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MODIFICATIONS TO THE HIGH ANGLE GONIOMETER STAGES OF THE HITACHI HU-11 AND 200E ELECTRON MICROSCOPES TO REDUCE SPECIMEN CONTAMINATIONWARD MJ; MORRALEE J.1973; J. PHYS. E; G.B.; DA. 1973; VOL. 6; NO 2; PP. 123-125Serial Issue

DUAL CAMERA ATTACHMENT FOR A SCANNING ELECTRON MICROSCOPEMARSHALL DC.1973; J. PHYS. E; G.B.; DA. 1973; VOL. 6; NO 1; PP. 30-31Serial Issue

MODIFICATIONS TO THE HIGH ANGLE GONIOMETER STAGES OF THE HITACHI HU-11 AND 200E ELECTRON MICROSCOPES TO REDUCE SPECIMEN CONTAMINATIONWARD MJ; MORRALEE J.1973; J. PHYS. E; G.B.; DA. 1973; VOL. 6; NO 2; PP. 123-125Serial Issue

DUAL CAMERA ATTACHMENT FOR A SCANNING ELECTRON MICROSCOPEMARSHALL DC.1973; J. PHYS. E; G.B.; DA. 1973; VOL. 6; NO 1; PP. 30-31Serial Issue

SCANNING ELECTRON MICROSCOPY TECHNIQUES1972; IN: 30TH ANNU. MEET. 1ST PAC. REG. CONF. ELECTRON MICROSC. LOS ANGELES, CALIF., 1972. PROC.; BATON ROUGE; CLAITOR'S PUBL. DIV.; DA. 1972; PP. 366-379; BIBL. DISSEM.Conference Proceedings

SCANNING ELECTRON MICROSCOPY TECHNIQUES1972; IN: 30TH ANNU. MEET. 1ST PAC. REG. CONF. ELECTRON MICROSC. LOS ANGELES, CALIF., 1972. PROC.; BATON ROUGE; CLAITOR'S PUBL. DIV.; DA. 1972; PP. 366-379; BIBL. DISSEM.Conference Proceedings

A SPECIMEN STAGE FOR LOW TEMPERATURE TENSILE DEFORMATION IN AN ELECTRON MICROSCOPETAKEUCHI T; IKEDA S; IKENO S et al.1973; JAP. J. APPL. PHYS.; JAP.; DA. 1973; VOL. 12; NO 1; PP. 142-145; BIBL. 11 REF.Serial Issue

INSTRUMENTATION-ACCESSORIES AND TECHNIQUES1971; IN: 29TH ANNU. MEET. ELECTRON MICROSC. SOC. AMERICA PROC. BOSTON, MASS., 1971; BATON ROUGE; CLAITOR'S PUBL. DIV.; DA. 1971; PP. 38-53; BIBL. DISSEM.Conference Proceedings

PASSAGE ELECTRIQUE A PLUSIEURS CANAUX POUR CHAMBRE DE HAUTE PRESSIONSHUBNIKOV ML.1980; PRIB. TEH. EKSP.; ISSN 0032-8162; SUN; DA. 1980; NO 3; PP. 232-233; BIBL. 7 REF.Article

EXTENSION DES POSSIBILITES D'EMPLOI DU PORTE-OBJET DE TRACTION A CHAUD DU MICROSCOPE HAUTE TENSION. ETUDE DES MECANISMES DE DEFORMATION DANS DIVERS DOMAINES.VALLE R.1977; DGRST-7571163; FR.; DA. 1977; PP. (32P.); BIBL. 10 REF.; (RAPP. FINAL, ACTION CONCERTEE: METALL.)Report

INSTRUMENTATION1972; IN: 30TH ANNU. MEET. 1ST PAC. REG. CONF. ELECTRON MICROSC. LOS ANGELES, CALIF., 1972. PROC.; BATON ROUGE; CLAITOR'S PUBL. DIV.; DA. 1972; PP. 418-459; BIBL. DISSEM.Conference Proceedings

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