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Technique for measuring the frequency-dependent complex dielectric constants of liquids up to 20 GHzYAN-ZHEN WEI; SRIDHAR, S.Review of scientific instruments. 1989, Vol 60, Num 9, pp 3041-3046, issn 0034-6748Article

Roadblocks and detours for poly-silicon/metal-oxide MOS integrationGILMER, D. C; HOBBS, C; GARCIA, R et al.Proceedings - Electrochemical Society. 2003, pp 345-359, issn 0161-6374, isbn 1-56677-396-2, 15 p.Conference Paper

A system for measuring complex permittivity at microwave frequenciesHIGGS, A. W.Journal of physics. E. Scientific instruments. 1986, Vol 19, Num 12, pp 1019-1025, issn 0022-3735Article

Static relative permittivities of polyhydric alcohols under pressures up to 300 MPa at 298.15 KUOSAKI, Yasuhiro; KITAURA, Sunao; MORIYOSHI, Takashi et al.Journal of chemical and engineering data (Print). 2004, Vol 49, Num 5, pp 1410-1413, issn 0021-9568, 4 p.Article

The evolution of high permittivity multilayer capacitorsHERBERT, J. M.Ferroelectrics (Print). 1988, Vol 87, pp 347-351, issn 0015-0193Article

Material constants of composites. I: General theory for the dielectric constantMONECKE, J.Physica status solidi. B. Basic research. 1987, Vol 140, Num 1, pp 279-287, issn 0370-1972Article

Microstrip resonator sensors for determination of complex permittivity of materials in sheet, liquid and paste formsVERMA, A. K; NASIMUDDIN; OMAR, A. S et al.IEE proceedings. Microwaves, antennas and propagation. 2005, Vol 152, Num 1, pp 47-54, issn 1350-2417, 8 p.Article

Three-body problem in the theory of the dielectric constantCICHOCKI, B; FELDERHOF, B. U.Journal of statistical physics. 1989, Vol 57, Num 3-4, pp 871-885, issn 0022-4715, 15 p.Article

Mesure de permittivité par interférométrie = Permittivity measurement by interferometryMesures (1983). 1986, Vol 51, Num 1, pp 39-42, issn 0755-219XArticle

Practical expression for frequency deviation due to insertion hole in cylindrical cavityPENARANDA FOIX, F. L; CATALA-CIVERA, J. M; CANOS-MARIN, A. J et al.Electronics Letters. 2007, Vol 43, Num 24, pp 1338-1340, issn 0013-5194, 3 p.Article

The IH capacitance probe for measurement of soil water contentReport - Institute of Hydrology. 1994, Num 125, issn 0264-8709, 39 p.Serial Issue

Dielectric properties of lactams and their significance in the polymerization processPROVAZNIK, M; PUFFR, R; SEBENDA, J et al.European polymer journal. 1988, Vol 24, Num 6, pp 511-514, issn 0014-3057Article

La constante diélectrique d'un liquide magnétiqueRAJKHER, YU. L; PETRIKEVITCH, A. V.Magnitnaâ gidrodinamika. 1987, Num 2, pp 50-58, issn 0025-0015Article

Permittivity build-up with material in powder stateASHUTOSH PRASAD; SHARMA, K. P.Indian journal of pure & applied physics. 1990, Vol 28, Num 7, pp 403-405, issn 0019-5596Article

The dielectric constant of SPC/E waterRAMI REDDY, M; BERKOWITZ, M.Chemical physics letters. 1989, Vol 155, Num 2, pp 173-176, issn 0009-2614, 4 p.Article

Subspace-Based Optimization Method for Inverse Scattering Problems Utilizing Phaseless DataLI PAN; YU ZHONG; XUDONG CHEN et al.IEEE transactions on geoscience and remote sensing. 2011, Vol 49, Num 3, pp 981-987, issn 0196-2892, 7 p.Article

Permittivity and density relationships for granular and powdered materialsNELSON, Stuart O.IEEE antennas and propagation society international symposiumNational radio science meeting. 2004, isbn 0-7803-8302-8, 4Vol, Vol1, 229-232Conference Paper

Dielectric constant measurements near the critical point of cyclohexane-anilineEARLY, M. D.The Journal of chemical physics. 1992, Vol 96, Num 1, pp 641-647, issn 0021-9606Article

Dielectric constants of topaz, orthoclase and scapolite and the oxide additivity ruleSHANNON, Robert D; OSWALD, Robert A; ROSSMAN, George R et al.Physics and chemistry of minerals. 1992, Vol 19, Num 3, pp 166-170, issn 0342-1791Conference Paper

Installation d'irradiation microonde des catalyseurs diélectriques et d'étude des réactions = Microwave set-up for studying dielectric catalysts and their catalytic reactionTHIEBAUT, J.-M; HASSAN AMMOR; ROUSSY, G et al.Journal de chimie physique. 1988, Vol 85, Num 7-8, pp 799-806, issn 0021-7689Article

Underfill for low-K silicon technologyRAJAGOPALAN, Sarathy; DESAI, Kishor; TODD, Michael et al.IEEE/CPMT/SEMI international electronics manufacturing technology. Symposium. 2004, pp 1-3, isbn 0-7803-8582-9, 1Vol, 3 p.Conference Paper

Dielectric-differential thermal analysis. I: MethodMONTES, A; ROQUE-MALHERBE, R; SCHCHUKIN, E. D et al.Journal of thermal analysis. 1986, Vol 31, Num 1, pp 41-47, issn 0368-4466Article

Automatic determination of the complex permittivity of liquids of low dielectric lossSTUMPER, U.IEEE transactions on instrumentation and measurement. 1985, Vol 34, Num 2, pp 353-356, issn 0018-9456Article

General theory of the transverse dielectric constant of III-V semiconducting compoundsKAHEN, K. B; LEBURTON, J. P.Physical review. B, Condensed matter. 1985, Vol 32, Num 8, pp 5177-5184, issn 0163-1829Article