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Flexible embedded test solution for high-speed analogue front-end architectures : Analogue and mixed-signal test for systems on chipLECHNER, A; BURBIDGE, M. J; RICHARDSON, A. M. D et al.IEE proceedings. Circuits, devices and systems. 2004, Vol 151, Num 4, pp 359-369, issn 1350-2409, 11 p.Article