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A NEW COMBINATORIAL APPROACH TO M24.CURTIS RT.1975; MATH. PROC. CAMBRIDGE PHILOS. SOC.; G.B.; DA. 1975; VOL. 79; NO 1; PP. 25-42; BIBL. 3 REF.Article

QUALITY AND RELIABILITY ASSURANCE SYSTEMS IN IBM SEMICONDUCTOR MANUFACTURINGMELAN EH; CURTIS RT; HO JK et al.1982; IBM JOURNAL OF RESEARCH AND DEVELOPMENT; ISSN 0018-8646; USA; DA. 1982; VOL. 26; NO 5; PP. 613-624; BIBL. 12 REF.Article

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