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EFFICACITE FONCTIONNELLE DES CIRCUITS INTEGRES A GRANDE ECHELLE UTILISANT DES STRUCTURES NOMOGENESUSTYUZHANINOV VN.1974; IZVEST. VYSSH. UCHEBN. ZAVED., PRIBOROSTR.; S.S.S.R.; DA. 1974; VOL. 17; NO 12; PP. 48-52; BIBL. 6 REF.Article

ULTRA-PRECISION MACHINE AND DRIVE SYSTEMHASHIMOTO H.1982; BULL. JPN. SOC. PRECIS. ENG.; ISSN 0582-4206; JPN; DA. 1982; VOL. 16; NO 1; PP. 57-62; 7 P.; BIBL. 12 REF.Article

LSI AND COMMUNICATIONSREED P.1980; NEW ELECTRON.; ISSN 0047-9624; GBR; DA. 1980; VOL. 13; NO 22; PP. 42-50; 4 P.Article

"SUPERCOMPOSANTS" A BASE DE MEMOIRES A TRES GRAND DEGRE D'INTEGRATION-BASE ELEMENTAIRE D'AVENIR DES SYSTEMES NUMERIQUES DE LA 4EME GENERATIONALEKSENKO AG; LAPSHINSKIJ VA.1980; MIKROELEKTRONIKA; SUN; DA. 1980; VOL. 9; NO 1; PP. 3-14; BIBL. 11 REF.Article

LOGICAL ENVIRONMENT COMPARISON TESTING HANDLES COMPLEX LSI DEVICESBLUESTONE A.1979; COMPUTER DESIGN; USA; DA. 1979; VOL. 18; NO 4; PP. 95-102; BIBL. 2 REF.Article

LSI COMPONENT TESTING: PROBLEMS UND SOLUTIONSLENNE W.1979; NEW ELECTRON.; GBR; DA. 1979; VOL. 12; NO 1; PP. 26-31; (3 P.)Article

INTELLIGENT STRATEGY WITH DISTRIBUTED DATABASE FOR HIGH-VOLUME LSI TESTINGCHI CS.1978; I.E.E.E. TRANS. INSTRUMENT. MEASUR.; USA; DA. 1978; VOL. 27; NO 2; PP. 172-178; BIBL. 12 REF.Article

SOME ACHIEVEMENTS IN POWER IC TECHNOLOGY.1978; AUSTRAL. ELECTRON. ENGNG; AUS; DA. 1978; VOL. 11; NO 8; PP. 60-64; (4 P.)Article

ADVANCED MASK TECHNOLOGY FOR SMALL DEVICES IN LSI CIRCUITS.PIRCHER G.1976; IN: SOLID STATE DEVICES. EUR. RES. CONF. 5; GRENOBLE; 1975; PARIS; J. PHYS.; DA. 1976; PP. 31-72; ABS. FR.; BIBL. 1 P. 1/2Conference Paper

PRESENT AND FUTURE APPLICATIONS OF COMPLEX INTEGRATED CIRCUITS.ADCOCK WA.1975; ONDE ELECTR.; FR.; DA. 1975; VOL. 55; NO 4; PP. 209-213; ABS. FR.; BIBL. 6 REF.Article

LES CIRCUITS A LA DEMANDE. LES DIFFERENTES FORMES DE DIALOGUE ENTRE HOMMES DES SYSTEMES ET HOMMES DE COMPOSANTS.BRUNET M.1975; ONDE ELECTR.; FR.; DA. 1975; VOL. 55; NO 4; PP. 214-221; ABS. ANGLArticle

MICROPROCESSEURS: ETAT ACTUEL ET PERSPECTIVESSHAGURIN II; BUSHUEV MK.1975; MIKROELEKTRONIKA; S.S.S.R.; DA. 1975; VOL. 4; NO 6; PP. 486-496; BIBL. 37 REF.Article

A COMPUTER MODELING APPROACH FOR LSI DIGITAL STRUCTURES.RABBAT NB; RYAN WD; HOSSAIN SQAMA et al.1975; I.E.E.E. TRANS. ELECTRON DEVICES; U.S.A.; DA. 1975; VOL. 22; NO 8; PP. 523-531; BIBL. 14 REF.Article

SUR UNE APPROCHE DU CHOIX D'UNE BASE D'ELEMENTS POUR LES MINI-CALCULATEURSYAKOVLEV YU S; NOVIKOV BV.1974; AVTOMATYKA, U.R.S.R.; S.S.S.R.; DA. 1974; VOL. 19; NO 5; PP. 68-74; ABS. RUSSE ANGL.; BIBL. 8 REF.Article

IN SITU TESTABILITY DESIGN(ISTD) - A NEW APPROACH FOR TESTING HIGH-SPEED LSI/VLSI LOGICTSUI FF.1982; PROC. IEEE; ISSN 0018-9219; USA; DA. 1982; VOL. 70; NO 1; PP. 59-78; BIBL. 8 REF.Article

FORMALIZATION OF THE ALGORITHM DESIGN FOR A PATTERN MATCHING SYSTEMKONTOS J.1981; INT. J. ELECTRON. THEOR. EXP.; ISSN 0020-7217; GBR; DA. 1981; VOL. 50; NO 6; PP. 415-417; BIBL. 1 REF.Article

LSI-TEST-SCHON BEIM IC-DESIGN BERUECKSICHTIGT = LE CONTROLE DES CIRCUITS A HAUTE INTEGRATION ENVISAGE DES LA CONCEPTION DES CIRCUITS INTEGRESPAINKE H.1980; ELEKTRONIK (MUENCH.); ISSN 0013-5658; DEU; DA. 1980; VOL. 29; NO 26; PP. 69-74; BIBL. 3 REF.Article

NEEDED: A MIRACLE SLICE FOR VLSI FABRICATIONHEILMEIER GH.1979; I.E.E.E. SPECTRUM; USA; DA. 1979; VOL. 16; NO 3; PP. 45Article

COMPRENDRE LES MICROPROCESSEURS.QUEYSSAC D.1976; MESURES REGUL. AUTOMAT.; FR.; DA. 1976; VOL. 41; NO 9; PP. 29-35Article

GOLD DIFFUSION TRANSISTOR LOGIC: A NEW LSI GATE FAMILY.TAKAGAKI T; MUKOGAWA M.1975; IN: INT. ELECTRON DEVICES MEET.; WASHINGTON, D.C.; 1975; NEW YORK; INST. ELECTR. ELECTRON. ENG.; DA. 1975; PP. 559-562; BIBL. 2 REF.Conference Paper

FUNCTIONS FOR IMPROVING DIAGNOSTIC RESOLUTION IN AN LSI ENVIRONMENTMEHTA MA; MESSINGER HP; SMITH WB et al.1972; IN: AM. FED. INF. PROCESS. SOC. SPRING JT COMPUT. CONF. ATLANTIC CITY, N.J. 1972. PROC.; MONTVALE, N.J.; AFIPS PRESS; DA. 1972; PP. 1079-1091; BIBL. 7 REF.Conference Proceedings

DAS BLOCKSCHACHTELUNGSVERFAHREN, EINE STRATEGIE BEIM RECHNERGESTUETZTEN ENTWURF VON INTEGRIERTEN GROSSSCHALTUNGEN (LSI) = UNE METHODE DE PLACEMENT PAR BLOC, UNE STRATEGIE POUR LA CONCEPTION ASSISTEE PAR ORDINATEUR DES CIRCUITS INTEGRES A GRANDE ECHELLE (LSI)LAGEMANN K.1972; ELEKTRON. RECHENANLAGEN; DTSCH.; DA. 1972; VOL. 14; NO 5; PP. 202-205; ABS. ANGL.; BIBL. 18 REF.Serial Issue

NEW AIRBORNE WEATHER RADAR SYSTEMSLUCCHI GA.1982; J. AIRCR.; ISSN 0021-8669; USA; DA. 1982; VOL. 19; NO 3; PP. 239-245; BIBL. 2 REF.Article

IN-CIRCUIT TESTING OF LSI COMPONENTSHUGHES J; BARNETT B.1981; ELECTRON. PACKAG. PROD.; ISSN 0013-4945; USA; DA. 1981; VOL. 21; NO 2; PP. 79-88; 7 P.Article

GROWTH IN APPLICATION OF CHIP CARRIERSBAUER JA; KOLC RF.1980; ELECTRON. PACKAG. PRODUCT.; USA; DA. 1980; VOL. 20; NO 5; PP. 51-59; H.T. 4Article

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