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CONTACTLESS MEASUREMENTS OF CONDUCTIVITY OF METALS AND SEMICONDUCTORS AND OF PLATING THICKNESS OF SHEET CONDUCTORS.OLSZEWSKI EJ; CORMACK GD.1976; I.E.E.E. TRANS. INSTRUMENT. MEASUR.; U.S.A.; DA. 1976; VOL. 25; NO 3; PP. 186-190; BIBL. 5 REF.Article

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