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METHOD OF SEPARATING HYSTERESIS EFFECTS FROM MIS CAPACITANCE MEASUREMENTS.NAKAGAWA T; FUJISADA H.1977; APPL. PHYS. LETTERS; U.S.A.; DA. 1977; VOL. 31; NO 5; PP. 348-350; BIBL. 10 REF.Article

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UNTERSUCHUNG DES PARALLELFELDKONDENSATORS ZUR ERFASSUNG DES VOLUMENDURCHSATZES UND GLEICHZEITIGER BESTIMMUNG QUALITATIVER KENNGROESSEN DES GROBFUTTERS AUF BANDANLAGEN DER INDUSTRIEMAESSIGEN RINDERPRODUKTION = ETUDE D'UN CONDENSATEUR A CHAMP PARALLELE POUR ENREGISTRER LE DEBIT VOLUMIQUE ET DETERMINER SIMULTANEMENT LES CARACTERISTIQUES QUALITATIVES DU FOURRAGE BRUT SUR LES BANDES TRANSPORTEUSES DES INSTALLATIONS INDUSTRIELLES D'ELEVAGE BOVINHAUSSIG R.1980; WISSENSCHAFTL. Z. TECH. UNIV. DRESD.; ISSN 0043-6925; DDR; DA. 1980; VOL. 29; NO 6; PP. 1368-1372; BIBL. 8 REF.Article

AN ALTERNATIVE APPROACH TO AUTOMOTIVE FUEL GAUGINGHUDDART J.1979; SAE TRANS.; ISSN 0096-736X; USA; DA. 1979 PUBL. 1980; VOL. 88; SECT. 1; PP. 501-507; BIBL. 8 REF.Article

MEASUREMENT OF LINEAR THERMAL EXPANSION OF SOLIDS BY A CAPACITANCE METHOD.RAO KV; JAYASRI MAITI.1977; INDIAN J. PURE APPL. PHYS.; INDIA; DA. 1977; VOL. 15; NO 6; PP. 437-440; BIBL. 11 REF.Article

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TRANSIENT CAPACITANCE MEASUREMENTS OF INTERFACE STATES ON THE INTENTIONALLY CONTAMINATED SI-SIO₂ INTERFACESCHULZ M; KLAUSMANN E.1979; APPL. PHYS.; DEU; DA. 1979; VOL. 18; NO 2; PP. 169-175; BIBL. 12 REF.Article

VOLTAGE DEPENDENCE OF THE CAPACITANCE OF A TWISTED NEMATIC LIQUID CRYSTAL LAYERRAYNES EP; TOUGH RJA; DAVIES KA et al.1979; MOLEC. CRYST. LIQUID CRYST; GBR; DA. 1979; VOL. 56; NO 2; PP. 63-68; BIBL. 7 REF.Article

CAPACITANCE DETERMINATION OF THE AREA THERMAL EXPANSION OF DIELECTRIC CRYSTALSLEGGE JC; ROBINSON MC; SHAPIRO MM et al.1979; REV. SCI. INSTRUM.; USA; DA. 1979; VOL. 50; NO 7; PP. 832-834; BIBL. 7 REF.Article

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DETERMINATION OF DEEP ELECTRON TRAPS IN GAAS BY TIME-RESOLVED CAPACITANCE MEASUREMENT.WADA O; YANAGISAWA S; TAKANASHI H et al.1977; APPL. PHYS.; GERM.; DA. 1977; VOL. 13; NO 1; PP. 5-13; BIBL. 26 REF.Article

TRANSIENT CAPACITANCE DEEP LEVEL SPECTROMETRY INSTRUMENTATION.MILLER MD; PATTERSON DR.1977; REV. SCI. INSTRUM.; U.S.A.; DA. 1977; VOL. 48; NO 3; PP. 237-239; BIBL. 2 REF.Article

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SOME STUDIES ON THE INSTABILITY IN MOS DEVICES DUE TO WATER VAPOUR CONTAMINATION.SINGH BR; TYAGI BD; MARATHE BR et al.1976; INTERNATION. J. ELECTRON.; G.B.; DA. 1976; VOL. 41; NO 3; PP. 273-283; BIBL. 20 REF.Article

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