Stray light in packaged detectorsWATERS, D. M; BLOUKE, M. M; HARWIT, A et al.Proceedings of SPIE, the International Society for Optical Engineering. 2006, pp 62910U.1-62910U.8, issn 0277-786X, isbn 0-8194-6370-1, 1VolConference Paper

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Contamination of surfaces : origin, detection and effect on adhesionDAVIS, G. D.Surface and interface analysis. 1993, Vol 20, Num 5, pp 368-372, issn 0142-2421Conference Paper

Effect of RCA cleaning on the surface chemistry of glass and polysilicon films as studied by ToF-SIMS and XPSONYIRIUKA, E. C; MOORE, C. B; FEHLNER, F. P et al.Surface and interface analysis. 1998, Vol 26, Num 4, pp 270-277, issn 0142-2421Article

Measuring reality, solving the slope dilemma and redefining the particle size distribution modelWILKERSON, Kerri J; MAGALLANES, Philip G; ELDERS, Jonathan P et al.Proceedings of SPIE, the International Society for Optical Engineering. 2006, pp 62910I.1-62910I.11, issn 0277-786X, isbn 0-8194-6370-1, 1VolConference Paper

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GOES-12 Molecular ContaminationSANDERS, Jack; ROSECRANS, Glenn.Proceedings of SPIE, the International Society for Optical Engineering. 2006, pp 62910E.1-62910E.9, issn 0277-786X, isbn 0-8194-6370-1, 1VolConference Paper

On the cleaning of monocrystalline metallic samples from impuritiesARABCZYK, W; NARKIEWICZ, U.Applied surface science. 2005, Vol 252, Num 1, pp 98-103, issn 0169-4332, 6 p.Conference Paper

Trace detection of nitrogen-based explosives with UV-PLFGUENTHER, Jens-Uwe; BOHLING, Christian; MORDMUELLER, Mario et al.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7838, issn 0277-786X, isbn 978-0-8194-8356-0, 783807.1-783807.8Conference Paper

Digital imaging of particulate contaminationLUEY, Kenneth T; TAYLOR, David P; COLEMAN, Dianne J et al.Proceedings of SPIE, the International Society for Optical Engineering. 2006, pp 62910J.1-62910J.11, issn 0277-786X, isbn 0-8194-6370-1, 1VolConference Paper

New method to correct for the influence of organic contamination on intensity ratios in quantitative XPSVEREECKE, G; ROUXHET, P. G.Surface and interface analysis. 1999, Vol 27, Num 8, pp 761-769, issn 0142-2421Article

UV/ozone treatment to decontaminate tritium contaminated surfacesKRASZNAI, J. P; MOWAT, R.Fusion technology. 1995, Vol 28, Num 3, pp 1336-1341, issn 0748-1896, 2Conference Paper

Investigation of diamond films for electronic devicesMEARINI, G. T; KRAINSKY, I. L; DAYTON, J. A et al.Surface and interface analysis. 1994, Vol 21, Num 2, pp 138-143, issn 0142-2421Conference Paper

A quantitative study of impurities in photoluminescent and nonphotoluminescent porous silicon layersGROSMAN, A; ORTEGA, C; SIEJKA, J et al.Journal of applied physics. 1993, Vol 74, Num 3, pp 1992-1996, issn 0021-8979Article

No such thing as σ - : flowdown and measurement of surface roughness requirementsDITTMAN, Michael G; GROCHOCKI, Frank; YOUNGWORTH, Kathleen et al.Proceedings of SPIE, the International Society for Optical Engineering. 2006, pp 62910P.1-62910P.8, issn 0277-786X, isbn 0-8194-6370-1, 1VolConference Paper

Characterization of particle contamination for optical applicationTOVENA, I; PALMIER, S; GARCIA, S et al.Proceedings of SPIE, the International Society for Optical Engineering. 2006, pp 61881H.1-61881H.8, issn 0277-786X, isbn 0-8194-6244-6, 1VolConference Paper

Optical systems degradation, contamination and stray light (effects, measurements, and control II)Uy, O. Manuel.Proceedings of SPIE, the International Society for Optical Engineering. 2006, issn 0277-786X, isbn 0-8194-6370-1, 1Vol, various pagings, isbn 0-8194-6370-1Conference Proceedings

K-correlation power spectral density & surface scatter modelDITTMAN, Michael G.Proceedings of SPIE, the International Society for Optical Engineering. 2006, pp 62910R.1-62910R.12, issn 0277-786X, isbn 0-8194-6370-1, 1VolConference Paper

Quartz crystal microbalance operation and in situ calibration (NASA TM-2004-213550)ALBYN, K; BURNS, H. D.Proceedings of SPIE, the International Society for Optical Engineering. 2006, pp 629106.1-629106.7, issn 0277-786X, isbn 0-8194-6370-1, 1VolConference Paper

Surface microcharacterization of silicon wafers by the light-beam-induced current technique in the planar configuration and by attenuated total reflection spectroscopySPADONI, S; ACCIARRI, M; NARDUCCI, D et al.Philosophical magazine. B. Physics of condensed matter. Statistical mechanics, electronic, optical and magnetic properties. 2000, Vol 80, Num 4, pp 579-585, issn 1364-2812Conference Paper

Substrate-related feature in the loss structure of contamination C 1sCASTLE, J. E; SALVI, A. M; GUASCITO, M. R et al.Surface and interface analysis. 1999, Vol 27, Num 8, pp 753-760, issn 0142-2421Article

Influence of pre-treatment conditions on the resistivity of fluoride multilayersBLASCHKE, H; RISTAU, D; RIGGERS, W et al.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7132, issn 0277-786X, isbn 978-0-8194-7366-0, 1Vol, 71320I.1-71320I.8Conference Paper

Gas-source growth of group IV semiconductors : II. Growth regimes and the effect of hydrogenOWEN, J. H. G; MIKI, K; BOWLER, D. R et al.Surface science. 1997, Vol 394, Num 1-3, pp 91-104, issn 0039-6028Article