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Laser and optical measurement techniques for characterization of microelectronic componentsDRZIK, Milan.SPIE proceedings series. 2005, pp 59450L.1-59450L.11, isbn 0-8194-5951-8, 1VolConference Paper

Investigation of the precision in X-ray diffraction analysis of VCSEL structuresKIDD, P.Journal of materials science. Materials in electronics. 2003, Vol 14, Num 9, pp 541-550, issn 0957-4522, 10 p.Conference Paper