au.\*:("COSTATO, M")
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GROWTH RATE AND PHASE FORMATION IN THE NICKEL-SILICON COUPLECOSTATO M.1981; LETT. NUOVO CIMENTO; ISSN 0024-1318; ITA; DA. 1981; VOL. 32; NO 7; PP. 219-224Article
ELECTRON ENERGY RELAXATION TIME IN SI AND GECOSTATO M; FONTANESI S; REGGIANI L et al.1973; J. PHYS. CHEM. SOLIDS; G.B.; DA. 1973; VOL. 34; NO 3; PP. 547-564; BIBL. 92 REF.Serial Issue
RELAXATION TIME OF PHONONS IN NONOHMIC CONDUCTION IN SEMICONDUCTORSCOSTATO M; GAGLIANI G; REGGIANI L et al.1972; ATTI SEMINAR. MAT. FIS. UNIV. MODENA; ITAL.; DA. 1972; VOL. 21; NO 1; PP. 87-112; BIBL. 3 P. 1/2Serial Issue
GOLD-ALUMINUM THIN-FILM INTERACTIONS AND COMPOUND FORMATION = INTERACTION DE COUCHES MINCES AU-AL ET FORMATION DE COMPOSESMAJNI G; NOBILI C; OTTAVIANI G et al.1981; J. APPL. PHYS.; ISSN 0021-8979; USA; DA. 1981; VOL. 52; NO 6; PP. 4047-4054; BIBL. 28 REF.Article
Thin film compounds in planar Pt-Si reactionMAJNI, G; COSTATO, M; PANINI, F et al.The Journal of physics and chemistry of solids. 1985, Vol 46, Num 5, pp 631-641, issn 0022-3697Article
Formation of the X-ray line emission spectrum of excimer laser-produced plasmasMAGUNOV, A; FAENOV, A; KOENIG, M et al.Laser and particle beams (Print). 1998, Vol 16, Num 1, pp 61-70, issn 0263-0346Conference Paper
Substrate effect on texturized microstructures in Ni-Cr thin filmsMENGUCCI, P; COSTATO, M; MAJNI, G et al.Thin solid films. 1992, Vol 209, Num 1, pp 67-72, issn 0040-6090Article
NMR and pressure correlated analysis of metabolic changes in soft-X-rays irradiated yeast cellsMILANI, M; CONTE, A; COSTATO, M et al.The European physical journal. D, Atomic, molecular and optical physics (Print). 1999, Vol 5, Num 2, pp 267-270, issn 1434-6060Article
Cell probing by delayed luminescenceMUSUMECI, F; BALLERINI, M; BARONI, G et al.SPIE proceedings series. 1999, pp 36-45, isbn 0-8194-3072-2Conference Paper
Titanium silicide formation in presence of oxygenNOBILI, C; NAVA, F; OTTAVIANI, G et al.Active and passive electronic components. 1992, Vol 15, Num 1, pp 9-26, issn 0882-7516Article