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Stabilisation of some characteristics of gas-filled diodes by electrical breakdownsBOSAN, D. A; SIMONOVIC, D.Journal of physics. D, Applied physics (Print). 1984, Vol 17, Num 1, pp L1-L4, issn 0022-3727Article

Stabilisation of some characteristics of gas-filled diodes by electrical breakdownsBOSAN, D. A; SIMONOVIC, D.Journal of physics. D, Applied physics (Print). 1984, Vol 17, Num 1, pp L1-L4, issn 0022-3727Article

Abnormal breakdown characteristic in a two-phase mixtureYE QIZHENG; LI JIN; LU FEI et al.Journal of physics. D, Applied physics (Print). 2006, Vol 39, Num 10, pp 2198-2204, issn 0022-3727, 7 p.Article

An analytic model for breakdown voltage of gated diodesHAN, S. K; CHOI, Y. I; CHUNG, S. K et al.Microelectronics journal. 2003, Vol 34, Num 5-8, pp 525-527, issn 0959-8324, 3 p.Conference Paper

Claquage de l'intervalle gazeux dans un champ magnétique transversal lors de la brusque réduction de la tension sur les électrodesARSH, A. M; VAGNER, S. D; KARASIK, B. S et al.Žurnal tehničeskoj fiziki. 1984, Vol 54, Num 2, pp 406-408, issn 0044-4642Article

Probability of electrical breakdown: evidence for a transition between the townsend and streamer breakdown mechanismsHODGES, R. V; VARNEY, R. N; RILEY, J. F et al.Physical review. A, General physics. 1985, Vol 31, Num 4, pp 2610-2620, issn 0556-2791Article

Electric breakdown of poly(ethylene terephthalate)/glass compositeSCHULTZ, J. M; CHANG-LHYMN.Polymer composites. 1984, Vol 5, Num 3, pp 215-223, issn 0272-8397Article

Claquage thermique électrique et optique d'un système liquide-diélectrique ou semiconducteur au repos ou mobileGALICH, N. E.Žurnal tehničeskoj fiziki. 1985, Vol 55, Num 11, pp 2115-2122, issn 0044-4642Article

Improving the safety of a pyrotechnic igniter through a controlled experimentMILMAN, B; SIROTA, I; STEINBERG, D. M et al.Propellants, explosives, pyrotechnics. 1995, Vol 20, Num 6, pp 294-299, issn 0721-3115Article

Sources de pannes des pompes à chaleur (sur l'air)Promoclim A. 1982, Vol 13, Num 5, issn 0249-6526, 7Article

Dependence of breakdown voltage on the junction curvature in concentration profiled diodesGHATOL, A. A; SUNDARSINGH, V. P.Microelectronics. 1984, Vol 15, Num 6, pp 5-14, issn 0026-2692Article

The Bhopal disaster: Understanding the impact of unreliable machinery : PROCESS/PLANT OPTIMIZATIONBLOCH, K; JUNG, B.Hydrocarbon processing (International ed.). 2012, Vol 91, Num 6, pp 73-76, issn 0018-8190, 4 p.Article

Breakdown voltage and on-resistance of multi-RESURF LDMOSCHOI, E. K; CHOI, Y. I; CHUNG, S. K et al.Microelectronics journal. 2003, Vol 34, Num 5-8, pp 683-686, issn 0959-8324, 4 p.Conference Paper

Dependable computing: from concepts to design diversityAVIZIENIS, A; LAPRIE, J.-C.Proceedings of the IEEE. 1986, Vol 74, Num 5, pp 629-638, issn 0018-9219Article

A dependent multiple failure mode modelling procedureBOROWIAK, D.Communications in statistics. Theory and methods. 1985, Vol 14, Num 8, pp 1837-1847, issn 0361-0926Article

Method of laser-induced breakdown detection and application examplesBUNDSCHUH, Tobias; WAGNER, Tobias; WEBER, Matthias et al.Chemical engineering & technology. 2004, Vol 27, Num 4, pp 377-382, issn 0930-7516, 6 p.Article

Les processus au stade de retard de l'amorçage dans l'argon et leur influence sur la formation d'une décharge volumique de nanosecondeKLIMENKO, K. A; KOZYREV, A. V; KOROLEV, YU. D et al.Fizika plazmy (Moskva, 1975). 1984, Vol 10, Num 1, pp 183-188, issn 0134-5052Article

J×B gun pre-ionization equipment in JFT-2 tokamakMATSUZAKI, Y; TANI, T.Japanese journal of applied physics. 1984, Vol 23, Num 7, pp 941-942, issn 0021-4922, 1Article

Electrical breakdown of solid dielectricsROZHKOV, V. M.Russian electrical engineering. 2000, Vol 71, Num 3, pp 56-60, issn 1068-3712Article

Study of two-component system with failure interactionMURTHY, D. N. P; NGUYEN, D. G.Naval research logistics quarterly. 1985, Vol 32, Num 2, pp 239-247, issn 0028-1441Article

Proposal of a new distribution-free method for reliability demonstration testsICHIKAWA, M.Reliability engineering. 1984, Vol 9, Num 2, pp 99-105, issn 0143-8174Article

The variability of system failure probabilityCONNORS, D. C.Reliability engineering. 1984, Vol 9, Num 2, pp 117-125, issn 0143-8174Article

THEORIE DE LA FORMATION D'UNE DECHARGE ELECTRIQUE DANS UN LIQUIDE CONDUCTEURZHEKUL VG; RAKOVSKIJ GB.1983; ZURNAL TEHNICESKOJ FIZIKI; ISSN 0044-4642; SUN; DA. 1983; VOL. 53; NO 1; PP. 8-14; BIBL. 10 REF.Article

EFFET D'UNE TENSION LIMITE POUR LE CLAQUAGE D'UN INTERVALLE DE GAZKOLBYCHEV GV.1982; Z. TEH. FIZ.; ISSN 0044-4642; SUN; DA. 1982; VOL. 52; NO 3; PP. 511-512; BIBL. 4 REF.Article

Parallel Machine Scheduling under the Disruption of Machine BreakdownLIXIN TANG; YANYAN ZHANG.Industrial & engineering chemistry research. 2009, Vol 48, Num 14, pp 6660-6667, issn 0888-5885, 8 p.Article

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