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Propriétés des pannes du type «court-circuit» dans les circuits combinatoiresSAPOZHNIKOV, V. V; SAPOZHNIKOV, V. V; SAPOZHNIKOV, V. V; SAPOZHNIKOV, V. V; CHUKHONIN, V. M et al.Avtomatika i telemehanika. 1984, Num 3, pp 142-150, issn 0005-2310Article

Fault tolerant circuit using alternate-data retry strategyHASEGAWA, Y; NAITO, S.Systems, computers, controls. 1983, Vol 14, Num 1, pp 86-94, issn 0096-8765Article

Testability measures in pseudorandom testingERCOLANI, S; FAVALLI, M; DAMIANI, M et al.IEEE transactions on computer-aided design of integrated circuits and systems. 1992, Vol 11, Num 6, pp 794-800, issn 0278-0070Article

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A simple random test procedure for detection of single intermittent fault in combinational circuitsVIRUPAKSHIA, A. R; PRATAPA REDDY, V. C. V.IEEE transactions on computers. 1983, Vol 32, Num 6, pp 594-597, issn 0018-9340Article

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An efficient algorithm for single and multiple fault test sets generationSAILENDRANATH BANERJEE; RANAJITKISHORE THAKUR; PRAMODE RANJAN BHATTACHARJEE et al.International journal of computer mathematics. 1985, Vol 18, Num 2, pp 121-133, issn 0020-7160Article

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Universal tests for detection of input/output stuck-at and bridging faultsKARPOVSKY, M.IEEE transactions on computers. 1983, Vol 32, Num 12, pp 1194-1198, issn 0018-9340Article

Synthèse des tests de contrôle des circuits combinatoires arborescentsAJRAPETYAN, A. N.Izvestiâ Akademii nauk SSSR. Tehničeskaâ kibernetika. 1983, Num 5, pp 77-84, issn 0002-3388Article

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Multiple fault detection in fanout-free combinational networksHARTMANN, C. R. P; DEBANY, W. H; VARSHNEY, P. K et al.Electronics Letters. 1984, Vol 20, Num 12, pp 516-517, issn 0013-5194Article

Test pattern generation using boolean statisfiabilityLARRABEE, T.IEEE transactions on computer-aided design of integrated circuits and systems. 1992, Vol 11, Num 1, pp 4-15, issn 0278-0070Article

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CMOS struck-open fault testabilityRAJSUMAN, R; MALAIYA, Y. K; JAYASUMANA, A. P et al.IEEE journal of solid-state circuits. 1989, Vol 24, Num 1, pp 193-194, issn 0018-9200, 2 p.Article