kw.\*:("CARACTERISTIQUE CHARGE TENSION")
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A DESCRIPTION OF MOS INTERNODAL CAPACITANCES FOR TRANSIENT SIMULATIONSTAYLOR GW; FICHTNER W; SIMMONS JG et al.1982; IEEE TRANS. COMPUT.-AIDED DES. INTEGR. CIRCUITS SYST.; ISSN 50629X; USA; DA. 1982; VOL. 1; NO 4; PP. 150-156; BIBL. 9 REF.Article
CHARGE INJECTION IN METAL ZNO-SIO2-SI STRUCTURESPIERRET RF; GUNSHOR RL; CORNELL ME et al.1979; J. APPL. PHYS.; ISSN 0021-8979; USA; DA. 1979; VOL. 50; NO 12; PP. 8112-8124; BIBL. 27 REF.Article
Transferred charge in the active layer and EL device characteristics of TFEL cellsONO, Y. A; KAWAKAMI, H; FUYAMA, M et al.Japanese journal of applied physics. 1987, Vol 26, Num 9, pp 1482-1492, issn 0021-4922, 1Article
Investigations of charging and discharge in the dark of organic electrographic photoreceptorsLOZOVSKI, T; MALDZIUS, R; MONTRIMAS, E et al.Synthetic metals. 2000, Vol 109, Num 1-3, pp 195-198, issn 0379-6779Conference Paper