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au.\*:("Bulgarian Academy of Science . Institute Electronics")

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Boron nitride film formation by means of dynamic mixing methodFUJIMOTO, F.Vacuum. 1990, Vol 42, Num 1-2, pp 67-72, issn 0042-207X, 6 p.Conference Paper

Range profile calculations by direct numerical solution of linearized Boltzmann transport equationsPOSSELT, M.Vacuum. 1990, Vol 42, Num 1-2, pp 9-12, issn 0042-207X, 4 p.Conference Paper

Focused ion beam technologyGAMO, K.Vacuum. 1990, Vol 42, Num 1-2, pp 89-93, issn 0042-207XConference Paper

Problems of scanning Auger electron microscopyFRANK, L.Vacuum. 1990, Vol 42, Num 1-2, pp 147-150, issn 0042-207XConference Paper

Calculation of the depth profiles associated with high energy ion implantationBURENKOV, A. F; KOMAROV, F. F.Vacuum. 1990, Vol 42, Num 1-2, pp 13-15, issn 0042-207X, 3 p.Conference Paper

A comprehensive SIMS study of high-Tc superconductorsCHENAKIN, S. P.Vacuum. 1990, Vol 42, Num 1-2, pp 139-142, issn 0042-207X, 4 p.Conference Paper

A low working pressure magnetron sputtering sourceKOSTADINOV, L; DOBREV, D.Vacuum. 1990, Vol 42, Num 1-2, pp 35-37, issn 0042-207XConference Paper

Power dissipation in rf glow dischargesDELTCHEV, R; ALBERT, M; SUCHANECK, G et al.Vacuum. 1990, Vol 42, Num 1-2, pp 33-34, issn 0042-207XConference Paper

Atomic layer epitaxy : 12 years laterHERMAN, M. A.Vacuum. 1990, Vol 42, Num 1-2, pp 61-66, issn 0042-207X, 6 p.Conference Paper

Deposition of copper oxide, titanium oxide and indium tin oxide films by reactive magnetron sputteringPOPOV, D. N; DOCHEVA, P. I.Vacuum. 1990, Vol 42, Num 1-2, pp 53-55, issn 0042-207X, 3 p.Conference Paper

Low temperature gas plasma formation of thin films on the surface of a substrate via holesSMIRNOV, B. N.Vacuum. 1990, Vol 42, Num 1-2, pp 57-60, issn 0042-207X, 4 p.Conference Paper

Self-annealing in ion-implanted Si and GaAsKOMAROV, F. F.Vacuum. 1990, Vol 42, Num 1-2, pp 101-106, issn 0042-207X, 6 p.Conference Paper

Structural transformations and long-range effects in alloys caused by gas ion bombardmentKREINDEL, Y. E; OVCHINNIKOV, V. V.Vacuum. 1990, Vol 42, Num 1-2, pp 81-83, issn 0042-207X, 3 p.Conference Paper

Theoretical analysis of heat flow and structural changes during electron beam irradiation of steelPETROV, P; MLADENOV, G.Vacuum. 1990, Vol 42, Num 1-2, pp 29-32, issn 0042-207X, 4 p.Conference Paper

Structure and emission characteristics of AuSi alloy field ion sourceDRANDAROV, N; NIKOLOV, B; VALCHOVSKA, T et al.Vacuum. 1990, Vol 42, Num 1-2, pp 95-99, issn 0042-207XConference Paper

Dependence of collisional mixing on recoil energyHAUTALA, M; KOPONEN, I.Vacuum. 1990, Vol 42, Num 1-2, pp 3-7, issn 0042-207X, 5 p.Conference Paper

The determination of species distributions and deduction of mixing and effective diffusion parameters in the altered layer of irradiated filmsNOBES, M. J; CARTER, G; KATARDJIEV, I. V et al.Vacuum. 1990, Vol 42, Num 1-2, pp 21-27, issn 0042-207X, 7 p.Conference Paper

Angular and energy dependencies of secondary ion emission from polycrystalline and single-crystal surfacesKOSYACHKOV, A. A.Vacuum. 1990, Vol 42, Num 1-2, pp 143-145, issn 0042-207X, 3 p.Conference Paper

Auger electron spectroscopic analysis of InxGa1-xAsSPASSOV, G. S.Vacuum. 1990, Vol 42, Num 1-2, pp 155-158, issn 0042-207X, 4 p.Conference Paper

Computer simulation of hillock growthMUÊLLER-PFEIFFER, S; ANKLAM, H.-J.Vacuum. 1990, Vol 42, Num 1-2, pp 113-116, issn 0042-207X, 4 p.Conference Paper

Energy and angular distributions of ions backscattered from the sidewalls during the implantation into deep trenchesPOSSELT, M; OTTO, G.Vacuum. 1990, Vol 42, Num 1-2, pp 17-19, issn 0042-207X, 3 p.Conference Paper

Modification of physico-mechanical properties of metals and metallic coatings by ion implantationRADJABOV, T. D.Vacuum. 1990, Vol 42, Num 1-2, pp 163-168, issn 0042-207X, 6 p.Conference Paper

The sputter deposition process : a Monte-Carlo studyHEBERLEIN, T; KRAUTHEIM, G; WUTTKE, W et al.Vacuum. 1990, Vol 42, Num 1-2, pp 47-51, issn 0042-207X, 5 p.Conference Paper

Effect of low-energy ion flows on the physico-mechanical properties and morphology of iron surfacesCHEKANOV, A. L; ROMANOV, I. G; PEREVEZENTSEV, V. N et al.Vacuum. 1990, Vol 42, Num 1-2, pp 85-87, issn 0042-207X, 3 p.Conference Paper

Investigation of arsenic-implanted silicon by optical reflectometrySTAVROV, V. I; VARBANOV, R; VASILIEV, O et al.Vacuum. 1990, Vol 42, Num 1-2, pp 107-109, issn 0042-207X, 3 p.Conference Paper

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