³⁰SIO IN THE INTERSTELLAR MEDIUM.CLARK FO; LOVAS FJ.1977; ASTROPHYS. J.; U.S.A.; DA. 1977; VOL. 217; NO 1 PART. 2; PP. L47-L48; BIBL. 10 REF.Article

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SURFACE ANALYSIS BY SECONDARY ION MASS SPECTROSCOPY TECHNIQUES.DOBROTT RD.1976; NATION. BUR. STAND., SPEC. PUBL.; U.S.A.; DA. 1976; NO 400-23; PP. 31-43; BIBL. 4 REF.Article

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SPECTROSCOPIC INVESTIGATIONS OF GROUP IV-A FLUORIDES AS CHEMICAL LASER CANDIDATESBRADBURN GR; ARMSTRONG RA; DAVIS SJ et al.1980; OPT. ENGNG; USA; DA. 1980; VOL. 19; NO 1; PP. 66-70; BIBL. 16 REF.Article

PHOTORESIST ADHESION FAILURE ON SIO₂ FILMS.1978; CIRCUITS MANUF.; USA; DA. 1978-06; PP. 22-28; (4 P.); BIBL. 4 REF.Article

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A TWO-PARAMETER DISTRIBUTION ANALYSIS OF MOESSBAUER SPECTRA IN NON-CRYSTALLINE SOLIDS USING GENERAL INVERSION METHODLEVITZ P; BONNIN D; GALAS G et al.1980; J. PHYS. E; ISSN 0022-3735; GBR; DA. 1980; VOL. 13; NO 4; PP. 427-432; BIBL. 13 REF.Article

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