au.\*:("CRISMAN EE")
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MEASUREMENT OF MINORITY-CARRIER LIFETIME IN GAAS USING THE TRANSIENT RESPONSE OF MOS CAPACITORSVITALE G; CRISMAN EE; LOFERSKI JJ et al.1979; APPL. PHYS. LETTERS; USA; DA. 1979; VOL. 34; NO 1; PP. 106-108; BIBL. 8 REF.Article
CHARACTERISTICS OF CHALCOCITE (CU2S) FILMS PRODUCED BY DIFFERENT METHODS AND SOME PROPERTIES OF SOLAR CELLS MADE FROM SUCH FILMS.LOFERSKI JJ; SHEWCHUN J; DEMEO EA et al.1976; IN: PHOTOVOLTAIC SPEC. CONF. 12; BATON ROUGE, LA.; 1976; NEW YORK; INST. ELECTR. ELECTRON. ENG.; DA. 1976; PP. 496-501; BIBL. 5 REF.Conference Paper
COMPARISON OF SOME PROPERTIES OF CU2S-CDS PHOTOVOLTAIC CELLS IN WHICH DIFFERENT METHODS ARE USED TO PREPARE THE (CU2S) LAYER.LOFERSKI JJ; SHEWCHUN J; DEMEO EA et al.1976; IN: ELECTR. SOL. COLLOQ. INT.; TOULOUSE; 1976; TOULOUSE; CENT. NATL. ETUD. SPAT.; DA. 1976; PP. 317-324; ABS. FR.; BIBL. 5 REF.Conference Paper