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Results 1 to 25 of 197744

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THERMAL-RADIATION PROPERTIES OF THIN METALLIC FILMS ON DIELECTRICSFORSBERG CH; DOMOTO GA.1972; IN: ANN. SOC. MECH. ENG. WINTER ANNU. MEET.; NEW YORK, N.Y., 1972; S.L.; A.S.M.E.; DA. 1972; VOL. HT-7; PP. 1-6; BIBL. 21 REF.Conference Paper

DIE DUENNFILM-HYBRIDSCHALTUNG HAT CHANCENDELFS H.1972; ELEKTRONIK; DTSCH.; DA. 1972; VOL. 21; NO 10; PP. 335-338; BIBL. 7 REF.Serial Issue

SENSITIVE PLATINUM FILM RESISTANCE THERMOMETERS FOR HEAT TRANSFER MEASUREMENTEVANS NA.1972; IN: ADV. INSTRUM. PROC. 27TH ANNU. INSTRUM. SOC. AMERICA CONF.; NEW YORK; 1972; PITTSBURGH, PA; INSTRUM. SOC. AMERICA; DA. 1972; VOL. 2; PP. (8 P.); BIBL. 2 REF.Conference Proceedings

REVETEMENTS ANTIREFLECHISSANTS DANS LE VIDE POUSSEDUTU D; GEORGESCU C; MEDIANU R et al.1972; STUD. CERC. FIZ.; ROMAN.; DA. 1972; VOL. 24; NO 10; PP. 1277-1284; ABS. ANGL.; BIBL. 6 REF.Serial Issue

CHOICE OF CRITERIA FOR ELLIPSOMETRIC DETERMINATIONS ON THIN FILMSCAMAGNI P; MANARA A.1972; THIN SOLID FILMS; NETHERL.; DA. 1972; VOL. 13; NO 2; PP. 341-350; BIBL. 14 REF.Serial Issue

PROPRIETES OPTIQUES DE QUELQUES REVETEMENTS ABSORBANTS DANS LE DOMAINE SPECTRAL IRBURKIN AL; NOVIKOV AF.1972; ZH. PRIKL. SPEKTROSK., BELORUS. S.S.R.; S.S.S.R.; DA. 1972; VOL. 17; NO 4; PP. 655-660; BIBL. 6 REF.Serial Issue

GHOST IMAGERY INTENSITY AND DURABILITY OF SELECTED ANTI-REFLECTANT COATINGSPROVINES WF; TARGOVE BD; KISLIN B et al.1973; AMER. J. OPTOM. ARCH. AMER. ACAD. OPTOM.; U.S.A.; DA. 1973; VOL. 50; NO 1; PP. 34-39; BIBL. 6 REF.Serial Issue

CARACTERISTIQUES OPTIQUES DES COUCHES MULTIPLES REFLECHISSANTES A DISPERSION ELEVEE DU DEPHASAGESHKLYAREVSKIJ IN; UMEROV RI; LUPASHKO EA et al.1972; ZH. PRIKL. SPEKTROSK., BELORUS. S.S.R.; S.S.S.R.; DA. 1972; VOL. 17; NO 4; PP. 682-686; BIBL. 10 REF.Serial Issue

DETERMINATION OF THE RELATIVE NITROGEN DOPING LEVEL OF TANTALUM NITRIDE RESISTOR FILM BY MEANS OF THE SEEBECK EFFECTTRUDEL ML.1972; I.E.E.E. TRANS. PARTS HYBR. PACKAG.; U.S.A.; DA. 1972; VOL. 8; NO 3; PP. 16-21; BIBL. 4 REF.Serial Issue

THIN FILMS1972; IN: 1972 INTER. MICROELECTRON. SYMP.; WASHINGTON, D.C.; 1972; PARK RIDGE; INTER. SOC. HYBRID MICROELECTRON.; DA. 1972; PP. (17 P.); BIBL. DISSEM.Conference Paper

ETUDE DES COUCHES MINCES DE TANTALE DEPOSEES PAR PROJECTION CATHODIQUE EN VUE DE DEFINIR LES PARAMETRES PHYSICO-CHIMIQUES PERMETTANT D'OBTENIR DES STRUCTURES BCC, QUADRATIQUE ET POREUSEMOULIN M.1970; DGRST-7072282; FR.; DA. 1970; PP. (40 P.); BIBL. DISSEM.; (RAPP. FINAL, ACTION CONCERTEE: COMPOSANTS CIRCUITS MICROMINIATURISES). 2 FASCReport

STATE OF THE ART OF THIN FILM COMPONENTS.HEYWANG H; SCHAUER A.1975; ELELECTROCOMPON. SCI. TECHNOL.; G.B.; DA. 1975; VOL. 2; NO 1; PP. 61-66Article

ETUDE DE LA MICROANALYSE QUANTITATIVE PAR EMISSION IONIQUE SECONDAIRE. APPLICATIONS A LA CARACTERISATION DES COUCHES MINCES EPITAXIEES OU DIFFUSEES EN MICROELECTRONIQUEHUBER A; CROSET M; GROUILLET A et al.1972; DGRST-7270015; FR.; DA. 1972; PP. 1-24; H.T. 30; BIBL. 1 P. 1/2; (RAPP. FINAL, ACTION CONCERTEE: C.C.M.)Report

APPLICATIONS OF THIN FILMS IN MICROELECTRONICS = APPLICATIONS DES COUCHES MINCES EN MICROELECTRONIQUEANDERSON JC.1972; THIN SOLID FILMS; NETHERL.; DA. 1972; VOL. 12; NO 1; PP. 1-16; BIBL. 15 REF.Serial Issue

INFRARED PHOTOCONDUCTIVE LAYER PREPARED FROM PBO AND S FOR ELECTRON MIRROR IMAGE TUBES.ANDO T.1974; JAP. J. APPL. PHYS.; JAP.; DA. 1974; VOL. 13; NO 8; PP. 1301-1302; BIBL. 2 REF.Article

ZUR WEITERENTWICKLUNG DER THERMISCHEN ELEKTRONENSTRAHL-BEARBEITUNG DUENNER SCHICHTEN = SUR LES DEVELOPPEMENTS DE LA METHODE DU TRAITEMENT THERMIQUE DE COUCHES MINCES PAR UN FAISCEAU ELECTRONIQUESCHILLER S; HEISIG U; PANZER S et al.1972; NACHR.-TECH.; DTSCH.; DA. 1972; VOL. 22; NO 11; PP. 398-401Serial Issue

DEPLACEMENT ET RUPTURE D'UN FILM DE LIQUIDEUSPENSKIJ VA; KISELEV VM.1972; ZH. PRIKL. KHIM.; S.S.S.R.; DA. 1972; VOL. 45; NO 9; PP. 1996-2000; BIBL. 12 REF.Serial Issue

REVETEMENTS INTERFERENTIELS SPECULAIRES METALLODIELECTRIQUES A SOLIDITE MECANIQUE ACCRUEFURMAN SH A; VVEDENSKIJ VD.1977; OPT.-MEKH. PROMYSHL.; S.S.S.R.; DA. 1977; VOL. 44; NO 5; PP. 41-43; BIBL. 6 REF.Article

MEASURING THE REFRACTIVE INDEX AND THICKNESS OF THIN TRANSPARENT FILMS: METHOD.DANEU V; SANCHEZ A.1974; APPL. OPT.; U.S.A.; DA. 1974; VOL. 13; NO 1; PP. 122-128; BIBL. 8 REF.Article

REFLECTANCE OF VACUUM DEPOSITED MAGNESIUMHACMAN D; HEITMANN W.1973; APPL. OPT.; U.S.A.; DA. 1973; VOL. 12; NO 4; PP. 895; BIBL. 14 REF.Serial Issue

APPLICATION DES COUCHES MINCES EN COIN A L'INTERFEROMETRIEDUPOISOT H; MORIZET J; LOSTIS P et al.1973; OPT. ACTA; G.B.; DA. 1973; VOL. 20; NO 4; PP. 317-323; ABS. ANGL. ALLEM.; BIBL. 6 REF.Serial Issue

EVALUATION OF OPTICAL CONSTANTS OF THIN ABSORBING FILMS FROM ELLIPSOMETRIC PARAMETERSVAMDATT AR; NARAYANA RAO S; NAIK YG et al.1972; INDIAN J. PURE APPL.; INDIA; DA. 1972; VOL. 10; NO 9; PP. 683-685; BIBL. 8 REF.Serial Issue

RAPID NONDESTRUCTIVE METHOD FOR MEASURING THE REFRACTIVE INDEX AND THICKNESS OF THIN DIELECTRIC FILMSRAIF J; BEN YOSEF N; ORON M et al.1973; J. PHYS. E; G.B.; DA. 1973; VOL. 6; NO 1; PP. 48-50; BIBL. 10 REF.Serial Issue

THE DETERMINATION OF THIN LAYER THICKNESSES WITH AN ELECTRON MICROPROBEBUTZ R; WAGNER H.1973; SURF. SCI.; NETHERL.; DA. 1973; VOL. 34; NO 3; PP. 693-704; BIBL. 10 REF.Serial Issue

A SIMPLE AND HIGHLY STABLE PHOTOELECTRIC APPARATUS FOR MONITORING THE THICKNESS OF OPTICAL FILMSKIRCHNER H.1973; J. PHYS. E; G.B.; DA. 1973; VOL. 6; NO 5; PP. 430-431; BIBL. 3 REF.Serial Issue

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