPENDENT RESONANCES IN X-RAY EMISSIONS UNDER NEAR-THRESHOLD ELECTRON EXCITATION OF THE CE 3D AND 4D LEVELS.CHAMBERLAIN MB; BAUN WL.1975; J. VACUUM SCI. TECHNOL.; U.S.A.; DA. 1975; VOL. 12; NO 5; PP. 1047-1051; BIBL. 17 REF.Article

ACCELERATED CORROSION TEST TO DETERMINE THE CONTINUITY OF THIN OXIDE FILMS ON ALUMINUMDEVITT NT; BAUN WL.1975; J. ELECTROCHEM. SOC.; U.S.A.; DA. 1975; VOL. 122; NO 4; PP. 525-526; BIBL. 3 REF.Article

K EMISSION AND ABSORPTION SPECTRA OF NITROGEN WITH THE ELECTRON MICROPROBEROMAND M; SOLOMON JS; BAUN WL et al.1973; X-RAY SPECTROM.; G.B.; DA. 1973; VOL. 2; NO 1; PP. 7-10; BIBL. 30 REF.Serial Issue

PERFORMANCES ET NOUVELLES POSSIBILITES DE LA MICROSONDE ELECTRONIQUE EN SPECTROMETRIE DES RAYONS X. II. REPLIQUES D'ABSORPTION K DU VANADIUMROMAND M; SOLOMON JS; BAUN WL et al.1973; SPECTROCHIM. ACTA, B; G.B.; DA. 1973; VOL. 28; NO 2; PP. 45-49; ABS. ANGL.; BIBL. 15 REF.Serial Issue

CARACTERISATION PAR SPECTROMETRIE AUGER DE FILMS ANODIQUES FORMES SUR L'ALUMINIUM.BADOR R; BOUYSSOUX G; ROMAND M et al.1977; MATER. RES. BULL.; U.S.A.; DA. 1977; VOL. 12; NO 2; PP. 197-204; BIBL. 24 REF.Article

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