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MESURE DU RAYONNEMENT A PARTIR DU SATELLITE "COSMOS-900". 1 SPECTROMETRIE D'ELECTRONSGERBERG AN; DRONOV AV; ISKANDEROV A SH et al.1980; KOOM. ISSLEDOV.; SUN; DA. 1980; VOL. 18; NO 3; PP. 392-396; BIBL. 5 REF.Article

ACCURATE SPECTROMETER CALIBRATION IN ELECTRON SPECTROSCOPYOELHAFEN P; FREEOUF JL.1983; JOURNAL OF VACUUM SCIENCE AND TECHNOLOGY. A, VACUUM, SURFACES, AND FILMS; ISSN 512915; USA; DA. 1983; VOL. 1; NO 1; PP. 96-97; BIBL. 1 REF.Article

EXPERIENCES EN SPECTROSCOPIE PHOTOELECTRONIQUEISHII T.1975; OYO BUTURI; JAP.; DA. 1975; VOL. 45; NO 4; PP. 334-338; BIBL. 10 REF.Article

METHODE SPECTROGRAPHIQUE AVEC INTERFERENCES, DES CLASSES DE VARIATIONS DU RAYONNEMENT COSMIQUEDORMAN LI.1982; IZV. AKAD. NAUK SSSR, SER. FIZ.; ISSN 0367-6765; SUN; DA. 1982; VOL. 46; NO 9; PP. 1720-1722; BIBL. 8 REF.Conference Paper

BEAM ANALYSIS SPECTROMETER FOR RELATIVISTIC HEAVY IONSSCHIMMERLING W; SUBRAMANIAN TS; MCDONALD WJ et al.1983; NUCLEAR INSTRUMENTS AND METHODS IN PHYSICS RESEARCH; ISSN 0167-5087; NLD; DA. 1983; VOL. 205; NO 3; PP. 531-543; BIBL. 16 REF.Article

CALCUL DES ABERRATIONS DES SPECTROMETRES A PRISME ELECTROSTATIQUE EN TENANT COMPTE DE LA LARGEUR DE LA SOURCEAFANAS'EV VP; YAVOR S YA.1978; ZH. TEKH. FIZ.; S.S.S.R.; DA. 1978; VOL. 48; NO 4; PP. 818-822; BIBL. 2 REF.Article

A HIGH EFFICIENCY ELECTRON PAIR SPECTROMETERBIRK M; SOKOLOWSKI JS; WOLFSON Y et al.1982; NUCLEAR INSTRUMENTS AND METHODS IN PHYSICS RESEARCH; ISSN 0167-5087; NLD; DA. 1982; VOL. 203; NO 1-3; PP. 255-259; BIBL. 6 REF.Article

MESURE DE LA FONCTION DE DISTRIBUTION DES IONS DANS UN FLUX RAPIDEASTRAKHANTSEV NV; ESELEVICH VG; KICHIGIN GN et al.1978; ZH. TEKH. FIZ.; S.S.S.R.; DA. 1978; VOL. 48; NO 2; PP. 297-302; BIBL. 5 REF.Article

BLANKING RESISTIVE HEATING CIRCUIT FOR AUGER ELECTRON SPECTROSCOPY EXPERIMENTS.YUNG YI TU; BLAKELY JM.1976; REV. SCI. INSTRUM.; U.S.A.; DA. 1976; VOL. 47; NO 12; PP. 1554-1555; BIBL. 4 REF.Article

ENERGY CALIBRATION OF ELECTRON SPECTROMETERS.RICHTER K; PEPLINSKI B.1978; J. ELECTRON SPECTROSC. RELAT. PHENOMENA; NETHERL.; DA. 1978; VOL. 13; NO 1; PP. 69-71; BIBL. 3 REF.Article

ANALYSEURS ELECTROSTATIQUES ET A SYMETRIE AXIALE DE L'ENERGIE DES PARTICULES CHARGEESOVSYANNIKOVA LP; YAVOR S YA.1978; ZH. TEKH. FIZ.; S.S.S.R.; DA. 1978; VOL. 48; NO 6; PP. 1306-1308; BIBL. 3 REF.Article

ANALYSEUR MAGNETIQUE D'UN CYCLOTRON COMPACTBASARGIN YU G; GAL'CHUK AV; KOROLEV LE et al.1977; ZH. TEKH. FIZ.; S.S.S.R.; DA. 1977; VOL. 47; NO 9; PP. 1904-1908; BIBL. 5 REF.Article

THE RESPONSE OF A SIMPLE MODULAR ELECTRON/HADRON CALORIMETER TO ELECTRONSBLEICHERT BM; GRUPEN C; MATTERN D et al.1982; NUCLEAR INSTRUMENTS AND METHODS IN PHYSICS RESEARCH; ISSN 0167-5087; NLD; DA. 1982; VOL. 199; NO 3; PP. 461-464; BIBL. 9 REF.Article

A NEW X-RAY GENERATOR FOR XPS APPLICATIONSGANSCHOW O; STEFFENS P.1982; JOURNAL OF VACUUM SCIENCE AND TECHNOLOGY; ISSN 0022-5355; USA; DA. 1982; VOL. 21; NO 3; PP. 845-852; BIBL. 19 REF.Article

SPECTROMETRES D'ELECTRONS ET DE PROTONS POUR DES MESURES PAR SATELLITE DANS LA MAGNETOSPHERE DE LA TERREMINEEV YU V; SPIR'KOVA ES.1981; VESTN. MOSKV. UNIV., SER. 3; ISSN 0579-9392; SUN; DA. 1981; VOL. 22; NO 1; PP. 91-95; BIBL. 4 REF.Article

IMPROVEMENTS TO A COMMERCIAL UV PHOTOELECTRON SPECTROMETERCANNINGTON PH.1980; J. PHYS. E; ISSN 0022-3735; GBR; DA. 1980; VOL. 13; NO 12; PP. 1344-1346; BIBL. 3 REF.Article

POSITION-SENSITIVE DETECTOR SYSTEM FOR ANGLE-RESOLVED ELECTRON SPECTROSCOPY WITH A CYLINDRICAL MIRROR ANALYSERVAN HOOF HA; VAN DER WIEL MJ.1980; J. PHYS. E; ISSN 0022-3735; GBR; DA. 1980; VOL. 13; NO 4; PP. 409-414; BIBL. 16 REF.Article

REDUCTION OF ENERGY-LOSS "GHOST STRUCTURES" OBSERVED IN ELECTROSTATIC DEFLECTION TYPE ELECTRON ANALYSERSLAHMAN BENNANI A; DUGUET A.1980; J. ELECTRON, SPECTROSC. RELAT. PHENOMENA; NLD; DA. 1980; VOL. 18; NO 1-2; PP. 145-152; BIBL. 8 REF.Article

SHAPE OF ELECTRON LINES EMITTED BY A FAST PARTICLE IN ATOMIC COLLISIONS. INFLUENCE OF THE ACCEPTANCE FUNCTIONBORDENAVE MONTESQUIEU A; GLEIZES A; BENOIT CATTIN P et al.1980; J. PHYS. E; ISSN 0022-3735; GBR; DA. 1980; VOL. 13; NO 2; PP. 209-215; BIBL. 4 REF.Article

A RETARDING POTENTIAL FIELD ELECTRON EMISSION SPECTROMETERWORKOWSKI CJ.1980; J. PHYS. E; ISSN 0022-3735; GBR; DA. 1980; VOL. 13; NO 1; PP. 67-73; BIBL. 18 REF.Article

CONICAL EXPONENTIAL MIRROR ANALYSERKACZMARCZYK J; PYTKOWSKI S; SZCZEPINSKI L et al.1979; BULL. ACAD. POL. SCI., SER. SCI. TECH.; ISSN 0001-4125; POL; DA. 1979 PUBL. 1980; VOL. 27; NO 12; PP. 149-154; ABS. RUS; BIBL. 3 REF.Article

GENERAL METHOD FOR INSULATOR ANALYSIS BY A.E.S. TECHNIQUEDEMONCY P.1979; VIDE COUCHES MINCES; ISSN 0223-4335; FRA; DA. 1979; NO 198; PP. 313Article

MICROCOMPUTER-BASED MULTIPLEXER FOR PERFORMING DEPTH PROFILING WITH AN AUGER ELECTRON SPECTROMETEROPPENHEIMER JL.1979; REV. SCI. INSTRUM.; USA; DA. 1979; VOL. 50; NO 5; PP. 572-576; BIBL. 3 REF.Article

MOTT ELECTRON SPIN POLARIZATION ANALYSIS SYSTEM OF NOVEL DESIGNHODGE LA; MORAVEC TJ; DUNNING FB et al.1979; REV. SCI. INSTRUM.; USA; DA. 1979; VOL. 50; NO 1; PP. 5-8; BIBL. 7 REF.Article

THE DOUBLE CYLINDRICAL ELECTROSTATIC SECTOR AS AN ION ENERGY ANALYZERTERZIC I; CIRIC D.1979; NUCL. INSTRUM. METHODS; NLD; DA. 1979; VOL. 166; NO 3; PP. 419-423; BIBL. 4 REF.Article

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