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Mimir : A Near-Infrared Wide-Field Imager, Spectrometer, and PolarimeterCLEMENS, D. P; SARCIA, D; GRABAU, A et al.Publications of the Astronomical Society of the Pacific. 2007, Vol 119, Num 862, pp 1385-1402, issn 0004-6280, 18 p.Article

Subwavelength optical microscopy and spectroscopy using near-field opticsPENG ZHANG; KOPELMAN, R; WEIHONG TAN et al.Critical reviews in solid state and materials sciences. 2000, Vol 25, Num 2, pp 87-162, issn 1040-8436Article

Micromachined SPM probes with sub-100 nm features at tip apexSCHÜRMANN, G; INDERMÜHLE, P. F; STAUFER, U et al.Surface and interface analysis. 1999, Vol 27, Num 5-6, pp 299-301, issn 0142-2421Conference Paper

Nano-manipulation of confined electromagnetic fields with a near-field probeCLUZEL, Benoit; LALOUAT, Loïc; VELHA, Philippe et al.Comptes rendus. Physique. 2008, Vol 9, Num 1, pp 24-30, issn 1631-0705, 7 p.Conference Paper

Subwavelength spectroscopy, exciton supertips and mesoscopic light-matter interactionsKOPELMAN, R; WEIHONG TAN; BIRNBAUM, D et al.Journal of luminescence. 1994, Vol 58, Num 1-6, pp 380-387, issn 0022-2313Conference Paper

Synthesis of DF array calibration manifolds from near-field measurementsSTRUCKMAN, K. A.IEEE antennas and propagation society international symposiumNational radio science meeting. 2004, pp 711-714, isbn 0-7803-8302-8, 4Vol, 4 p.Conference Paper

Experimental evaluation of the spherical near field test rangeAUDONE, B; DE LOGU, A.IEEE transactions on antennas and propagation. 1984, Vol 32, Num 7, pp 751-754, issn 0018-926XArticle

Mapping of X-ray induced luminescence using a SNOM probeJANDARD, F; FAUQUET, C; DEHLINGER, M et al.Applied surface science. 2013, Vol 267, pp 81-85, issn 0169-4332, 5 p.Article

Microscopie à sonde locale = Local probe microscopySALVAN, Frank; THIBAUDAU, Franck.Techniques de l'ingénieur. Analyse et caractérisation. 1999, Vol P1, Num P895, pp P895.1-P895.18, issn 1762-8717Article

Near-field optics : physics, devices, and information processing (Denver Co, 22-23 July 1999)Jutamulia, Suganda; Ohtsu, Motoichi; Asakura, Toshimitsu et al.SPIE proceedings series. 1999, isbn 0-8194-3277-6, VII, 198 p, isbn 0-8194-3277-6Conference Proceedings

Sub-micron spatial resolution Raman spectroscopy and its application to stress mapping in siliconWEBSTER, S; SMITH, D. A; BATCHELDER, D. N et al.Synthetic metals. 1999, Vol 102, Num 1-3, pp 1425-1427, issn 0379-6779Conference Paper

Near-field, far-field and imaging properties of the 2D aperture SNOMNOVOTNY, L; POHL, D. W; REGLI, P et al.Ultramicroscopy. 1995, Vol 57, Num 2-3, pp 180-188, issn 0304-3991Conference Paper

Optical contrast in near-field techniquesMOERS, M. H. P; VAN HULST, N. F; RUITER, A. G. T et al.Ultramicroscopy. 1995, Vol 57, Num 2-3, pp 298-302, issn 0304-3991Conference Paper

Theoretical investigations of a coaxial probe concept for scanning near-field optical microscopyRUDOW, O; VOLLKOPF, A; MÜLLER-WIEGAND, M et al.Optics communications. 2001, Vol 189, Num 4-6, pp 187-192, issn 0030-4018Article

Near-field microscopy moves into the mainstreamCOLLINS, G. J.Laser focus world. 1995, Vol 31, Num 11, pp 104-107, issn 1043-8092Article

International conference on near-field opticsISAACSON, M.Ultramicroscopy. 1995, Vol 57, Num 2-3, issn 0304-3991, 216 p.Conference Proceedings

Kinetics, morphology and pulling regimes for sensing tips in near-field microscopyYAKOBSON, B. I; PAESLER, M. A.Ultramicroscopy. 1995, Vol 57, Num 2-3, pp 241-245, issn 0304-3991Conference Paper

Near field optical microscopy using a metallic vibrating tipGLEYZES, P; BOCCARA, A. C; BACHELOT, R et al.Ultramicroscopy. 1995, Vol 57, Num 2-3, pp 318-322, issn 0304-3991Conference Paper

Propagación de ondas sismicas en el campo cercano = Propagation des ondes sismiques dans le champ procheMADARIAGA, R.1989, Vol 1, pp 51-73, issn 0214-4557Article

Scanning near-field optical microscopyHEINZELMANN, H; POHL, D. W.Applied physics. A, Solids and surfaces. 1994, Vol 59, Num 2, pp 89-101, issn 0721-7250Article

Reciprocity in scanning near-field optical microscopy : illumination and collection modes of transmission measurementsIMURA, Kohei; OKAMOTO, Hiromi.Optics letters. 2006, Vol 31, Num 10, pp 1474-1476, issn 0146-9592, 3 p.Article

Influence of apex shape and spherical inclusions on emitted optical near field of apertureless microfabricated SNOM probesNAKAGAWA, W; VACCARO, L; HERZIE, H. P et al.Lasers and Electro-optics Society. 2004, isbn 0-7803-8557-8, 2Vol, Vol2, 503-504Conference Paper

Comparison of different modes of reflection in near-field optical imagingCLINE, J. A; ISAACSON, M.Ultramicroscopy. 1995, Vol 57, Num 2-3, pp 147-152, issn 0304-3991Conference Paper

Near-field optical microscopes break the diffraction limitMOYER, P; SLAMBROUCK, T. V.Laser focus world. 1993, Vol 29, Num 10, pp 105-109, issn 1043-8092Article

STARS: SCANNING PROBE MICROSCOPYMODY, Cyrus C. M.Proceedings of the IEEE. 2014, Vol 102, Num 7, pp 1107-1112, issn 0018-9219, 6 p.Article

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