The effect of deviation of cavity temperature and wall emissivity on the accuracy of emissivity measurementsLIU BAOMING; CHU ZAIXIANG; XU WENHUI et al.High Temperatures. High Pressures (Print). 1987, Vol 19, Num 3, pp 299-302, issn 0018-1544Article

Calibration of infrared spectral radiation and emissivity of gas-fired radiatorsCHU ZAIXIANG; LI BIJUAN; XU JIWAN et al.High Temperatures. High Pressures (Print). 1987, Vol 19, Num 3, pp 287-291, issn 0018-1544Article

Precise calculation of the effect of specular reflection in a hemispherical surface pyrometer on emissivity measurementSUN YUXING; CHU ZAIXIANG; CHEN SHOUREN et al.High Temperatures. High Pressures (Print). 1987, Vol 19, Num 3, pp 293-297, issn 0018-1544Article

Calculation of the radiant characteristics of a plane diffuse surface covered by a specular hemisphereBEDFORD, R. E; MA, C. K; CHU ZAIXIANG et al.Journal of physics. E. Scientific instruments. 1988, Vol 21, Num 8, pp 785-791, issn 0022-3735Article