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Results 1 to 25 of 3794

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Properties of Schottky barrier p-CdxHg1-xTe structures with metal-tunnel transparent dielectricDAMNJANOVIC, V; PONOMARENKO, V. P.SPIE proceedings series. 2003, pp 191-199, isbn 0-8194-4986-5, 9 p.Conference Paper

Hydrogen sensitivity of Pt-Pd/p-CaFe2O4 diodeMATSUMOTO, Y; YOSHIKAWA, T; SATO, E et al.Materials research bulletin. 1989, Vol 24, Num 3, pp 331-342, issn 0025-5408Article

Pyramid-Shape Tris(8-hydroxyquinoline) Aluminum Schottky DiodeLO, Shih-Shou; SHU HAO SIE.Journal of physical chemistry. C. 2012, Vol 116, Num 30, pp 16122-16126, issn 1932-7447, 5 p.Article

Effects of Carbon on Schottky Barrier Heights of NiSi Modified by Dopant SegregationJUN LUO; ZHANG, Shi-Li; QIU, Zhi-Jun et al.IEEE electron device letters. 2009, Vol 30, Num 6, pp 608-610, issn 0741-3106, 3 p.Article

Control of Schottky barrier height of Ag/Mn/n-GaAs(110) diodes with Mn interlayer thicknessSPALTMANN, D; GEURTS, J; ESSER, N et al.Semiconductor science and technology. 1992, Vol 7, Num 3, pp 344-346, issn 0268-1242Article

Characteristics of electrodeposited SnO2-CdS/Au Schottky devices = Caractéristiques des dispositifs Schottky au SnO2-CdS/Au électrodéposésJAYACHANDRAN, M; CHOCKALINGAM, M. J; VENKATESAN, V. K et al.Physica status solidi. A. Applied research. 1989, Vol 113, Num 2, pp K217-K221, issn 0031-8965Article

Image forces and MIS Schottky barriersDE VISSCHERE, P.Solid-state electronics. 1986, Vol 29, Num 9, pp 873-875, issn 0038-1101Article

The frequency dependence of Mott-Schottky plotsBRAUN, C. M; FUJISHIMA, A; HONDA, K et al.Chemistry Letters. 1985, Num 11, pp 1763-1766, issn 0366-7022Article

Modeling the non-quasi-static metal-semiconductor space-charge-region capacitanceLIOU, J. J; MALOCHA, D. C.Journal of applied physics. 1989, Vol 65, Num 4, pp 1782-1787, issn 0021-8979, 6 p.Article

Schottky-barrier-height engineering for strained-Si MOSFETsIKEDA, Keiji; YAMASHITA, Yoshimi; ENDOH, Akira et al.DRC : Device research conference. 2004, pp 111-112, isbn 0-7803-8284-6, 1Vol, 2 p.Conference Paper

Electrical and photovoltaic properties of Ag/p-AgGaSe2 polycrystalline thin film Schottky barrier diodesSATYANARAYANA MURTHY, Y; MAHAMMAD HUSSAIN, O; UTHANNA, S et al.Physics letters. A. 1991, Vol 152, Num 5-6, pp 311-314, issn 0375-9601Article

Bias dependence of low-frequency gate current noise in GaAs MESFETsPERANSIN, J. M; VIGNAUD, P; RIGAUD, D et al.Electronics Letters. 1989, Vol 25, Num 7, pp 439-440, issn 0013-5194, 2 p.Article

An analytical model for Pinchoff voltage evaluation of ion-implanted GaAs MESFET'sDUTT, M. B; RAM NATH; KUMAR, R et al.I.E.E.E. transactions on electron devices. 1989, Vol 36, Num 4, pp 765-768, issn 0018-9383, 4 p.Article

Correlation between thermal resistance, channel temperature, infrared thermal maps and failure mechanisms in low power MESFET devicesCANALI, C; CHIUSSI, F; DONZELLI, G et al.Microelectronics and reliability. 1989, Vol 29, Num 2, pp 117-124, issn 0026-2714, 8 p.Article

Submicron-gate In0.52Al0.48As/In0.53Ga0.47As/In0.52Al0.48As heterojunction metal-semiconductor field-effect transistors grown by molecular beam epitaxyKUANG, J. B; TASKER, P. J; CHEN, Y. K et al.Applied physics letters. 1989, Vol 54, Num 12, pp 1136-1138, issn 0003-6951, 3 p.Article

Schottky barrier diode on a submicron-thick silicon membrane using a dual surface fabrication techniqueLEE, K; SILCOX, J; LEE, C. A et al.Journal of applied physics. 1986, Vol 60, Num 11, pp 4038-4040, issn 0021-8979Article

A study of surface passivation on GaAs and In0.53Ga0.47 Schottky-barrier photodiodes using SiO2, Si3N4 and polyimideLEE, D. H; LI, S. S; LEE, S et al.I.E.E.E. transactions on electron devices. 1988, Vol 35, Num 10, pp 1695-1696, issn 0018-9383Article

Schottky barrier formation : Al deposition on GaAs(110)ORTEGA, J; RINCON, R; PEREZ, R et al.Applied surface science. 1992, Vol 60-61, pp 736-741, issn 0169-4332Conference Paper

In situ grown Schottky gates on GaAs/AlGaAs heterojunctionsTIMMERING, C. E; LAGEMAAT, J. M; FOXON, C. T et al.Semiconductor science and technology. 1988, Vol 3, Num 11, pp 1139-1142, issn 0268-1242Article

Effect of lateral inhomogeneity of Barrier height on the photoresponse characteristics of Schottky junctionsHORVATH, Z. J; VO VAN TUYEN.SPIE proceedings series. 1998, pp 65-67, isbn 0-8194-2808-6Conference Paper

Errors and error-avoidance in the Schottky coupled surface photovoltage techniqueHOWLAND, W. H; FONASH, S. J.Journal of the Electrochemical Society. 1995, Vol 142, Num 12, pp 4262-4268, issn 0013-4651Article

On the ubiquity of ion bombardment modification of silicon Schottky barriersASHOK, S; GIEWONT, K; VYAS, H. P et al.Physica status solidi. A. Applied research. 1986, Vol 98, Num 1, pp K99-K104, issn 0031-8965Article

Quantum simulation of nano-scale schottky barrier mosfetsSHIN, Mincheol; JANG, Moongyu; LEE, Seonjae et al.IEEE conference on nanotechnology. 2004, pp 396-398, isbn 0-7803-8536-5, 1Vol, 3 p.Conference Paper

Selective photoreceivers based on Schottky diodes with a periodically profiled surfaceBELYAKOV, L. V; GORYAYEV, D. N; RUMYANTSEV, B. L et al.Telecommunications & radio engineering. 1992, Vol 47, Num 10, pp 14-17, issn 0040-2508Article

High temperature Schottky diodes with boron-doped homoepitaxial diamond baseGILDENBLAT, G. S; GROT, S. A; HATFIELD, C. W et al.Materials research bulletin. 1990, Vol 25, Num 1, pp 129-134, issn 0025-5408Article

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