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Results 1 to 25 of 197744

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THERMAL-RADIATION PROPERTIES OF THIN METALLIC FILMS ON DIELECTRICSFORSBERG CH; DOMOTO GA.1972; IN: ANN. SOC. MECH. ENG. WINTER ANNU. MEET.; NEW YORK, N.Y., 1972; S.L.; A.S.M.E.; DA. 1972; VOL. HT-7; PP. 1-6; BIBL. 21 REF.Conference Paper

DIE DUENNFILM-HYBRIDSCHALTUNG HAT CHANCENDELFS H.1972; ELEKTRONIK; DTSCH.; DA. 1972; VOL. 21; NO 10; PP. 335-338; BIBL. 7 REF.Serial Issue

Synthèse de revêtements optiques interférentielsSTOLOV, E. G.Optika i spektroskopiâ. 1986, Vol 60, Num 3, pp 629-633, issn 0030-4034Article

CHOICE OF CRITERIA FOR ELLIPSOMETRIC DETERMINATIONS ON THIN FILMSCAMAGNI P; MANARA A.1972; THIN SOLID FILMS; NETHERL.; DA. 1972; VOL. 13; NO 2; PP. 341-350; BIBL. 14 REF.Serial Issue

SENSITIVE PLATINUM FILM RESISTANCE THERMOMETERS FOR HEAT TRANSFER MEASUREMENTEVANS NA.1972; IN: ADV. INSTRUM. PROC. 27TH ANNU. INSTRUM. SOC. AMERICA CONF.; NEW YORK; 1972; PITTSBURGH, PA; INSTRUM. SOC. AMERICA; DA. 1972; VOL. 2; PP. (8 P.); BIBL. 2 REF.Conference Proceedings

REVETEMENTS ANTIREFLECHISSANTS DANS LE VIDE POUSSEDUTU D; GEORGESCU C; MEDIANU R et al.1972; STUD. CERC. FIZ.; ROMAN.; DA. 1972; VOL. 24; NO 10; PP. 1277-1284; ABS. ANGL.; BIBL. 6 REF.Serial Issue

GHOST IMAGERY INTENSITY AND DURABILITY OF SELECTED ANTI-REFLECTANT COATINGSPROVINES WF; TARGOVE BD; KISLIN B et al.1973; AMER. J. OPTOM. ARCH. AMER. ACAD. OPTOM.; U.S.A.; DA. 1973; VOL. 50; NO 1; PP. 34-39; BIBL. 6 REF.Serial Issue

CARACTERISTIQUES OPTIQUES DES COUCHES MULTIPLES REFLECHISSANTES A DISPERSION ELEVEE DU DEPHASAGESHKLYAREVSKIJ IN; UMEROV RI; LUPASHKO EA et al.1972; ZH. PRIKL. SPEKTROSK., BELORUS. S.S.R.; S.S.S.R.; DA. 1972; VOL. 17; NO 4; PP. 682-686; BIBL. 10 REF.Serial Issue

PROPRIETES OPTIQUES DE QUELQUES REVETEMENTS ABSORBANTS DANS LE DOMAINE SPECTRAL IRBURKIN AL; NOVIKOV AF.1972; ZH. PRIKL. SPEKTROSK., BELORUS. S.S.R.; S.S.S.R.; DA. 1972; VOL. 17; NO 4; PP. 655-660; BIBL. 6 REF.Serial Issue

DETERMINATION OF THE RELATIVE NITROGEN DOPING LEVEL OF TANTALUM NITRIDE RESISTOR FILM BY MEANS OF THE SEEBECK EFFECTTRUDEL ML.1972; I.E.E.E. TRANS. PARTS HYBR. PACKAG.; U.S.A.; DA. 1972; VOL. 8; NO 3; PP. 16-21; BIBL. 4 REF.Serial Issue

THIN FILMS1972; IN: 1972 INTER. MICROELECTRON. SYMP.; WASHINGTON, D.C.; 1972; PARK RIDGE; INTER. SOC. HYBRID MICROELECTRON.; DA. 1972; PP. (17 P.); BIBL. DISSEM.Conference Paper

ETUDE DES COUCHES MINCES DE TANTALE DEPOSEES PAR PROJECTION CATHODIQUE EN VUE DE DEFINIR LES PARAMETRES PHYSICO-CHIMIQUES PERMETTANT D'OBTENIR DES STRUCTURES BCC, QUADRATIQUE ET POREUSEMOULIN M.1970; DGRST-7072282; FR.; DA. 1970; PP. (40 P.); BIBL. DISSEM.; (RAPP. FINAL, ACTION CONCERTEE: COMPOSANTS CIRCUITS MICROMINIATURISES). 2 FASCReport

Proceedings of the 37th International Conference on Metallurgical Coatings and Thin Films (ICMCTF), San Diego, California (USA), April 26 - April 30, 2010ABADIAS, Gregory; MURATORE, Chris; PETROV, Ivan et al.Thin solid films. 2010, Vol 519, Num 5, issn 0040-6090, 277 p.Conference Proceedings

The 40th International Conference on Metallurgical Coatings and Thin FilmsAOUADI, Samir; BROITMAN, Esteban; KODAMBAKA, Suneel et al.Thin solid films. 2013, Vol 549, issn 0040-6090, 346 p.Conference Proceedings

STATE OF THE ART OF THIN FILM COMPONENTS.HEYWANG H; SCHAUER A.1975; ELELECTROCOMPON. SCI. TECHNOL.; G.B.; DA. 1975; VOL. 2; NO 1; PP. 61-66Article

ETUDE DE LA MICROANALYSE QUANTITATIVE PAR EMISSION IONIQUE SECONDAIRE. APPLICATIONS A LA CARACTERISATION DES COUCHES MINCES EPITAXIEES OU DIFFUSEES EN MICROELECTRONIQUEHUBER A; CROSET M; GROUILLET A et al.1972; DGRST-7270015; FR.; DA. 1972; PP. 1-24; H.T. 30; BIBL. 1 P. 1/2; (RAPP. FINAL, ACTION CONCERTEE: C.C.M.)Report

APPLICATIONS OF THIN FILMS IN MICROELECTRONICS = APPLICATIONS DES COUCHES MINCES EN MICROELECTRONIQUEANDERSON JC.1972; THIN SOLID FILMS; NETHERL.; DA. 1972; VOL. 12; NO 1; PP. 1-16; BIBL. 15 REF.Serial Issue

ZUR WEITERENTWICKLUNG DER THERMISCHEN ELEKTRONENSTRAHL-BEARBEITUNG DUENNER SCHICHTEN = SUR LES DEVELOPPEMENTS DE LA METHODE DU TRAITEMENT THERMIQUE DE COUCHES MINCES PAR UN FAISCEAU ELECTRONIQUESCHILLER S; HEISIG U; PANZER S et al.1972; NACHR.-TECH.; DTSCH.; DA. 1972; VOL. 22; NO 11; PP. 398-401Serial Issue

INFRARED PHOTOCONDUCTIVE LAYER PREPARED FROM PBO AND S FOR ELECTRON MIRROR IMAGE TUBES.ANDO T.1974; JAP. J. APPL. PHYS.; JAP.; DA. 1974; VOL. 13; NO 8; PP. 1301-1302; BIBL. 2 REF.Article

DEPLACEMENT ET RUPTURE D'UN FILM DE LIQUIDEUSPENSKIJ VA; KISELEV VM.1972; ZH. PRIKL. KHIM.; S.S.S.R.; DA. 1972; VOL. 45; NO 9; PP. 1996-2000; BIBL. 12 REF.Serial Issue

Thin-film graded optical filters for mini-spectrometersPIEGARI, A; BULIR, J; KRASILNIKOVA SYTCHKOVA, A et al.Proceedings of SPIE, the International Society for Optical Engineering. 2007, pp 67851S.1-67851S.7, issn 0277-786X, isbn 978-0-8194-6949-6, 1VolConference Paper

REVETEMENTS INTERFERENTIELS SPECULAIRES METALLODIELECTRIQUES A SOLIDITE MECANIQUE ACCRUEFURMAN SH A; VVEDENSKIJ VD.1977; OPT.-MEKH. PROMYSHL.; S.S.S.R.; DA. 1977; VOL. 44; NO 5; PP. 41-43; BIBL. 6 REF.Article

Effect of post-deposition aging on thin indium films = Effet du vieillissement après dépôt sur des couches minces d'indiumKAUSHIK, D. K; CHATTOPADHYAYA, S. K; NATH, N et al.Thin solid films. 1987, Vol 151, Num 2, pp 153-158, issn 0040-6090Article

Environmentary friendly process for preparing semiconducting and magnetic filmIZAKI, Masanobu; CHIGANE, Masaya; ISHIKAWA, Masami et al.Hyomen gijutsu. 2001, Vol 52, Num 1, pp 102-103, issn 0915-1869Article

Determination of the complex dielectric function of an unbacked or embedded thin film by grazing-incidence reflection or transmission ellipsometryAZZAM, R. M. A.Optics communications. 1990, Vol 80, Num 2, pp 103-106, issn 0030-4018Article

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