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TEMPERATURE DEPENDENCE OF THE K X-RAY EMISSION EDGE OF LI.CALLCOTT TA; ARAKAWA ET.1977; PHYS. REV. LETTERS; U.S.A.; DA. 1977; VOL. 38; NO 8; PP. 442-445; BIBL. 23 REF.Article

SINGLE CRYSTAL OPTICAL PROPERTIES OF TWO FORMS OF TETRA THIAFULVALENIUM IODIDE (TTF-IN).WARMACK RJ; CALLCOTT TA.1976; PHYS. REV., B; U.S.A.; DA. 1976; VOL. 14; NO 8; PP. 3238-3241; BIBL. 15 REF.Article

EXTREME ULTRAVIOLET TRANSMISSION GRATING MONOCHROMATORCALDWELL PJ; ARAKAWA ET; CALLCOTT TA et al.1981; APPL. OPT.; ISSN 0003-6935; USA; DA. 1981; VOL. 20; NO 17; PP. 3047-3049; BIBL. 9 REF.Article

DIFFUSION OF AU INTO SN THIN FILMS STUDIED BY THE ATTENUATED TOTAL REFLECTION METHOD = DIFFUSION DE L'OR DANS DES COUCHES MINCES D'ETAIN PAR LA METHODE DE REFLEXION TOTALE ATTENUEECHANG C; CALLCOTT TA; ARAKAWA ET et al.1982; JOURNAL OF APPLIED PHYSICS; ISSN 0021-8979; USA; DA. 1982; VOL. 53; NO 11; PART. 1; PP. 7362-7366; BIBL. 9 REF.Article

FREE-STANDING PHOTORESIST FILMS FOR MICROLITHOGRAPHYLITTLE JW; CALLCOTT TA; ARAKAWA ET et al.1980; REV. SCI. INSTRUM.; ISSN 0034-6748; USA; DA. 1980; VOL. 51; NO 11; PP. 1581-1583; BIBL. 3 REF.Article

TEMPERATURE DEPENDENCE OF THE SOFT X-RAY EMISSION EDGES OF SIMPLE METALSTAGLE JA; ARAKAWA ET; CALLCOTT TA et al.1980; PHYS. REV. B; ISSN 0163-1829; USA; DA. 1980; VOL. 21; NO 10; PP. 4552-4557; BIBL. 25 REF.Article

EMISSION AND ABSORPTION X-RAY EDGES OF LI.CALLCOTT TA; ARAKAWA ET; EDERER DL et al.1977; PHYS. REV., B; U.S.A.; DA. 1977; VOL. 16; NO 12; PP. 5185-5192; BIBL. 23 REF.Article

OPTICAL PROPERTIES OF K BETWEEN 4 AND 10.7 EV AND COMPARISON WITH NA, RB, AND CSWHANG US; ARAKAWA ET; CALLCOTT TA et al.1972; PHYS. REV., B; U.S.A.; DA. 1972; VOL. 6; NO 6; PP. 2109-2118; BIBL. 29 REF.Serial Issue

SOFT X-RAY EMISSION FROM LI-MG AND LI-AL ALLOYS AND COMPARISONS WITH KKR-CPA CALCULATIONSCALLCOTT TA; TAGLE JA; ARAKAWA ET et al.1980; APPL. OPT.; ISSN 0003-6935; USA; DA. 1980; VOL. 19; NO 23; PP. 4035-4041; BIBL. 31 REF.Article

APPLICATIONS OF RESONANCE IONIZATION SPECTROSCOPY TO ULTRALOW-LEVEL COUNTING AND MASS SPECTROSCOPY = APPLICATIONS DE LA SPECTROSCOPIE D'IONISATION RESONNANTE AU COMPTAGE ET A LA SPECTROSCOPIE DE MASSEKRAMER SD; HURST GS; YOUNG JP et al.1980; RADIOCARBON; ISSN 0033-8222; USA; DA. 1980; VOL. 22; NO 2; PP. 428-434; BIBL. 8 REF.Article

OPTICAL PROPERTIES OF LIQUID TIN BETWEEN 0,62 AND 3,7 EV = PROPRIETES OPTIQUES DE L'ETAIN LIQUIDE ENTRE 0,62 ET 3,7 EVPETRAKIAN JP; CATHERS AR; PARKS JE et al.1980; PHYS. REV. B; ISSN 0163-1829; USA; DA. 1980; VOL. 21; NO 8; PP. 3043-3046; BIBL. 12 REF.Article

RESONANCE IONIZATION SOURCE FOR MASS SPECTROSCOPYBEEKMAN DW; CALLCOTT TA; KRAMER SD et al.1980; INTERNATION. J. MASS. SPECTROM. ION PHYS.; NLD; DA. 1980; VOL. 34; NO 1-2; PP. 89-97; BIBL. 7 REF.Article

SPLITTING OF SURFACE-PLASMON EMISSION SPECTRA FROM POTASSIUMWILLIAMS MW; ASHLEY JC; KRETSCHMANN E et al.1979; PHYS. LETT. SECT. A; ISSN 0375-9601; NLD; DA. 1979; VOL. 73; NO 3; PP. 231-233; BIBL. 6 REF.Article

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