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A TECHNIQUE FOR EXAMINING SUBMICRON PARTICULATE MATTER ON SEMICONDUCTOR DEVICE WAFERS.BERENBAUM L.1975; J. TESTY EVAL.; U.S.A.; DA. 1975; VOL. 3; NO 5; PP. 389-391; (SYMP. STATE ART PARTICULATE CONTAM. CONTROL; WASHINGTON, DC.; 1974)Conference Paper

Giorgione's Pastorello, Lost and FoundBERENBAUM, L.Art Journal New York, N.Y. 1977, Vol 37, Num 1, pp 22-27Article

ELECTROMIGRATION-INDUCED FAILURES IN THIN-FILM AL-CU CONDUCTORSAGARWALA BN; BERENBAUM L; PERESSINI P et al.1974; J. ELECTRON. MATER.; U.S.A.; DA. 1974; VOL. 3; NO 1; PP. 137-153; BIBL. 1 P.Article

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