Pascal and Francis Bibliographic Databases


Search results

Your search

kw.\*:("Concentration distribution")


A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Document Type [dt]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Publication Year[py]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Discipline (document) [di]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV


A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Author Country

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV


A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Results 1 to 25 of 20080

  • Page / 804

Selection :

  • and

Particle flow behavior of distribution and deposition throughout 90° bends: Analysis of influencing factorsKE SUN; LIN LU.Journal of aerosol science. 2013, Vol 65, pp 26-41, issn 0021-8502, 16 p.Article

Backfire control and power enhancement of a hydrogen internal combustion engineJUNFA DUAN; FUSHUI LIU; BAIGANG SUN et al.International journal of hydrogen energy. 2014, Vol 39, Num 9, pp 4581-4589, issn 0360-3199, 9 p.Article

Analytical solutions of the nonlinear Poisson―Boltzmann equation in mixture of electrolytesXINMIN LIU; HANG LI; RUI LI et al.Surface science. 2013, Vol 607, pp 197-202, issn 0039-6028, 6 p.Article

Seasonal trends of concentration and size distribution of ultrafine particles near major highways in Los AngelesYIFANG ZHU; HINDS, William C; SI SHEN et al.Aerosol science and technology. 2004, Vol 38, pp 5-13, issn 0278-6826, 9 p., SUP1Article

Lateral dopant profiling with 200 nm resolution by scanning capacitance microscopyWILLIAMS, C. C; SLINKMAN, J; HOUGH, W. P et al.Applied physics letters. 1989, Vol 55, Num 16, pp 1662-1664, issn 0003-6951, 3 p.Article

Steady-state sequential distributed parameter filtering to estimate temperature and composition profiles of a fixed-bed tubular catalytic reactorKURUOGLU, N; RAMIREZ, W. F; CLOUGH, D. E et al.Chemical engineering science. 1985, Vol 40, Num 8, pp 1441-1448, issn 0009-2509Article

Dissolved oxygen concentration profiles in a production-scale bioreactorOOSTERHUIS, N. M. G; KOSSEN, N. W. F.Biotechnology and bioengineering. 1984, Vol 26, Num 5, pp 546-550, issn 0006-3592Article

Flame propagation in time-dependent concentration gradient fieldsISHIKAWA, N.Combustion science and technology. 1983, Vol 35, Num 1-4, pp 207-213, issn 0010-2202Article

A note on axial concentration profiles and two-phase models for gas-fluidized bedsDRY, R. J; POTTER, O. E.Chemical engineering science. 1986, Vol 41, Num 7, pp 1925-1927, issn 0009-2509Article

Switch-on transient of shallow-profile bipolar transistorsDUAN-LEE TANG, D.I.E.E.E. transactions on electron devices. 1985, Vol 32, Num 11, pp 2224-2226, issn 0018-9383Article

Untersuchungen zur Auswertung von experimentellen Konzentrationsprofilen bei der Mehrstoffdestillation = Evaluation des profils expérimentaux de concentration dans la distillation des mélanges complexes = Evaluation of experimental concentration profiles in multicomponent distillationHOFERICHTER, K; WEISS, S; WRACKMEYER, T et al.Chemische Technik (Berlin, DDR, 1949). 1983, Vol 35, Num 10, pp 494-498, issn 0045-6519Article

Formation of TiN/CoSi2 bilayer from Co/Ti/Si structure in a non-isothermal reactorRUDAKOV, Valery I; GUSEV, Valery N.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7025, pp 70250X.1-70250X.8, issn 0277-786X, isbn 978-0-8194-7238-0 0-8194-7238-7Conference Paper

Statistics of confined self-avoiding walks. I: Chain dimensions and concentration profilesJAECKEL, A; DAYANTIS, J.Journal of physics. A, mathematical and general. 1994, Vol 27, Num 8, pp 2653-2667, issn 0305-4470Article

Lois de répartitions des additifs dans les phases du clinker du ciment portlandFOMICHEVA, O. I; BOJKOVA, A. I.Cement. 1986, Num 5, pp 16-18, issn 0041-4867Article

High speed optical tomography for flow visualizationSNYDER, R; HESSELINK, L.Applied optics. 1985, Vol 24, Num 23, pp 4046-4051, issn 0003-6935Conference Paper

On the examination of zone meltingVASARHELYI, K.Chemical engineering science. 1984, Vol 39, Num 1, pp 3-9, issn 0009-2509Article

Etude des zones de croissance illimitée de la concentration des particules dans des écoulements dispersésOSIPTSOV, A. N.Izvestiâ Akademii nauk SSSR. Mehanika židkosti i gaza. 1984, Num 3, pp 46-52, issn 0568-5281Article

Addendum to atomic diffusion in tetrahedral semiconductors. Improved approximate diffusion profilesENDERS, P; SCHADE, U.Physica status solidi. B. Basic research. 1989, Vol 154, Num 1, pp K5-K8, issn 0370-1972Article

Tests for the determination of concentration profiles by neutron reflexionBOUCHAUD, E; FARNOUX, B; SUN, X et al.Europhysics letters (Print). 1986, Vol 2, Num 4, pp 315-322, issn 0295-5075Article

Mécanisme de variation non-monotone de la concentration de la phase discrète le long de l'axe d'un jet diphasiqueZUEV, YU. V; LAATS, M. K; LEPESHINSKIJ, J. A et al.Izvestiâ Akademii nauk SSSR. Mehanika židkosti i gaza. 1985, Num 4, pp 183-185, issn 0568-5281Article

Mesure des profils de concentration dans la région superficielle des solides au moyen de techniques nucléaires d'investigation = Concentration profils measurements near the surface region of solids by resonant nuclear techniquesTROCELLIER, P.Journal de microscopie et de spectroscopie électroniques. 1984, Vol 9, Num 2, pp 111-116, issn 0395-9279Article

The deconvolution of sputter-etching surface concentration measurements to determine impurity depth profilesCARTER, G; KATARDJIEV, I. V; NOBES, M. J et al.Surface and interface analysis. 1989, Vol 14, Num 9, pp 511-523, issn 0142-2421, 13 p.Article

Study of lead distribution in tinplate coatings by X-ray photoelectron spectroscopy = Etude de la distribution du plomb dans les revêtements de fer blanc, par spectrométrie de photoélectrons RXENGLISH, T. H; GLADMAN, T.Materials science and technology. 1986, Vol 2, Num 1, pp 88-94, issn 0267-0836Article

Improved accuracy in concentration profile determination by means of Auger electron spectroscopySMITH, J. F; SOUTHWORTH, H. N.Surface technology. 1984, Vol 21, Num 1, pp 97-99, issn 0376-4583Article

Breakdown in concentration profile diodesGHATOL, A. A; SUNDARSINGH, V. P.International journal of electronics. 1983, Vol 55, Num 4, pp 639-646, issn 0020-7217Article

  • Page / 804