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Results 1 to 25 of 380

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Formation of contaminant droplets on surfacesLUEY, Kenneth T; COLEMAN, Dianne J.Proceedings of SPIE, the International Society for Optical Engineering. 2006, pp 62910G.1-62910G.13, issn 0277-786X, isbn 0-8194-6370-1, 1VolConference Paper

High frequency eddy current device for near surface material characterizationsHILLMANN, S; HEUER, H; MEYENDORF, N et al.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7293, issn 0277-786X, isbn 978-0-8194-7553-4 0-8194-7553-X, 1Vol, 72930S.1-72930S.9Conference Paper

Stray light in packaged detectorsWATERS, D. M; BLOUKE, M. M; HARWIT, A et al.Proceedings of SPIE, the International Society for Optical Engineering. 2006, pp 62910U.1-62910U.8, issn 0277-786X, isbn 0-8194-6370-1, 1VolConference Paper

Modeling particle distributions for stray light analysisFLEMING, John; MATHESON, Bruce; DITTMAN, Michael G et al.Proceedings of SPIE, the International Society for Optical Engineering. 2006, pp 62910T.1-62910T.8, issn 0277-786X, isbn 0-8194-6370-1, 1VolConference Paper

A numerical evaluation of the correlation of surface cleanliness level and percent area coveragePERRY, Radford L.Proceedings of SPIE, the International Society for Optical Engineering. 2006, pp 62910L.1-62910L.8, issn 0277-786X, isbn 0-8194-6370-1, 1VolConference Paper

Contamination of surfaces : origin, detection and effect on adhesionDAVIS, G. D.Surface and interface analysis. 1993, Vol 20, Num 5, pp 368-372, issn 0142-2421Conference Paper

Effect of RCA cleaning on the surface chemistry of glass and polysilicon films as studied by ToF-SIMS and XPSONYIRIUKA, E. C; MOORE, C. B; FEHLNER, F. P et al.Surface and interface analysis. 1998, Vol 26, Num 4, pp 270-277, issn 0142-2421Article

Particle deposition in confined vesselsLESNIEWSKI, Thomas K.Proceedings of SPIE, the International Society for Optical Engineering. 2006, pp 62910M.1-62910M.12, issn 0277-786X, isbn 0-8194-6370-1, 1VolConference Paper

Determination of 2,4,6-trinitrotoluene surface contamination on M107 artillery projectiles and sampling method evaluationGROSSMAN, S.Proceedings of SPIE, the International Society for Optical Engineering. 2005, issn 0277-786X, isbn 0-8194-5779-5, 2Vol, vol 2, 717-723Conference Paper

Measuring reality, solving the slope dilemma and redefining the particle size distribution modelWILKERSON, Kerri J; MAGALLANES, Philip G; ELDERS, Jonathan P et al.Proceedings of SPIE, the International Society for Optical Engineering. 2006, pp 62910I.1-62910I.11, issn 0277-786X, isbn 0-8194-6370-1, 1VolConference Paper

Interaction of vacuum ultraviolet radiation with molecular depositsALBYN, K; BURNS, H. D.Proceedings of SPIE, the International Society for Optical Engineering. 2006, pp 62910H.1-62910H.15, issn 0277-786X, isbn 0-8194-6370-1, 1VolConference Paper

Potential biofouling of spacecraft propellant systems due to contaminated deionized waterHOGUE, Patrick.Proceedings of SPIE, the International Society for Optical Engineering. 2006, pp 62910N.1-62910N.8, issn 0277-786X, isbn 0-8194-6370-1, 1VolConference Paper

GOES-12 Molecular ContaminationSANDERS, Jack; ROSECRANS, Glenn.Proceedings of SPIE, the International Society for Optical Engineering. 2006, pp 62910E.1-62910E.9, issn 0277-786X, isbn 0-8194-6370-1, 1VolConference Paper

On the cleaning of monocrystalline metallic samples from impuritiesARABCZYK, W; NARKIEWICZ, U.Applied surface science. 2005, Vol 252, Num 1, pp 98-103, issn 0169-4332, 6 p.Conference Paper

Trace detection of nitrogen-based explosives with UV-PLFGUENTHER, Jens-Uwe; BOHLING, Christian; MORDMUELLER, Mario et al.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7838, issn 0277-786X, isbn 978-0-8194-8356-0, 783807.1-783807.8Conference Paper

Digital imaging of particulate contaminationLUEY, Kenneth T; TAYLOR, David P; COLEMAN, Dianne J et al.Proceedings of SPIE, the International Society for Optical Engineering. 2006, pp 62910J.1-62910J.11, issn 0277-786X, isbn 0-8194-6370-1, 1VolConference Paper

New method to correct for the influence of organic contamination on intensity ratios in quantitative XPSVEREECKE, G; ROUXHET, P. G.Surface and interface analysis. 1999, Vol 27, Num 8, pp 761-769, issn 0142-2421Article

UV/ozone treatment to decontaminate tritium contaminated surfacesKRASZNAI, J. P; MOWAT, R.Fusion technology. 1995, Vol 28, Num 3, pp 1336-1341, issn 0748-1896, 2Conference Paper

Investigation of diamond films for electronic devicesMEARINI, G. T; KRAINSKY, I. L; DAYTON, J. A et al.Surface and interface analysis. 1994, Vol 21, Num 2, pp 138-143, issn 0142-2421Conference Paper

A quantitative study of impurities in photoluminescent and nonphotoluminescent porous silicon layersGROSMAN, A; ORTEGA, C; SIEJKA, J et al.Journal of applied physics. 1993, Vol 74, Num 3, pp 1992-1996, issn 0021-8979Article

Modified view factor method for estimating molecular backscattering probability in space conditionsLEE, Jin W; YI, Min Y; HAN, Dong I et al.Journal of thermophysics and heat transfer. 2006, Vol 20, Num 2, pp 336-341, issn 0887-8722, 6 p.Article

Improved mie theory scatter model for particulate contamination that conserves energy and obeys reciprocityJENKINS, David G; FEST, Eric C; KREMER, Rex M et al.Proceedings of SPIE, the International Society for Optical Engineering. 2006, pp 62910Q.1-62910Q.8, issn 0277-786X, isbn 0-8194-6370-1, 1VolConference Paper

Improved EUV Filter Transmission with Plasma CleaningLAIRSON, Bruce M; GROVE, Dave; SMITH, Ryan et al.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7732, issn 0277-786X, isbn 0-8194-8222-6 978-0-8194-8222-8, 77322G.1-77322G.6, 2Conference Paper

New Horizons Pluto lessons learned during ground processingHOGUE, Patrick.Proceedings of SPIE, the International Society for Optical Engineering. 2006, pp 629109.1-629109.11, issn 0277-786X, isbn 0-8194-6370-1, 1VolConference Paper

Finnish system clears surface contamination from drying cylinders and improves heat transferOY, Cumel.Paper technology (1989). 2003, Vol 44, Num 8, pp 51-53, issn 0958-6024, 3 p.Article

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