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1/f Noise in Advanced CMOSTransistorsNEMIROVSKY, Yael; CORCOS, Dan; BROUK, Igor et al.IEEE instrumentation & measurement magazine. 2011, Vol 14, Num 1, pp 14-22, issn 1094-6969, 9 p.Article

Correlation between destruction of the metal surface caused by pitting corrosion and intensity of the observed electrochemical noiseSMULKO, J. M; ZIELINSKI, A; DAROWICKI, K et al.Proceedings of SPIE, the International Society for Optical Engineering. 2005, pp 57-62, issn 0277-786X, isbn 0-8194-5841-4, 1Vol, 6 p.Conference Paper

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Thin film resistor technology and noise reliability indicatorsHRUSKA, P.International conference on microelectronic. 1997, pp 663-666, isbn 0-7803-3664-X, 2VolConference Paper

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Caractérisation des cellules solaires au silicium pour application spatialeRuas, Robert; Alabedra, Robert.1988, 144 p.Thesis

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