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Some approaches to low-voltage scanning electron microscopyMÜLLEROVA, I; LENC, M.Ultramicroscopy. 1992, Vol 41, Num 4, pp 399-410, issn 0304-3991Article

New crosslinkable low-voltage compoundsRICHARDSON, C. G; PALUMBO, S.Wire industry. 1991, Vol 58, Num 8, pp 429-432, issn 0043-6011, 3 p.Article

Theoretical calculation of probe size of low-voltage scanning electron microscopesXIMEN, J; SHAO, Z; LIN, P. S. D et al.Journal of microscopy (Print). 1993, Vol 170, pp 119-124, issn 0022-2720, 2Article

Novel low-voltage fully-differential bufferFERRI, Giuseppe; GUERRINI, Nicola; SPERINI, Manolo et al.Proceedings of SPIE - the International Society for Optical Engineering. 2005, isbn 0-8194-5832-5, 2Vol, vol2, 994-1002Conference Paper

Low-voltage-swing logic circuits for a 7GHz X86 integer coreDANIEL J., Deleganes; MICAH, Barany; GEORGE, Geannopoulos et al.IEEE International Solid-State Circuits Conference. 2004, pp 154-155, isbn 0-7803-8267-6, 2Vol, 2 p.Conference Paper

Ultra-low voltage circuits and processor in 180nm to 90nm technologies with a swapped-body biasing techniqueNARENDRA, Siva; TSCHANZ, James; DERMER, Greg et al.IEEE International Solid-State Circuits Conference. 2004, pp 156-157, isbn 0-7803-8267-6, 2Vol, 2 p.Conference Paper

On the defect generation and low voltage extrapolation of QBDin SiO2/HfO2 stacksDEGRAEVE, R; CRUPI, F; KWAK, D. H et al.Symposium on VLSI Technology. sd, pp 140-141, isbn 0-7803-8289-7, 1Vol, 2 p.Conference Paper

Enhanced input range dynamic comparator for pipeline analogue-to-digital converterLEE, S. M; SONG, T; CHO, C et al.Electronics letters. 2009, Vol 45, Num 14, pp 728-730, issn 0013-5194, 3 p.Article

A 10-bit 20-Msample/s ADC for low-voltage, low-power applicationsSOU, G; LU, G.-N; KLISNICK, G et al.SPIE proceedings series. 1998, pp 88-96, isbn 0-8194-2862-0Conference Paper

Mutual adhesion of lecithin membranes at ultralow tensionsSERVUS, R. M; HELFRICH, W.Journal de physique (Paris). 1989, Vol 50, Num 7, pp 809-827, issn 0302-0738, 19 p.Article

Field Emitter Equipped With a Suppressor to Control Emission AngleKOIKE, Akifumi; NEO, Youichirou; MIMURA, Hidenori et al.IEEE electron device letters. 2013, Vol 34, Num 5, pp 704-706, issn 0741-3106, 3 p.Article

High-order accurate approximation for MOSFET surface potentialCHANG, S; WANG, G; HUANG, Q et al.Electronics Letters. 2008, Vol 44, Num 5, pp 381-383, issn 0013-5194, 3 p.Article

Light-emitting electrochemical cells with millimeter-sized interelectrode gap : Low-voltage operation at room temperatureSHIN, Joon-Ho; EDMAN, Ludvig.Journal of the American Chemical Society. 2006, Vol 128, Num 49, pp 15568-15569, issn 0002-7863, 2 p.Article

Spider : Simultaneous post-layout IR-drop and metal density enhancement with redundant fillLEUNG, Kwok-Shing.IEEE/ACM International Conference on Computer-Aided Design. 2005, pp 33-38, isbn 0-7803-9254-X, 1Vol, 6 p.Conference Paper

Verifiche sugli impianti elettrici utilizzatori in bassa tensione = Verifications on low-voltage user electrical plantsSTELLA, F.Installatore italiano. 1997, Vol 48, Num 6, pp 785-791, issn 0020-2118Article

Increase in emission current after high-frequency low-voltage pulse application observed for nano-pillar cathodeYOSHIDA, Tomoya; BABA, Akiyoshi; ASANO, Tanemasa et al.International Vacuum Nanoelectronics Conference. 2004, pp 258-259, isbn 0-7803-8397-4, 1Vol, 2 p.Conference Paper

L'appareillage moyenne tension au SF6 : une solution optimisée pour les postes MT/BT : Matériels électriques des postes de transport et de distribution = Medium voltage SF6 equipment : an optimized solution for MV/LV substationsBLANC, J.-Y; PERRISSIN, G.REE. Revue de l'électricité et de l'électronique. 2000, Num 2, pp 60-64, issn 1265-6534Conference Paper

Charging of bulk specimens, insulating layers and free-supporting films in scanning electron microscopyREIMER, L; GOLLA, U; BÖNGELER, R et al.Optik (Stuttgart). 1992, Vol 92, Num 1, pp 14-22, issn 0030-4026Article

Die Wirkung korrosiver Atmosphären auf Niederspannungsisolierungen = L'effet des atmosphères corrosives sur les isolations B.T = The effects of corrosive atmosphere on L.V. insulationsSACHSENWEGER, C; HÄNSELE, K; STIMPER, K et al.Werkstoffe und Korrosion. 1988, Vol 39, Num 6, pp 287-292, issn 0043-2822Article

Travelling-wave piezoelectric micropump with low resistance microchannelZHANG, W; WANG, C; YUE, Z et al.Electronics letters. 2011, Vol 47, Num 19, pp 1065-1066, issn 0013-5194, 2 p.Article

Return to Work After Low Voltage Electrical InjuryTHEMAN, Kirstin; SINGERMAN, Jennifer; GOMEZ, Manuel et al.Journal of burn care & research. 2008, Vol 29, Num 6, pp 959-964, issn 1559-047X, 6 p.Article

Optimal integration of inter-task and intra-task dynamic voltage scaling techniques for hard real-time applicationsSEO, Jaewon; KIM, Taewhan; DUTT, Nikil D et al.IEEE/ACM International Conference on Computer-Aided Design. 2005, pp 450-455, isbn 0-7803-9254-X, 1Vol, 6 p.Conference Paper

The application of silicon avalanche diodes on low-voltage power systemsBEUTEL, Andreas; VAN COLLER, John.IAS annual meeting. 2004, pp 2594-2599, isbn 0-7803-8486-5, 6 p.Conference Paper

Low-voltage cathodoluminescent phosphorsSHEA, L. E.The Electrochemical Society interface. 1998, Vol 7, Num 2, pp 24-27, issn 1064-8208Article

Investigation of various factors' influence on charging effects in linewidth metrologyKO, Y.-U.SPIE proceedings series. 1998, pp 81-93, isbn 0-8194-2777-2Conference Paper

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