au.\*:("BEAUCHENE, T")
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Implementing laser based failure analysis methodologies using test vehiclesLEWIS, D; POUGET, V; BEAUDOIN, F et al.2004 international conference on microelectronic test structures. 2004, pp 217-220, isbn 0-7803-8262-5, 1Vol, 4 p.Conference Paper
ESD defect localization and analysis using pulsed OBIC techniquesBEAUCHENE, T; LEWIS, D; TREMOUILLES, D et al.Proceedings - Electrochemical Society. 2003, pp 156-165, issn 0161-6374, isbn 1-56677-389-X, 10 p.Conference Paper