au.\*:("BIELLE DASPET D")
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APPLICATION DES PHOTOCOURANTS VOLUMIQUES TRANSITOIRES A LA CARACTERISATION PHYSIQUE DE LA BASE DES PHOTOPILES A SEMI-CONDUCTEUR. = APPLICATION OF TRANSIENT VOLUME PHOTOCURRENTS TO THE PHYSICAL CHARACTERIZATION OF THE BASE OF SEMI CONDUCTOR SOLAR CELLSGASSET G; BIELLE DASPET D.1976; IN: ELECTR. SOL. COLLOQ. INT.; TOULOUSE; 1976; TOULOUSE; CENT. NATL. ETUD. SPAT.; DA. 1976; PP. 355-374; ABS. FR.; BIBL. 10 REF.Conference Paper
MISE AU POINT D'UNE METHODE DE MESURE DU TEMPS DE VIE DANS LA BASE DE DIODES RAPIDES OU DE COMMUTATION ET LES TRANSISTORS. ETUDE DE SES APPLICATIONS AU CONTROLE DE FABRICATION DES CIRCUITS INTEGRES.BIELLE DASPET D; MARTINEZ J; ELLOUZ E et al.1972; DGRST-7172834; FR.; DA. 1972; PP. (64P.); H.T. 37; BIBL. DISSEM.; (RAPP. FINAL, ACTION CONCERTEE: COMPOSANTS CIRC. MICROMINIATURISES)Report
Effets de la recombinaison de surface et des conditions d'excitation sur les réponses de photoconductivité transitoire = Effects of surface recombination and excitation conditions on the transient photoconductivity responsesREBIAI, S; BIELLE-DASPET, D.Revue de physique appliquée. 1986, Vol 21, Num 9, pp 545-556, issn 0035-1687Article
MESURES DE LA DUREE DE VIE DES PORTEURS, DANS LA BASE ET L'EMETTEUR DE CELLULES SOLAIRES AU SILICIUM, A PARTIR DES PHOTOREPONSES TRANSITOIRES A UNE IMPULSION LASER = MEASUREMENTS OF CARRIER LIFETIME IN BASE AND EMITTER OF SILIUM SOLAR CELLS USING THE TRANSIENT PHOTORESPONSES TO A LASER PULSEGASSET G; BENZOHRA M; JOHAN A et al.1979; REV. PHYS. APPL.; FRA; DA. 1979; VOL. 14; NO 1; PP. 209-221; ABS. ENG; BIBL. 21 REF.Article
EFFETS DE L'IRRADIATION COMBINEE, PAR ELECTRONS ET PHOTONS, SUR LA DEGRADATION DES CELLULES SOLAIRES AU SILICIUMGASSET G; CASTANER MUNOZ L; BIELLE DASPET D et al.sdIN: EVAL. ACTION ENVIRON. SPAT. MATER. COLLOQ. INT.; TOULOUSE; 1974; TOULOUSE; CENT. NATL. ET. SPAT.; DA. S.D.; PP. 607-625; ABS. ANGL.; BIBL. 12 REF.Conference Paper
HIGH INJECTION EFFECTS ON CONDUCTIVITY AND CARRIER LIFETIME IN P-TYPE SILICON MATERIALBIELLE DASPET D; ESPIOUSSAS F; JOHAN A et al.1980; REV. PHYS. APPL.; ISSN 0035-1687; FRA; DA. 1980; VOL. 15; NO 5; PP. 945-959; ABS. FRE; BIBL. 13 REF.Article
Investigation of the thermal behavior of a RTP furnaceHENDA, R; SCHEID, E; BIELLE-DASPET, D et al.IEEE transactions on semiconductor manufacturing. 1995, Vol 8, Num 3, pp 362-365, issn 0894-6507Article
Second-oxidation properties of thin polysilicon films grown by LPCVD and heavily in situ boron-dopedBOUKEZZATA, M; BIROUK, B; BIELLE-DASPET, D et al.Thin solid films. 1998, Vol 335, Num 1-2, pp 70-79, issn 0040-6090Article
Short-circuit photocurrent and open-circuit photovoltage decays applied to base carrier lifetime measurements in silicon solar-cellsBIELLE-DASPET, D; LAGOUIN, M; THEREZ, F et al.Photovoltaic solar energy conference. 5. 1984, pp 131-135Conference Paper
TRANSPORT PROPERTIES AND TEM OBSERVATION OF R.A.D. POLYCRYSTALLINE SILICON FILMSJOHAN A; AYERZA J; BIELLE DASPET D et al.1979; PHOTOVOLTAIC SOLAR ENERGY CONFERENCE. 2/1979/BERLIN; NLD/USA/GBR; DORDRECHT: D. REIDEL/BOSTON: D. REIDEL/LONDON: D. REIDEL; DA. 1979; PP. 750-758; BIBL. 14 REF.;_EUR-6376Conference Paper
MISE AU POINT D'UNE METHODE DE MESURE DU TEMPS DE VIE DANS LA BASE DE DIODES RAPIDES OU DE COMMUTATION ET LES TRANSISTORSBIELLE DASPET D; PINEL J; BENZOHRA M et al.1975; DGRST-7371361; FR.; DA. 1975; PP. (23P.); H.T. 1; BIBL. 2 REF.; (RAPP. FINAL, ACTION CONCERTEE: COMPOSANTS CIRCUITS MICROMINIATURISES)Report
Structural and electrical changes in polycrystalline silicon thin films that are heavily in situ boron-doped and thermally oxidized with dry oxygenBOUKEZZATA, M; BIROUK, B; MANSOUR, F et al.Advanced materials (Weinheim). 1997, Vol 9, Num 12, pp 271-279, issn 0935-9648Article
Etude de procédés technologiques pour le contrôle des propriétés de commutation des composants bipolaires de puissance = Technological process for the control of the bipolar power structure switching performanceBagneres-Moisseron, Monique; Bielle-Daspet, D.1995, 140 p.Thesis
Super large grain polycrystalline silicon obtained from pyrolysis of Si2H6 and annealingSCHEID, E; DE MAUDUIT, B; TAURINES, P et al.Japanese journal of applied physics. 1990, Vol 29, Num 11, pp L2105-L2107, issn 0021-4922, 2Article
Conductivity of boron-implanted polycrystalline thin silicon filmsMANSOUR, F; BOUCHEMAT, M; BOUKEZZATA, M et al.Thin solid films. 1995, Vol 261, Num 1-2, pp 12-17, issn 0040-6090Article
GaAlAs-GaAs solar cells development prospective for space applications under concentrationTHEREZ, F; CHIKOUCHE, A; ROUX, M et al.Photovoltaic generators in space. European symposium. 4. 1984, pp 95-99Conference Paper
CARACTERISATION DES DIFFERENTES OPERATIONS D'UN PROCESSUS TECHNOLOGIQUE EN VUE DE L'OBTENTION DE CIRCUITS INTEGRES HAUTE TENSION.MARTINOT H; BIELLE DASPET D; SCHUTTLER R et al.1974; DGRST-7270532; FR.; DA. 1974; PP. (50P.); H.T. 43; BIBL. 1 P. 1/2; (RAPP. FINAL, ACTION CONCERTEE: COMPOSANTS CIRCUITS MICROMINIATURISES)Report
Hubbard's sub-band conduction in Si poly-SiO2 transition layersADA-HANIFI, M; SICART, J; ROBERT, J. L et al.Solid-state electronics. 1987, Vol 30, Num 7, pp 765-769, issn 0038-1101Article
Technological process effect on the carrier lifetime degradation of silicon solar-cell base layer irradiated by 1 MeV electrons (boron doping case)BIELLE-DASPET, D; LAGOUIN, M; THEREZ, F et al.Photovoltaic generators in space. European symposium. 4. 1984, pp 123-130Conference Paper
Characterization of sub-micrometre silicon films (Si-LPCVD) heavily in situ boron-doped and submitted to treatments of dry oxidationAÏT-KAKI, A; BOULAKROUNE, M; BOUKEZZATA, M et al.Semiconductor science and technology. 2002, Vol 17, Num 9, pp 983-992, issn 0268-1242Article
An understanding of in situ boron doped polysilicon films by characterization and simulationAZZARO, C; SCHEID, E; BIELLE-DASPET, D et al.Journal de physique IV. Colloque. 1991, Vol 1, Num 2, pp C2.79-C2.85Conference Paper
Silicon deposition from disilane : experimental study and modellingGUEYE, M; SCHEID, E; TAURINES, P et al.Journal de physique IV. Colloque. 1991, Vol 1, Num 2, pp C2.63-C2.70Conference Paper
Electron induced degradation and recovery under space conditions and lithium-doped silicon solar cellsROUX, M; REULET, R; BERNARD, J et al.Radiation effects. 1984, Vol 81, Num 3-4, pp 263-275, issn 0033-7579Article
Silicon deposited by low pressure chemical vapour deposition from Si2H6 : experiments, modelling and propertiesSCHEID, E; PEDROVIEJO, J. J; DUVERNEUIL, P et al.Materials science & engineering. B, Solid-state materials for advanced technology. 1993, Vol 17, Num 1-3, pp 72-76, issn 0921-5107Conference Paper