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Mise au point d'un dispositif expérimental pour l'étude des structures MOS: Application à l'étude du vieillissement des TMOS microniques par la technique de pompage de charge = Development of an experimental apparatus for MOS structure study: application to the study of micronic TMOS aging by the charge pumping techniqueDjahli, Farid; Balland, Bernard.1992, 144 p.Thesis

Accelerated aging of extruded dielectric power cables. II: Life testing of 15 KV XLPE-insulated cablesBERNSTEIN, B. S; THUE, W. A; WALTON, M. D et al.IEEE transactions on power delivery. 1992, Vol 7, Num 2, pp 603-608, issn 0885-8977Conference Paper

Vieillissement des transistors MOS submicroniques après contrainte électrique = Submicron MOS transistor ageing after electric stressCRISTOLOVEANU, S; CABON-TILL, B; KANG, K. N et al.Revue de physique appliquée. 1984, Vol 19, Num 11, pp 933-939, issn 0035-1687Article

Degrading effect of high-altitude corona on electronic circuit boardsKARADY, G. G; SIRKIS, M. D; OLIVA, J. R et al.IEEE transactions on electrical insulation. 1991, Vol 26, Num 6, pp 1216-1219, issn 0018-9367Article

Influence of nitrogen in ultra-thin SiON on negative bias temperature instability under AC stressMITANI, Yuichiro.International Electron Devices Meeting. 2004, pp 117-120, isbn 0-7803-8684-1, 1Vol, 4 p.Conference Paper

Longterm performance studies of electronic components at rated electrical stressBORA, J. S.Microelectronics and reliability. 1986, Vol 26, Num 5, pp 989-991, issn 0026-2714Article

Investigation of an SF6 ultra high voltage circuit breaker using an opening resistor and auxiliarry interrupterOHSHITA, Y; HIRASAWA, K; KUROSAWA, Y et al.IEEE transactions on power delivery. 1992, Vol 7, Num 1, pp 346-352, issn 0885-8977Conference Paper

The last trap that form the percolation path - : the stress voltage effectCHEUNG, Kin P.IEEE international reliability physics symposium. 2004, pp 599-600, isbn 0-7803-8315-X, 1Vol, 2 p.Conference Paper

Electromigration under time-varying current stressJIANG TAO; LIEW, B.-K; CHEN, J. F et al.Microelectronics and reliability. 1998, Vol 38, Num 3, pp 295-308, issn 0026-2714Article

Effect of AC ageing on space charge evolution in XLPECHONG, Y. L; CHEN, G; MIYAKE, H et al.CEIDP conference on electrical insulation and dielectric phenomena. 1998, pp 81-84, isbn 0-7803-8584-5, 1Vol, 4 p.Conference Paper

Combined method based on inversion and charge simulation for calculating electric stresses in three-core belted cablesABDEL-SALAM, M; AL-SHEHRI, A.IEE proceedings. Part C. Generation, transmission and distribution. 1993, Vol 140, Num 5, pp 357-364, issn 0143-7046Article

Mischstrombelastbarer Wechselstromwandler = Pulsating-current-tolerant current transformerKAHMANN, M.ETZ-Archiv. 1989, Vol 11, Num 5, pp 139-143, issn 0170-1703, 5 p.Article

Effects of DC prestressing on tree initiation in polyethylene with and without needle-shaped voidYOSHIMURA, N; NOTO, F.IEEE transactions on electrical insulation. 1984, Vol 19, Num 2, pp 135-140, issn 0018-9367Article

Designing optimum snubber circuits for the transistor bridge configurationPEARSON, W. R; SEN, P. C.Electric machines and power systems. 1983, Vol 8, Num 4-5, pp 321-332, issn 0731-356XArticle

Post-breakdown leakage resistance and its dependence on device areaCHEN, Tze Wee; ITO, Choshu; LOH, William et al.Microelectronics and reliability. 2006, Vol 46, Num 9-11, pp 1612-1616, issn 0026-2714, 5 p.Conference Paper

Context awareness in network selection for dynamic environmentsDIAZ, Daniel; MARIN, Andrés; ALMENAREZ, Florina et al.Lecture notes in computer science. 2006, pp 216-227, issn 0302-9743, isbn 3-540-45174-9, 1Vol, 12 p.Conference Paper

Metal defect yield and reliability relationshipsROESCH, William J; HAMADA, Dorothy June M.Microelectronics and reliability. 2005, Vol 45, Num 12, pp 1875-1881, issn 0026-2714, 7 p.Conference Paper

Steep impulse voltage characteristics of suspension insulatorsMORITA, K; IMAKOMA, T; NISHIKAWA, M et al.Electrical engineering in Japan. 1995, Vol 115, Num 2, pp 21-31, issn 0424-7760Article

Influence du mode de commutation sur le comportement de convertisseurs DC/DC à hautes performances (3 kW-100 kHz) = Switching-mode impact on high performance DC/DC converter operationCOSTA, F; FOREST, F; SOL, C et al.Revue générale de l'électricité (Paris). 1992, Num 5, pp 88-99, issn 0035-3116Article

Fractal character of dc trees in polymethylmethacrylateFUJII, M; WATANABE, M; KITANI, I et al.IEEE transactions on electrical insulation. 1991, Vol 26, Num 6, pp 1159-1162, issn 0018-9367Article

Spécification des intensités de champ électrique en service et aux essais pour les câbles à huile fluide HTGLEJZER, S. E; OBRAZTSOV, YU. V; PESHKOV, I. B et al.Èlektrotehnika (Moskva, 1963). 1983, Num 12, pp 29-32, issn 0013-5860Article

Contribution of single-phase motors to system fault levelCOOPER, C. B; JWEILES, Z. A; KHAN, G. A et al.IEE proceedings. Part C. Generation, transmission and distribution. 1992, Vol 139, Num 4, pp 359-364, issn 0143-7046Article

Spatio-temporal development of surface charges on spacers stressed with dc voltagesBEKTAS, S. I.IEEE transactions on electrical insulation. 1990, Vol 25, Num 3, pp 515-520, issn 0018-9367Article

Threshold voltage of luminescence and electrical tree inception in low-density polyethyleneBAMJI, S. S; BULINSKI, A. T; DENSLEY, R. J et al.Journal of applied physics. 1988, Vol 63, Num 12, pp 5841-5845, issn 0021-8979Article

Sur le facteur d'accélération du vieillissement électrique des isolations HT: rôle de la fréquence et de la tension appliquée = The acceleration factor for the electrical ageing of h.v. insulations: the effects of frequency and voltageGOFFAUX, R.Revue générale de l'électricité (Paris). 1987, Num 9, pp 1-9, issn 0035-3116Article

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