Pascal and Francis Bibliographic Databases

Help

Search results

Your search

kw.\*:("COMPOSANT ELECTRONIQUE")

Document Type [dt]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Publication Year[py]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Discipline (document) [di]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Language

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Author Country

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Origin

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Results 1 to 25 of 3706

  • Page / 149
Export

Selection :

  • and

PRODUCIBILITY: THE CRITICAL ENGINEERING MANUFACTURING INTERFACE1972; WESCON TECH. PAPERS; U.S.A.; DA. 1972; VOL. 16; PP. (24 P.); BIBL. DISSEM.Serial Issue

THE BS 9000 SYSTEM FOR ELECTRONIC COMPONENTS OF ASSESSED QUALITYCLARKSTONE KH.1973; POST OFF. ELECTR. ENGRS J.; G.B.; DA. 1973; VOL. 65; NO 4; PP. 228-233; BIBL. 4 REF.Serial Issue

SYSTEMLOESUNG ZUM RATIONELLEN BESTUECKEN UND LOETEN VON ELEKTRONISCHEN BAUGRUPPEN = SYSTEMES RATIONNELS DE MONTAGE ET DE SOUDAGE DE COMPOSANTS ELECTRONIQUESMUTH D.1973; RADIO FERNECHEN ELEKTRON.; DTSCH.; DA. 1973; VOL. 22; NO 5; PP. 155-156Serial Issue

COMPUTER CONTROL OF DIFFUSION SYSTEMSROCKHILL RA; WERYCH ER.1973; SOLID STATE TECHNOL.; U.S.A.; DA. 1973; VOL. 16; NO 2; PP. 29-32Serial Issue

ZERSTOERUNGSFREIE PRUEFUNG VON LOETSTELLEN = CONTROLE NON DESTRUCTIF DES SOUDURESFAULSTICH K.1973; FEINGERAETETECHNIK; DTSCH.; DA. 1973; VOL. 22; NO 1; PP. 13-14; BIBL. 7 REF.Serial Issue

MICROWAVE TRANSISTORS1972; FUJITSU SCI. TECH. J.; JAP.; DA. 1972; VOL. 8; NO 3; PP. 153-175; BIBL. 16 REF.Serial Issue

PHOTODETECTOR ARRAY FOR A HOLOGRAPHIC OPTICAL MEMORY SYSTEM = RESEAU PHOTODETECTEUR POUR UN SYSTEME DE MEMOIRE OPTIQUE HOLOGRAPHIQUEYAMAOKA T; FUJIWARA T; NISHI H et al.1972; FUJITSU SCI. TECH. J.; JAP.; DA. 1972; VOL. 8; NO 3; PP. 137-151; BIBL. 5 REF.Serial Issue

APPAREIL PNEUMATIQUE POUR LE CONTROLE DE LA HAUTEUR DE PIECES QUI SE DETERIORENT FACILEMENTBOCHKOV VM; GREBEN YU I.1972; IZMERITEL. TEKH.; S.S.S.R.; DA. 1972; NO 10; PP. 90-91; BIBL. 1 REF.Serial Issue

SURVEY OF CURRENT COMPONENT RELIABILITY PROBLEMS AND METHODS FOR PREVENTIONHAMITER L; VILLELLA F.sdIN: COMPOSANTS ELECTRON. HAUTE FIABILITE. COLLOQ. INT. TOULOUSE, 1972; BAGNEUX; IMPR. SOPEDI; DA. S.D.; PP. 3-24Conference Proceedings

ASSURANCE DE LA QUALITEsdIN: COMPOSANTS ELECTRON. HAUTE FIABILITE. COLLOQ. INT. TOULOUSE, 1972; BAGNEUX; IMPR. SOPEDI; DA. S.D.; PP. 197-435; ABS. ANGL. FR.; BIBL. DISSEM.Conference Proceedings

L'INDUSTRIE DES COMPOSANTS ELECTRONIQUESBAUMONT G.1973; INDUSTR. ELECTR. ELECTRON.; FR.; DA. 1973; NO 4; PP. 5-14Serial Issue

ABOVE-AMBIENT TEMPERATURE CONTROL USING A THERMOELECTRIC HEAT PUMPGOLDSMID HJ.1983; SOLID-STATE ELECTRONICS; ISSN 0038-1101; GBR; DA. 1983; VOL. 26; NO 4; PP. 365-366; BIBL. 2 REF.Article

LA METALLISATION: PROTECTION ET DECORATION DES SURFACESFERRETTI M.1976; TRAITEMENTS DE SURFACE; FR.; DA. 1976; VOL. 17; NO 144; PP. 31-46 (14 P.)Article

A SELF-SCANNED SILICON DIODE ARRAY FOR ASTRONOMICAL PHOTOMETRY.DRAVINS D.1975; ASTROPHYS. SPACE SCI. LIBRARY; NETHERL.; DA. 1975; VOL. 54; PP. 97-102; BIBL. 6 REF.; (IMAGE PROCESS. TECH. ASTRON. PROC. CONF.; UTRECHT; 1975)Conference Paper

HOW RELIABILITY OF ELECTRONIC PARTS IS GUARANTEEDSHIOMI H.1972; JAP. ELECTRON. ENGNG; JAP.; DA. 1972; NO 73; PP. 54-59Serial Issue

THE TRANSISTOR-25 YEARS OLDSHUNAMAN F.1972; RADIO ELECTRON.; U.S.A.; DA. 1972; VOL. 43; NO 12; PP. 35-38Serial Issue

FIABILITE PHYSIQUE DES COMPOSANTSsdIN: COMPOSANTS ELECTRON. HAUTE FIABILITE. COLLOQ. INT. TOULOUSE, 1972; BAGNEUX; IMPR. SOPEDI; DA. S.D.; PP. 1-196; ABS. ANGL. FR.; BIBL. DISSEM.Conference Proceedings

TECHNIQUES DE CONSTRUCTION AVEC DU VERRE ET VITRO-CERAMIQUES DANS LES COMPOSANTS ELECTRONIQUES DE PRECISIONKAHL FO.1973; MICROTECNIC; SUISSE; DA. 1973; VOL. 27; NO 1; PP. 53-56Serial Issue

ELECTROPLATING ON LEAD FRAMES: AN ELECTRONICS APPLICATION = DEPOT ELECTROLYTIQUE SUR CHASSIS EN PLOMB: APPLICATION A L'ELECTRONIQUE1981; PLAT. SURF. FINISH.; ISSN 0360-3164; USA; DA. 1981; VOL. 68; NO 6; PP. 26Article

RELIABILITY BREEDS EXPANSION IN REEL-TO-REEL PLATING = FIABILITE DU DEPOT ELECTROLYTIQUE REEL-TO-REEL1981; PLAT. SURF. FINISH; ISSN 0360-3164; USA; DA. 1981; VOL. 68; NO 6; PP. 28-30Article

ELEKTRONISCHE BAUELEMENTE FUER DIE MESSTECHNIK: BETRACHTUNGEN IN ANSCHLUSS AN DIE ELECTRONICA 80 = COMPOSANTS ELECTRONIQUES POUR LES TECHNIQUES DE MESURE. REVUE DE ELECTRONICA 80POHL V.1981; TM, TECH. MESS.; ISSN 0171-8096; DEU; DA. 1981; VOL. 48; NO 2; PP. 59-65; ABS. ENGArticle

ELECTRONICS RELIABILITY: A STATE-OF-THE-ART SURVEYBLANKS HS.1980; MICROELECTRON. AND RELIABIL.; GBR; DA. 1980; VOL. 20; NO 3; PP. 219-245; BIBL. 100 REF.Article

THERMAL TRANSIENTS IN ELECTRONIC PACKAGESBULLER ML.1980; I.E.E.E. TRANS. COMPON. HYBR. MANUGF. TECHNOL.; USA; DA. 1980; VOL. 3; NO 4; PP. 588-594; BIBL. 8 REF.Article

NOTWENDIGE UND ERREICHBARE PROZESSZUVERLAESSIGKEIT IN DER MIKROELEKTRONIK-MONTAGE = FIABILITE NECESSAIRE ET POUVANT ETRE OBTENUE DANS LES MONTAGES DE MICROELECTRONIQUEBARTSCH P.1980; FEINGERAETETECHNIK; ISSN 0014-9683; DDR; DA. 1980; VOL. 29; NO 1; PP. 3-7; ABS. RUS/ENG/FRE; BIBL. 11 REF.Article

EFFECT OF MODERN ELECTRONICS ON CORROSION TECHNOLOGY = EFFET DE L'ELECTRONIQUE MODERNE SUR LA TECHNOLOGIE DE LA CORROSIONBABOIAN R; MCBRIDE L; LANGLAIS R et al.1979; MATER. PERFORM.; ISSN 0094-1492; USA; DA. 1979; VOL. 18; NO 12; PP. 40-44; BIBL. 24 REF.Article

  • Page / 149