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kw.\*:("CAPACITIVE METHOD")

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HEMISPHERICAL DIELECTRIC PERMITTIVITY CELL.HAYDEN JS; BERBERIAN JG.1978; REV. SCI. INSTRUM.; USA; DA. 1978; VOL. 49; NO 7; PP. 1014-1015; BIBL. 3 REF.Article

METHOD OF SEPARATING HYSTERESIS EFFECTS FROM MIS CAPACITANCE MEASUREMENTS.NAKAGAWA T; FUJISADA H.1977; APPL. PHYS. LETTERS; U.S.A.; DA. 1977; VOL. 31; NO 5; PP. 348-350; BIBL. 10 REF.Article

PECULIARITIES OF CAPACITIVE MEASUREMENT OF HEAT HUMIDITYPODKIN YU G; BODROV AI; IVANOV ES et al.1977; TORF. PROMYSHL.; S.S.S.R.; DA. 1977; NO 2; PP. 16-19; BIBL. 5 REF.Article

CAPACITANCE PROBE STUDY OF ROTATING-HEAD/TAPE INTERFACE.FELISS NA; TALKE EE.1977; I.B.M. J. RES. DEVELOP.; U.S.A.; DA. 1977; VOL. 21; NO 3; PP. 289-293; BIBL. 9 REF.Article

STATIC TECHNIQUE FOR DIFFERENTIAL CAPACITANCE MEASUREMENTS IN MOS STRUCTURES.KIROV K; MINCHEV G; ALEXANDROVA S et al.1976; C.R. ACAD. BULG. SCI.; BULG.; DA. 1976; VOL. 29; NO 12; PP. 1749-1750; BIBL. 3 REF.Article

KONZENTRATIONS-BZW. DICHTEMESSUNG VON PHYSIKALISCHEN GEMISCHEN BEI DER FOERDERUNG DURCH ROHRLEITUNGEN = CONCENTRATION AND DENSITY MEASUREMENT OF TWO-PHASE MIXTURES IN PIPES = MESURE DE CONCENTRATION ET DE DENSITE DE MELANGES PHYSIQUES AU COURS DE LEUR TRANSPORT EN CONDUITESKESKA J.1982; SENSOR '82-TRANSDUCER-TECHNIK U. TEMPERATURMESSUNG. KONFERENZ/1982/ESSEN; DEU/GBR; WUNSTORF; BUCKINGHAM: NETWORK; DA. 1982; PP. 168-185; BIBL. 5 REF.Conference Paper

CONSTANT-CAPACITANCE DLTS MEASUREMENT OF DEFECT-DENSITY PROFILES IN SEMICONDUCTORSJOHNSON NM; BARTELINK DJ; GOLD RB et al.1979; J. APPL. PHYS.; ISSN 0021-8979; USA; DA. 1979; VOL. 50; NO 7; PP. 4828-4833; BIBL. 23 REF.Article

DIELECTRIC CONSTANT OF CUINSE2 BY CAPACITANCE MEASUREMENTSLI PW; ANDERSON RA; PLOVNICK RH et al.1979; J. PHYS. CHEM. SOLIDS; GBR; DA. 1979; VOL. 40; NO 4; PP. 333-334; BIBL. 16 REF.Article

DIE BESTIMMUNG DES WASSERGEHALTES DER KOHLE. II. DAS KAPAZITIVE MESSVERFAHREN. = DETERMINATION OF WATER CONTENT OF COALS. II. THE CAPACITATIVE MEASURING METHOD = DETERMINATION DE L'HUMIDITE DU CHARBON. II. LE PROCEDE CAPACITIF DE MESURESCHAFER HG; JANSEN H.1978; ERDOEL KOHLE ERDGAS PETROCHEM.; DEU; DA. 1978; VOL. 31; NO 7; PP. 326; BIBL. 4 REF.Article

OPTICALLY ACTIVE INTERFACE STATES IN MOS STRUCTURESKAMIENIECKI E; NITECKI R; SWIATEK A et al.1980; SOLID-STATE ELECTRON.; GBR; DA. 1980; VOL. 23; NO 1; PP. 79-85; BIBL. 18 REF.Article

INVESTIGATION OF DEEP TRAPS IN GAAS BY A CAPACITIVE METHOD.MITONNEAU A.1976; PHILIPS RES. REP.; NETHERL.; DA. 1976; VOL. 31; NO 3; PP. 244-256; BIBL. 15 REF.Article

CANTILEVER AND CAPACITOR TECHNIQUE FOR MEASURING DILATATIONPRIMAK W; MONAHAN E.1983; REVIEW OF SCIENTIFIC INSTRUMENTS; ISSN 0034-6748; USA; DA. 1983; VOL. 54; NO 5; PP. 544-551; BIBL. 13 REF.Article

UNTERSUCHUNG DES PARALLELFELDKONDENSATORS ZUR ERFASSUNG DES VOLUMENDURCHSATZES UND GLEICHZEITIGER BESTIMMUNG QUALITATIVER KENNGROESSEN DES GROBFUTTERS AUF BANDANLAGEN DER INDUSTRIEMAESSIGEN RINDERPRODUKTION = ETUDE D'UN CONDENSATEUR A CHAMP PARALLELE POUR ENREGISTRER LE DEBIT VOLUMIQUE ET DETERMINER SIMULTANEMENT LES CARACTERISTIQUES QUALITATIVES DU FOURRAGE BRUT SUR LES BANDES TRANSPORTEUSES DES INSTALLATIONS INDUSTRIELLES D'ELEVAGE BOVINHAUSSIG R.1980; WISSENSCHAFTL. Z. TECH. UNIV. DRESD.; ISSN 0043-6925; DDR; DA. 1980; VOL. 29; NO 6; PP. 1368-1372; BIBL. 8 REF.Article

AN ALTERNATIVE APPROACH TO AUTOMOTIVE FUEL GAUGINGHUDDART J.1979; SAE TRANS.; ISSN 0096-736X; USA; DA. 1979 PUBL. 1980; VOL. 88; SECT. 1; PP. 501-507; BIBL. 8 REF.Article

MEASUREMENT OF LINEAR THERMAL EXPANSION OF SOLIDS BY A CAPACITANCE METHOD.RAO KV; JAYASRI MAITI.1977; INDIAN J. PURE APPL. PHYS.; INDIA; DA. 1977; VOL. 15; NO 6; PP. 437-440; BIBL. 11 REF.Article

THE EFFECT OF ELECTRON-BEAM ALUMINIZATION ON THE SI-SAPPHIRE INTERFACE.GOODMAN AM; WEITZEL CE.1977; APPL. PHYS. LETTERS; U.S.A.; DA. 1977; VOL. 31; NO 2; PP. 114-117; BIBL. 21 REF.Article

TRANSIENT CAPACITANCE MEASUREMENTS OF INTERFACE STATES ON THE INTENTIONALLY CONTAMINATED SI-SIO2 INTERFACESCHULZ M; KLAUSMANN E.1979; APPL. PHYS.; DEU; DA. 1979; VOL. 18; NO 2; PP. 169-175; BIBL. 12 REF.Article

VOLTAGE DEPENDENCE OF THE CAPACITANCE OF A TWISTED NEMATIC LIQUID CRYSTAL LAYERRAYNES EP; TOUGH RJA; DAVIES KA et al.1979; MOLEC. CRYST. LIQUID CRYST; GBR; DA. 1979; VOL. 56; NO 2; PP. 63-68; BIBL. 7 REF.Article

CAPACITANCE DETERMINATION OF THE AREA THERMAL EXPANSION OF DIELECTRIC CRYSTALSLEGGE JC; ROBINSON MC; SHAPIRO MM et al.1979; REV. SCI. INSTRUM.; USA; DA. 1979; VOL. 50; NO 7; PP. 832-834; BIBL. 7 REF.Article

ACCURATE IN SITU MEASUREMENT OF NEAR-SURFACE VOLUME DILATATION IN IRRADIATED SILICA THROUGH CAPACITANCE MONITORING OF CANTILEVER DEFLECTIONNORRIS CB; EERNISSE EP.1983; REVIEW OF SCIENTIFIC INSTRUMENTS; ISSN 0034-6748; USA; DA. 1983; VOL. 54; NO 5; PP. 552-558; BIBL. 19 REF.Article

SUPPRESSION OF PREMATURE DIELECTRIC BREAKDOWN FOR HIGH-VOLTAGE CAPACITANCE MEASUREMENTS.GOODMAN AM.1977; R.C.A. REV.; U.S.A.; DA. 1977; VOL. 38; NO 3; PP. 436-442; BIBL. 4 REF.Article

PHOTOCAPACITANCE DETECTION OF DEEP CENTERS IN O-IMPLANTED ZINC TELLURIDEKATIRCIOGLU B; PAUTRAT JL.1979; J. APPL. PHYS.; ISSN 0021-8979; USA; DA. 1979; VOL. 50; NO 7; PP. 4856-4865; BIBL. 27 REF.Article

DETERMINATION OF DEEP ELECTRON TRAPS IN GAAS BY TIME-RESOLVED CAPACITANCE MEASUREMENT.WADA O; YANAGISAWA S; TAKANASHI H et al.1977; APPL. PHYS.; GERM.; DA. 1977; VOL. 13; NO 1; PP. 5-13; BIBL. 26 REF.Article

TRANSIENT CAPACITANCE DEEP LEVEL SPECTROMETRY INSTRUMENTATION.MILLER MD; PATTERSON DR.1977; REV. SCI. INSTRUM.; U.S.A.; DA. 1977; VOL. 48; NO 3; PP. 237-239; BIBL. 2 REF.Article

ENERGY LEVELS FOR PLATINUM AND PALLADIUM IN SILICON MEASURED BY THE DARK TRANSIENT CAPACITANCE TECHNIQUE.PUGNET M; BARBOLLA J; BRABANT JC et al.1976; PHYS. STATUS SOLIDI, A; ALLEM.; DA. 1976; VOL. 35; NO 2; PP. 533-543; ABS. FR.; BIBL. 28 REF.Article

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