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Experimental evidence of two conduction mechanisms for direct tunnelling stress-induced leakage current through ultrathin silicon dioxide gate dielectricsSAMANTA, Piyas; TSZ YIN MAN; CHAN, Alain Chun Keung et al.Semiconductor science and technology. 2006, Vol 21, Num 10, pp 1393-1401, issn 0268-1242, 9 p.Article

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