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A study of output power stability of GaN HEMTs on sic substratesBOUTROS, K. S; ROWELL, P; BRAR, B et al.IEEE international reliability physics symposium. 2004, pp 577-578, isbn 0-7803-8315-X, 1Vol, 2 p.Conference Paper

High performance GaN HEMTs for mmWave applicationsBOUTROS, K. S; REGAN, M; ROWELL, P et al.Proceedings - Electrochemical Society. 2004, pp 454-458, issn 0161-6374, isbn 1-56677-419-5, 5 p.Conference Paper

InGaN / GaN double heterostructure leds on HVPE GaN-on-sapphire substratesSMITH, G. M; BOUTROS, K. S; SZEWCZUK, J. W et al.SPIE proceedings series. 1998, pp 8-16, isbn 0-8194-2718-7Conference Paper

Growth and characterization of In-based nitride compoundsBEDAIR, S. M; MCINTOSH, F. G; ROBERTS, J. C et al.Journal of crystal growth. 1997, Vol 178, Num 1-2, pp 32-44, issn 0022-0248Article

Crystallographic wet chemical etching of p-type GaNSTOCKER, D. A; GOEPFERT, I. D; SCHUBERT, E. F et al.Journal of the Electrochemical Society. 2000, Vol 147, Num 2, pp 763-764, issn 0013-4651Article

Yellow photoluminescence in MOCVD-grown n-type GaNSCHUBERT, E. F; GRIESHABER, W; BOUTROS, K. S et al.SPIE proceedings series. 1998, pp 59-68, isbn 0-8194-2718-7Conference Paper

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