Pascal and Francis Bibliographic Databases

Help

Search results

Your search

au.\*:("BEAUCHENE, T")

Results 1 to 2 of 2

  • Page / 1
Export

Selection :

  • and

Implementing laser based failure analysis methodologies using test vehiclesLEWIS, D; POUGET, V; BEAUDOIN, F et al.2004 international conference on microelectronic test structures. 2004, pp 217-220, isbn 0-7803-8262-5, 1Vol, 4 p.Conference Paper

ESD defect localization and analysis using pulsed OBIC techniquesBEAUCHENE, T; LEWIS, D; TREMOUILLES, D et al.Proceedings - Electrochemical Society. 2003, pp 156-165, issn 0161-6374, isbn 1-56677-389-X, 10 p.Conference Paper

  • Page / 1