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Influence of inhomogeneities in the depth profiles of impurity centers on the capacitance of semiconducting oxide filmsBOGOMAZOVA, N. V; SLESARENKO, O. A; BOKUN, G. S et al.Soviet electrochemistry. 1992, Vol 28, Num 9, pp 1144-1146, issn 0038-5387Article

SCDA for 3D lattice gases with repulsive interactionGRODA, Ya. G; ARGYRAKIS, P; BOKUN, G. S et al.The European physical journal. B, Condensed matter physics. 2003, Vol 32, Num 4, pp 527-535, issn 1434-6028, 9 p.Article

The self-consistent diagram approximation for lattice systemsBOKUN, G. S; GRODA, Ya. G; BELOV, V. V et al.The European physical journal. B, Condensed matter physics. 2000, Vol 15, Num 2, pp 297-304, issn 1434-6028Article