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On the Extraction of Double-Layer Capacitances for Nonideal Capacitive BehaviorsÖZCAN, Muzaffer; DEHRI, Ilyas; ERBIL, Mehmet et al.Industrial & engineering chemistry research. 2012, Vol 51, Num 43, pp 14061-14064, issn 0888-5885, 4 p.Article

Impregnation thermodynamics of barrier-layer capacitorsSUNDARAM, S. K.Thermochimica acta. 1988, Vol 131, pp 247-255, issn 0040-6031Article

Electrical Capacitance Tomography : A PerspectiveMARASHDEH, Q; FAN, L.-S; DU, B et al.Industrial & engineering chemistry research. 2008, Vol 47, Num 10, pp 3708-3719, issn 0888-5885, 12 p.Article

An efficient stacked-Blumlein HV pulse generatorSOMERVILLE, I. C; MACGREGOR, S. J; FARISH, O et al.Measurement science & technology (Print). 1990, Vol 1, Num 9, pp 865-868, issn 0957-0233Article

Le problème de la capacité accordéeDAMGOV, V. N; DUBOSHINSKIJ, YA. B; CHEKAR'KOV, D. M et al.Žurnal tehničeskoj fiziki. 1985, Vol 55, Num 6, pp 1048-1052, issn 0044-4642Article

Calculation of the leading corrections to the capacitor capacitance between two conductors separated by a small gapSEMAKHIN, A. N; SHNEERSON, G. A.Soviet physics. Technical physics. 1990, Vol 35, Num 10, pp 1115-1119, issn 0038-5662Article

Capacitance measurement applied to a pneumatic conveyor with very low solids loadingBECK, M. S; GREEN, R. G; PLASKOWSKI, A. B et al.Measurement science & technology (Print). 1990, Vol 1, Num 7, pp 561-564, issn 0957-0233Article

A novel digital capacitance meterTAHA, S. M. R.International journal of electronics. 1989, Vol 66, Num 2, pp 317-320, issn 0020-7217, 4 p.Article

Modeling of plasma-induced self-healing in organic dielectricsKAMMERMAIER, J; RITTMAYER, G; BIRKLE, S et al.Journal of applied physics. 1989, Vol 66, Num 4, pp 1594-1609, issn 0021-8979, 16 p.Article

The evolution of high permittivity multilayer capacitorsHERBERT, J. M.Ferroelectrics (Print). 1988, Vol 87, pp 347-351, issn 0015-0193Article

New Calibration Methods for Accurate Electrical Capacitance Tomography Measurements in Particulate-Fluid SystemsHADI, Bashar; BERRUTI, Franco; BRIENS, Cedric et al.Industrial & engineering chemistry research. 2009, Vol 48, Num 1, pp 274-280, issn 0888-5885, 7 p.Article

Lifetime of thin oxide and oxide-nitride-oxide dielectrics within trench capacitors for DRAM'sHIERGEIST, P; SPITZER, A; RÖHL, S et al.I.E.E.E. transactions on electron devices. 1989, Vol 36, Num 5, pp 913-919, issn 0018-9383, 7 p.Article

Theory of the junction capacitance of an abrupt diodeVAN MIEGHEM, P; MERTENS, R. P; VAN OVERSTRAETEN, R. J et al.Journal of applied physics. 1990, Vol 67, Num 9, pp 4203-4211, issn 0021-8979, 1Article

Capacitance sensing drop counterKIRKBY, D. R; HILLSON, P. J; MOSSE, C. A et al.Journal of biomedical engineering. 1989, Vol 11, Num 2, pp 166-169, issn 0141-5425, 4 p.Article

A new transmission line of round conductor and parallel plane with symmetrically placed slitWEIGAN LIN.IEEE transactions on microwave theory and techniques. 1985, Vol 33, Num 8, pp 739-740, issn 0018-9480Article

Cyclic Operation Strategies in Trickle Beds and Electrical Capacitance Tomography Imaging of Filtration DynamicsHAMIDIPOUR, Mohsen; LARACHI, Faïçal; RING, Zbigniew et al.Industrial & engineering chemistry research. 2010, Vol 49, Num 3, pp 934-952, issn 0888-5885, 19 p.Conference Paper

Monitoring Filtration in Trickle Beds Using Electrical Capacitance TomographyHAMIDIPOUR, Mohsen; LARACHI, Faïcal; RING, Zbigniew et al.Industrial & engineering chemistry research. 2009, Vol 48, Num 3, pp 1140-1153, issn 0888-5885, 14 p.Conference Paper

Capacitance immunosensors based on an array biotapeCHANG MING LI; LI KUN PAN; LUONG, John H. T et al.Analyst (London. 1877. Print). 2006, Vol 131, Num 7, pp 788-790, issn 0003-2654, 3 p.Article

Comments on small capacitorsSPILLER, T. P; CLARK, T. D; PRANCE, R. J et al.Il Nuovo cimento. B. 1992, Vol 107, Num 6, pp 725-731, issn 0369-3554Article

Analytical base-collector heterojunction capacitance model including collector current effectsLIOU, J. J.Journal of applied physics. 1989, Vol 66, Num 1, pp 286-291, issn 0021-8979, 6 p.Article

Comments on capacitance between perpendicular conducting planes separated by a gap. ReplyDIAZ, R. E; DAS, B. N.IEEE transactions on electromagnetic compatibility. 1986, Vol 28, Num 4, pp 280-282, issn 0018-9375Article

Capacitance of electrochemical double layer capacitorsLEWANDOWSKI, Andrzej; JAKOBCZYK, Pawel; GALINSKI, Maciej et al.Electrochimica acta. 2012, Vol 86, pp 225-231, issn 0013-4686, 7 p.Conference Paper

Technical note: Concerning the conversion of the constant phase element parameter Y0 into a capacitanceHSU, C. H; MANSFELD, F.Corrosion (Houston, Tex.). 2001, Vol 57, Num 9, pp 747-748, issn 0010-9312Article

Calcul de la capacité électrique entre une plaquette et deux plans parallèleSTRUNSKIJ, M. G; GORBOV, M. M.Èlektričestvo. 1987, Num 7, pp 59-62, issn 0013-5380Article

Effect of radiation induced defects on the capacitance of silicon detectorsDARVAS, R; MUDRIK, M; SEIDMAN, A et al.Journal of applied physics. 1992, Vol 71, Num 3, pp 1517-1521, issn 0021-8979Article

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