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Results 1 to 25 of 395

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High G MEMS integrated accelerometerDAVIES, B. R; BARRON, C. C; MONTAGUE, S et al.SPIE proceedings series. 1997, pp 52-62, isbn 0-8194-2459-5Conference Paper

A framework to evaluate technology and device design enhancements for MOS integrated circuitsSODINI, C. G; WONG, S. S; KO, P.-K et al.IEEE journal of solid-state circuits. 1989, Vol 24, Num 1, pp 118-127, issn 0018-9200, 10 p.Article

Physical faults in MOS circuits and their coverage by different fault modelsBURGESS, N; DAMPER, R. I; TOTTON, K. A et al.IEE proceedings. Part E. Computers and digital techniques. 1988, Vol 135, Num 1, pp 1-9, issn 0143-7062Article

Direct observation and elimination of defects in gate oxide for reliable moslsisITSUMI, M.SPIE proceedings series. 1997, pp 147-159, isbn 0-8194-2765-9Conference Paper

An improved model for the slewing behavior of opampsFENG WANG; RAMESH HARJANI.IEEE transactions on circuits and systems. 2, Analog and digital signal processing. 1995, Vol 42, Num 10, pp 679-681, issn 1057-7130Article

Efficient simulation of MOS circuitsERWE, R; TANABE, N.IEEE transactions on computer-aided design of integrated circuits and systems. 1991, Vol 10, Num 4, pp 541-544, issn 0278-0070Article

Chemosensors with pattern recognitionMULLER, R; HORNER, G.Siemens Forschungs- und Entwicklungsberichte. 1986, Vol 15, Num 3, pp 95-100, issn 0370-9736Article

Massively parallel switch-level simulation : a feasibility studyKRAVITZ, S. A; BRYANT, R. E; RUTENBAR, R. A et al.IEEE transactions on computer-aided design of integrated circuits and systems. 1991, Vol 10, Num 7, pp 871-894, issn 0278-0070Article

Testing for stuck-at-faults in CMOS circuitsISMAEEL, A. A; NAJEM, Z.International journal of electronics. 1987, Vol 63, Num 5, pp 677-685, issn 0020-7217Article

The deskside supercomputerPEEPLES, J. W.Advances in cryogenic engineering. 1998, Vol 43, pp 849-855, issn 0065-2482, AConference Paper

Corrugation gratings for fast integrated complementary metal-oxide semiconductor photodetectors : implementation and diffraction anaysesCLYMER, B. D; GILLFILLAN, D.Applied optics. 1991, Vol 30, Num 30, pp 4390-4395, issn 0003-6935Article

The evolution of the MINIMOS mobility modelSELBERHERR, S; HÄNSCH, W; SEAVEY, M et al.AEU. Archiv für Elektronik und Übertragungstechnik. 1990, Vol 44, Num 3, pp 161-172, issn 0001-1096Article

Efficient power modelling approach of sequential circuits using recurrent neural networksHSIEH, W.-T; SHIUE, C.-C; LIU, C.-N. J et al.IEE proceedings. Computers and digital techniques. 2006, Vol 153, Num 2, pp 78-86, issn 1350-2387, 9 p.Article

A conception for reliability prediction and estimation of MOS integrated circuitsDIMITROV, S.Microelectronics and reliability. 1990, Vol 30, Num 1, pp 27-34, issn 0026-2714Article

Substrate bias effects on drain-induced barrier lowering in short channel PMOS devices at 77 KYAN, Z. X; DEEN, M. J.Cryogenics (Guildford). 1990, Vol 30, Num 12, pp 1160-1165, issn 0011-2275Article

Robust testing of CMOS logic circuitsJHA, N. K.Computers & electrical engineering. 1989, Vol 15, Num 1, pp 19-28, issn 0045-7906, 10 p.Article

Exhaustive testing of stuck-open faults in CMOS combinational circuitsBATE, J. A; MILLER, D. M.IEE proceedings. Part E. Computers and digital techniques. 1988, Vol 135, Num 1, pp 10-16, issn 0143-7062Article

Capacitive polysilicon resonator with MOS detection circuitLINDER, C; ZIMMERMANN, E; DE ROOIJ, N. F et al.Sensors and actuators. A, Physical. 1991, Vol 27, Num 1-3, pp 591-595Article

Optimized layout of MOS cellsTHUAU, G; SAUCIER, G.IEEE transactions on computers. 1988, Vol 37, Num 1, pp 79-87, issn 0018-9340Article

CMOS-process-independent average power dissipation macromodellingMATHER, P. J; HALLAM, P; BROUWER, M et al.Electronics Letters. 1995, Vol 31, Num 16, pp 1337-1338, issn 0013-5194Article

Novel carry propagation in high-speed synchronous counters and dividersLARSSON, P; YUAN, J.Electronics Letters. 1993, Vol 29, Num 16, pp 1457-1458, issn 0013-5194Article

New fast fixed-delay sizing algorithm for high-performance CMOS combinatorial logic circuits and its applicationsJEN-SHENG HWANG; CHUNG-YU WU.IEE proceedings. Part E. Computers and digital techniques. 1992, Vol 139, Num 5, pp 379-386, issn 0143-7062Article

Sealed interface local oxidation by rapid thermal nitridationMOLLE, P; DELEONIBUS, S; MARTIN, F et al.Journal of the Electrochemical Society. 1991, Vol 138, Num 12, pp 3732-3738, issn 0013-4651Article

A 16-bit CMOS D/A converter for digital audio applicationsYAMADA, Y; KAJITANI, M; OHGISHI, T et al.IEEE transactions on consumer electronics. 1987, Vol 33, Num 3, pp 267-274, issn 0098-3063Article

LDMOS linearity and reliabilityRICE, Jed.Microwave journal (Euro-global edition). 2002, Vol 45, Num 6, pp 64-72, issn 0192-6217, 7 p.Article

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