A modular wrapper enabling high speed BIST and repair for small wide memoriesAITKEN, Robert C.International Test Conference. 2004, pp 997-1005, isbn 0-7803-8580-2, 1Vol, 9 p.Conference Paper

At-speed built-in self-repair analyzer for embedded word-oriented memoriesXIAOGANG DU; REDDY, Sudhakar M; CHENG, Wu-Tung et al.International Conference on Embedded Systems DesignInternational Conference on VLSI Design. 2004, pp 895-900, isbn 0-7695-2072-3, 1Vol, 6 p.Conference Paper

Intelligent agents and BIST/BISR: Working together in distributed systemsMICLEA, Liviu; SZILARD, Enyedi; BENSO, Alfredo et al.Proceedings - International Test Conference. 2002, pp 940-946, issn 1089-3539, isbn 0-7803-7542-4, 7 p.Conference Paper

Self-healing polymeric materials : A review of recent developmentsDONG YANG WU; MEURE, Sam; SOLOMON, David et al.Progress in polymer science. 2008, Vol 33, Num 5, pp 479-522, issn 0079-6700, 44 p.Article

Fail pattern identification for memory built-in self-repairHUANG, Rei-Fu; SU, Chin-Lung; WU, Cheng-Wen et al.Asian test symposium. 2004, pp 366-371, isbn 0-7695-2235-1, 1Vol, 6 p.Conference Paper

A Built-In Repair Analyzer With Optimal Repair Rate for Word-Oriented MemoriesCHUNG, Jaeyong; PARK, Joonsung; ABRAHAM, Jacob A et al.IEEE transactions on very large scale integration (VLSI) systems. 2013, Vol 21, Num 2, pp 281-291, issn 1063-8210, 11 p.Article

Micro programmable Built-On Self repair for SRAMsZAPPA, R; SELVA, C; RIMONDI, D et al.IEEE International Workshop on Memory Technology, Design and Testing. 2004, pp 72-77, isbn 0-7695-2193-2, 1Vol, 6 p.Conference Paper

Hierarchical system for autonomous sensing-healing of delamination in large-scale composite structuresMINAKUCHI, Shu; DENGHAO SUN; TAKEDA, Nobuo et al.Smart materials and structures. 2014, Vol 23, Num 11, issn 0964-1726, 115014.1-115014.10Article

Optimal Loading of Molecular BondsHESS, Henry.Nano letters (Print). 2012, Vol 12, Num 11, pp 5813-5814, issn 1530-6984, 2 p.Article

Le monde des matériaux et ses évolutions récentes : Les matériaux sont-ils intelligents ? = Recent evolutions in the world of materials: Are materials intelligent?SALVIA, Michelle.Annales de chimie (Paris. 1914). 2004, Vol 29, Num 6, pp 1-12, issn 0151-9107, 12 p.Article

Built-in self-test and repair (BISTR) techniques for embedded RAMsLU, Shyue-Kung; HUANG, Shih-Chang.IEEE International Workshop on Memory Technology, Design and Testing. 2004, pp 60-64, isbn 0-7695-2193-2, 1Vol, 5 p.Conference Paper

A Built-in Self-Diagnosis and Repair Design With Fail Pattern Identification for MemoriesSU, Chin-Lung; HUANG, Rei-Fu; WU, Cheng-Wen et al.IEEE transactions on very large scale integration (VLSI) systems. 2011, Vol 19, Num 12, pp 2184-2194, issn 1063-8210, 11 p.Article

A Fast Built-in Redundancy Analysis for Memories With Optimal Repair Rate Using a Line-Based Search TreeJEONG, Woosik; KANG, Ilkwon; JIN, Kyowon et al.IEEE transactions on very large scale integration (VLSI) systems. 2009, Vol 17, Num 12, pp 1665-1678, issn 1063-8210, 14 p.Article

ProTaR : An infrastructure IP for repairing RAMs in system-on-chips : Systems-on-chipHUANG, Chao-Da; LI, Jin-Fu; TSENG, Tsu-Wei et al.IEEE transactions on very large scale integration (VLSI) systems. 2007, Vol 15, Num 10, pp 1135-1143, issn 1063-8210, 9 p.Article

A Self-Repair Technique for Content Addressable Memories with Address-Input-Free Writing FunctionLAI, Chun-Kai; HUANG, Yu-Jen; LI, Jin-Fu et al.Journal of information science and engineering. 2013, Vol 29, Num 3, pp 493-507, issn 1016-2364, 15 p.Article

A built-in self-repair design for rams with 2-D redundancvLI, Jin-Fu; YEH, Jen-Chieh; HUANG, Rei-Fu et al.IEEE transactions on very large scale integration (VLSI) systems. 2005, Vol 13, Num 6, pp 742-745, issn 1063-8210, 4 p.Article

A Low-Cost Built-In Redundancy-Analysis Scheme for Word-Oriented RAMs With 2-D RedundancyTSENG, Tsu-Wei; LI, Jin-Fu.IEEE transactions on very large scale integration (VLSI) systems. 2011, Vol 19, Num 11, pp 1983-1995, issn 1063-8210, 13 p.Article

Effects of programming and healing temperatures on the healing efficiency of a confined healable polymer compositeYOUGOUBARE, Y. Quentin; PANG, Su-Seng.Smart materials and structures. 2014, Vol 23, Num 2, issn 0964-1726, 025027.1-025027.9Article

Healing and super healing in continuum damage mechanicsVOYIADJIS, George Z; KATTAN, Peter I.International journal of damage mechanics. 2014, Vol 23, Num 2, pp 245-260, issn 1056-7895, 16 p.Article

An Electrophoresis-Aided Biomineralization System for Regenerating Dentin- and Enamel-Like Microstructures for the Self-Healing of Tooth DefectsWU, Xiao-Ting; YING CAO; MAY LEI MEI et al.Crystal growth & design. 2014, Vol 14, Num 11, pp 5537-5548, issn 1528-7483, 12 p.Article

Self-healing of erosion damage in a polymer coatingKELLER, Michael W; HAMPTON, Kyle; MCLAURY, Brenton et al.Wear. 2013, Vol 307, Num 1-2, pp 218-225, issn 0043-1648, 8 p.Article

Fairness-Aware Cooperative Resource Allocation for Self-Healing in SON-based Indoor SystemLEE, Kisong; LEE, Howon; CHO, Dong-Ho et al.IEEE communications letters. 2012, Vol 16, Num 7, pp 1030-1033, issn 1089-7798, 4 p.Article

Lithium-Assisted Electrochemical Welding in Silicon Nanowire Battery ElectrodesKARKI, Khim; EPSTEIN, Eric; CHO, Jeong-Hyun et al.Nano letters (Print). 2012, Vol 12, Num 3, pp 1392-1397, issn 1530-6984, 6 p.Article

Solvent- and Vapor-Mediated Solid-State Transformations in 1,3,5-Benzenetricarboxylate Metal―Organic FrameworksDAVIES, Kate; BOURNE, Susan A; OLIVER, Clive L et al.Crystal growth & design. 2012, Vol 12, Num 4, pp 1999-2003, issn 1528-7483, 5 p.Article

Molecular Dynamics Simulation of Chemical Vapor Deposition Graphene Growth on Ni (111) SurfaceLIJUAN MENG; QING SUN; JINLAN WANG et al.Journal of physical chemistry. C. 2012, Vol 116, Num 10, pp 6097-6102, issn 1932-7447, 6 p.Article