Pascal and Francis Bibliographic Databases

Help

Search results

Your search

au.\*:("BOEHME, R. F")

Publication Year[py]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Discipline (document) [di]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Results 1 to 9 of 9

  • Page / 1
Export

Selection :

  • and

Empirical molecular-hydrogen wave function modeled from theoretically derived X-ray diffraction dataBOEHME, R. F; LA PLACA, S. J.Physical review letters. 1987, Vol 59, Num 9, pp 985-987, issn 0031-9007Article

Lattice distortions for arsenic in single-crystal siliconERBIL, A; WEBER, W; CARGILL, G. S. III et al.Physical review. B, Condensed matter. 1986, Vol 34, Num 2, pp 1392-1394, issn 0163-1829Article

Magnetic properties of single-crystal Y-Ba-Cu-O containing FeMCGUIRE, T. R; LA PLACA, S. J; BOEHME, R. F et al.Journal of applied physics. 1991, Vol 69, Num 8, pp 5388-5390, issn 0021-8979, 3 p., p.2BConference Paper

Synthesis of the defect perovskite series LaCuO3-δ with copper valence varying from 2+ to 3+BRINGLEY, J. F; SCOTT, B. A; LA PLACA, S. J et al.Nature (London). 1990, Vol 347, Num 6290, pp 263-265, issn 0028-0836, 3 p.Article

Total-electron-yield current measurements for near-surface extended x-ray-absorption fine structure = Mesures du courant de rendement électronique total pour la structure fine d'absorption RX étendue au voisinage de la surfaceERBIL, A; CARGILL, G. S. III; FRAHM, R et al.Physical review. B, Condensed matter. 1988, Vol 37, Num 5, pp 2450-2464, issn 0163-1829Article

New LaCuO3-δ perovskites prepared at high oxygen pressureBRINGLEY, J. F; SCOTT, B. A; LA PLACA, S. J et al.NIST Special publication. 1991, Num 804, pp 427-432Conference Paper

Annealing of heavily arsenic-doped silicon: electrical deactivation and a new defect complexPANDEY, K. C; ERBIL, A; CARGILL, G. S et al.Physical review letters. 1988, Vol 61, Num 11, pp 1282-1285, issn 0031-9007Article

Diode current detection of extended x-ray absorption fine structure in gallium arsenideBOEHME, R. F; GARGILL, G. S. III; WEBER, W et al.Journal of applied physics. 1985, Vol 58, Num 2, pp 811-815, issn 0021-8979Article

Diode current detection of extended x-ray absorption fine structure in gallium arsenideBOEHME, R. F; GARGILL, G. S. III; WEBER, W et al.Journal of applied physics. 1985, Vol 58, Num 2, pp 811-815, issn 0021-8979Article

  • Page / 1