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Low-temperature far-infrared ellipsometry of convergent beamSUSHKOV, A. B; TISHCHENKO, E. A.International journal of infrared and millimeter waves. 1993, Vol 14, Num 12, pp 2555-2568, issn 0195-9271Article

Analysis of critical voltage data using the dynamical theory of electron diffractionKIM, H. S; SHEININ, S. S.Physica status solidi. B. Basic research. 1983, Vol 120, Num 1, pp 311-319, issn 0370-1972Article

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Phase measurement for accurate mapping of chemical bonds in acentric space groupsSPACKMAN, M. A; JIANG, B; GROY, T. L et al.Physical review letters. 2005, Vol 95, Num 8, issn 0031-9007, 085502-1-085502-4Article

Developments in waveguide studies of director profilesSAMBLES, J. R; SMITH, N. J.Molecular crystals and liquid crystals science and technology. Section A, Molecular crystals and liquid crystals. 2000, Vol 347, pp 37-44, issn 1058-725XConference Paper

An improved multislice method for calculating high-energy electron diffraction and imaging under conditions of inclined illuminationCHEN, J. H; YUANMING, W; LUO, X. J et al.Philosophical magazine letters. 1995, Vol 71, Num 1, pp 33-37, issn 0950-0839Article

Double-crystal interferometer combined with CBED techniqueZHOU, F; PLIES, E; MÖLLENSTEDT, G et al.Optik (Stuttgart). 1995, Vol 98, Num 3, pp 95-100, issn 0030-4026Article

Observation of phase contrast in convergent-beam electron diffraction patternsVINE, W. J; VINCENT, R; SPELLWARD, P et al.Ultramicroscopy. 1992, Vol 41, Num 4, pp 423-428, issn 0304-3991Article

Realization of a mixed type of interferometry using convergent-beam electron diffraction and an electron biprismHERRING, R. A; POZZI, G; TANJI, T et al.Ultramicroscopy. 1993, Vol 50, Num 1, pp 94-100, issn 0304-3991Article

Dynamical effects in foil thickness determination using convergent beam electron diffractionJESSON, D. E; SHAW, M. P.Physica status solidi. A. Applied research. 1985, Vol 88, Num 2, pp 469-474, issn 0031-8965Article

Observation of switching in Tri-stable antiferroelectric cellsJEWELL, S. A; SAMBLES, J. R; GOODBY, J. W et al.Ferroelectrics (Print). 2004, Vol 310, pp 79-85, issn 0015-0193, 7 p.Conference Paper

Benefits of energy filtering for advanced convergent beam electron diffraction patternsBURGESS, W. G; PRESTON, A. R; BOTTON, G. A et al.Ultramicroscopy. 1994, Vol 55, Num 3, pp 276-283, issn 0304-3991Article

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Simultaneous observation of zone-axis pattern and±G Dark-field pattern in convergent-beam electron diffractionTERAUCHI, M; TANAKA, M.Journal of electron microscopy. 1985, Vol 34, Num 4, pp 347-356, issn 0022-0744Article

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Convergent beam electron diffraction for strain determination at the nanoscaleHOUDELLIER, F; ROUCAU, C; CASANOVE, M.-J et al.Microelectronic engineering. 2007, Vol 84, Num 3, pp 464-467, issn 0167-9317, 4 p.Conference Paper

Dislocations in basic-nickel decagonal Al-Ni-Co single quasicrystalsSCHALL, P; FEUERBACHER, M; URBAN, K et al.Philosophical magazine letters. 2004, Vol 84, Num 7, pp 471-481, issn 0950-0839, 11 p.Article

Deconvolution of electron diffraction patterns of amorphous materials formed with convergent beamMCBRIDE, W; COCKAYNE, D. J. H; TSUDA, K et al.Ultramicroscopy. 2003, Vol 94, Num 3-4, pp 305-308, issn 0304-3991, 4 p.Article

Dislocation microstructure and internal-stress measurements by convergent-beam electron diffraction on creep-deformed Cu and AlKASSNER, M. E; PEREZ-PRADO, M. T; LONG, M et al.Metallurgical and materials transactions. A, Physical metallurgy and materials science. 2002, Vol 33, Num 2, pp 311-317, issn 1073-5623Article