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Vertical bipolar transistors on buried silicon nitride layersMUNZEL, H; ALBERT, G; STRACK, H et al.IEEE electron device letters. 1984, Vol 5, Num 7, pp 283-285, issn 0741-3106Article

HIGH-POWER LEAKY-MODE MULTIPLE-STRIPE LASERACKLEY DE; ENGELMANN RWH.1981; APPL. PHYS. LETT.; ISSN 0003-6951; USA; DA. 1981; VOL. 39; NO 1; PP. 27-29; BIBL. 8 REF.Article

FORMATION OF A LONG-WAVELENGTH BURIED-CRESCENT LASER STRUCTURE ON CHANNELLED SUBSTRATESMURRELL DL; WALLING RH; HOBBS RE et al.1982; IEE PROCEEDINGS. PART I. SOLID-STATE AND ELECTRON DEVICES; ISSN 0143-7100; GBR; DA. 1982; VOL. 129; NO 6; PP. 209-213; BIBL. 15 REF.Article

OUTPUT POWER SATURATION OF BH LASER UNDER HIGH CURRENT OPERATIONNAKANO Y; TAKAHEI K; NOGUCHI Y et al.1982; ELECTRONICS LETTERS; ISSN 0013-5194; GBR; DA. 1982; VOL. 18; NO 12; PP. 501-502; BIBL. 4 REF.Article

BISTABILITY AND PULSATIONS IN CW SEMICONDUCTOR LASERS WITH A CONTROLLED AMOUNT OF SATURABLE ABSORPTIONHARDER C; LAU KY; YARIV A et al.1981; APPL. PHYS. LETT.; ISSN 0003-6951; USA; DA. 1981; VOL. 39; NO 5; PP. 382-384; BIBL. 10 REF.Article

A formula for the concentration profile of a buried layer with back diffusionSHIER, J. S.I.E.E.E. transactions on electron devices. 1985, Vol 32, Num 6, pp 1142-1143, issn 0018-9383Article

EFFECT OF CAVITY LENGTH ON 1.55 MU M BURIED-HETEROSTRUCTURE DH LASER CHARACTERISTICSTOKUNAGA M; NAKANO Y; TAKAHEI K et al.1981; ELECTRON. LETT.; ISSN 0013-5194; GBR; DA. 1981; VOL. 17; NO 6; PP. 234-236; BIBL. 10 REF.Article

SINGLE MODE OPERATION OF BURIED HETEROSTRUCTURE LASERS BY LOSS STABILIZATIONHENRY CH; LOGAN RA; MERRITT FR et al.1981; IEEE J. QUANTUM ELECTRON.; ISSN 0018-9197; USA; DA. 1981; VOL. 17; NO 11; PP. 2196-2204; BIBL. 9 REF.Article

BURIED HETEROSTRUCTURE ALGAAS LASERS ON SEMI-INSULATING SUBSTRATESBAR CHAIM N; KATZ J; URY I et al.1981; ELECTRON. LETT.; ISSN 0013-5194; GBR; DA. 1981; VOL. 17; NO 3; PP. 108-109; BIBL. 8 REF.Article

THE CW ELECTRO-OPTICAL PROPERTIES OF (AL, GA) AS MODIFIED-STRIP BARIED-HETEROSTRUCTURE LASERSHARTMAN RL; LOGAN RA; KOSZI LA et al.1980; J. APPL. PHYS.; ISSN 0021-8979; USA; DA. 1980; VOL. 51; NO 4; PP. 1909-1918; BIBL. 44 REF.Article

THE EFFECT OF A BURIED LAYER ON THE COLLECTOR BREAKDOWN VOLTAGES OF BIPOLAR JUNCTION TRANSISTORSHEWLETT FW JR; LINDHOLM FA; BRODERSEN AJ et al.1973; SOLID-STATE ELECTRON.; G.B.; DA. 1973; VOL. 16; NO 4; PP. 453-457; H.T. 1; BIBL. 7 REF.Serial Issue

BURRIED-GUARDED LAYER ION-IMPLANTED RESISTORSSEIDEL TE; GIBSON WC.1973; I.E.E.E. TRANS. ELECTRON DEVICES; U.S.A.; DA. 1973; VOL. 20; NO 8; PP. 744-748; BIBL. 8 REF.Serial Issue

A CLOSELY SPACED (50 MU M) ARRAY OF 16 INDIVIDUALLY ADDRESSABLE BURIED HETEROSTRUCTURE GAAS LASERSVAN DER ZIEL JP; LOGAN RA; MIKULYAK RM et al.1982; APPL. PHYS. LETT.; ISSN 0003-6951; USA; DA. 1982; VOL. 41; NO 1; PP. 9-11; BIBL. 10 REF.Article

INGAASP/INP BH LASERS ON P-TYPE INP SUBSTRATESNAKANO Y; TAKAHEI K; NOGUCHI Y et al.1981; ELECTRON. LETT.; ISSN 0013-5194; GBR; DA. 1981; VOL. 17; NO 18; PP. 645-646; BIBL. 9 REF.Article

NARROW DOUBLE-CURRENT-CONFINEMENT CHANNELED-SUBSTRATE PLANAR LASER FABRICATED BY DOUBLE ETCHING TECHNIQUECHUNG YIH CHEN; SHYH WANG.1980; APPL. PHYS. LETT.; ISSN 0003-6951; USA; DA. 1980; VOL. 36; NO 8; PP. 634-636; BIBL. 12 REF.Article

BURIED-HETEROSTRUCTURE ALGAAS LASERSSAITO K; ITO R.1980; I.E.E.E. J. QUANTUM ELECTRON.; USA; DA. 1980; VOL. 16; NO 2; PP. 205-215; BIBL. 29 REF.Article

Scaling capability improvement of silicon-on-void (SOV) MOSFETYU TIAN; WEIHAI BU; DAKE WU et al.Semiconductor science and technology. 2005, Vol 20, Num 2, pp 115-119, issn 0268-1242, 5 p.Article

Charge instability of bonded silicon dioxide layer induced by wet processingAFANAS'EV, V. V; REVESZ, A. G; BROWN, G. A et al.Journal of the Electrochemical Society. 1995, Vol 142, Num 6, pp 1983-1986, issn 0013-4651Article

Increase in probability of ion capture into the planar channelling regime by a buried oxide layerGUIDI, V; MAZZOLARI, A; TIKHOMIROV, V. V et al.Journal of physics. D, Applied physics (Print). 2009, Vol 42, Num 16, issn 0022-3727, 165301.1-165301.6Article

High-power, high-speed 1.3-μ semi-insulating-blocked distributed-feedback lasersKOREN, U; KOCH, T. L; CORVINI, P. J et al.Journal of applied physics. 1988, Vol 64, Num 9, pp 4785-4787, issn 0021-8979Article

GaAs/(Ga,Al)As heterojunction bipolar transistors with buried oxygen-implanted isolation layersASBECK, P. M; MILLER, D. L; ANDERSON, R. J et al.IEEE electron device letters. 1984, Vol 5, Num 8, pp 310-312, issn 0741-3106Article

Femtosecond laser writing of buried graphitic structures in bulk diamondNEFF, M; KONONENKO, T. V; PIMENOV, S. M et al.Applied physics. A, Materials science & processing (Print). 2009, Vol 97, Num 3, pp 543-547, issn 0947-8396, 5 p.Article

On the gettering efficiency of buried layers in dielectrically insulated structuresKISSINGER, G; TITTELBACH-HELMRICH, K; KNOPKE, J et al.Physica status solidi. A. Applied research. 1990, Vol 121, Num 1, pp K141-K143, issn 0031-8965Article

Model-independent one-dimensional imaging of interfacial structures at <1 Å resolutionFENTER, P; ZHANG, Z.Physical review B. Condensed matter and materials physics. 2005, Vol 72, Num 8, pp 081401.1-081401.4, issn 1098-0121Article

Performance of co-fired buried resistors in A6S tapeMOROZ, Michail.SPIE proceedings series. 2003, pp 161-166, isbn 0-8194-5189-4, 6 p.Conference Paper

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