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Results 1 to 25 of 2158

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Influence of ion induced surface defects on the nucleation and formation mechanisms of metallic thin filmsDURAND, H.-A; SEKINE, K; ETOH, K et al.Surface & coatings technology. 2000, Vol 125, Num 1-3, pp 111-115, issn 0257-8972Conference Paper

SENSITIVE PLATINUM FILM RESISTANCE THERMOMETERS FOR HEAT TRANSFER MEASUREMENTEVANS NA.1972; IN: ADV. INSTRUM. PROC. 27TH ANNU. INSTRUM. SOC. AMERICA CONF.; NEW YORK; 1972; PITTSBURGH, PA; INSTRUM. SOC. AMERICA; DA. 1972; VOL. 2; PP. (8 P.); BIBL. 2 REF.Conference Proceedings

Proceedings of the 37th International Conference on Metallurgical Coatings and Thin Films (ICMCTF), San Diego, California (USA), April 26 - April 30, 2010ABADIAS, Gregory; MURATORE, Chris; PETROV, Ivan et al.Thin solid films. 2010, Vol 519, Num 5, issn 0040-6090, 277 p.Conference Proceedings

The 40th International Conference on Metallurgical Coatings and Thin FilmsAOUADI, Samir; BROITMAN, Esteban; KODAMBAKA, Suneel et al.Thin solid films. 2013, Vol 549, issn 0040-6090, 346 p.Conference Proceedings

Ultrafast investigation of electron dynamics in multi-layer metalsIBRAHIM, Wael M. G; ELSAYED-ALI, Hani E; BANNER, Carl E et al.International journal of heat and mass transfer. 2004, Vol 47, Num 10-11, pp 2261-2268, issn 0017-9310, 8 p.Article

THE DETERMINATION OF THIN LAYER THICKNESSES WITH AN ELECTRON MICROPROBEBUTZ R; WAGNER H.1973; SURF. SCI.; NETHERL.; DA. 1973; VOL. 34; NO 3; PP. 693-704; BIBL. 10 REF.Serial Issue

REPONSE DE QUARTZ PIEZOELECTRIQUE VIBRANT, REGLE EN TEMPERATURE, VIS-A-VIS DE DEPOT DE COUCHES METALLIQUES MULTIPLESMONCHY C; GOUAULT J; HUBIN M et al.1972; VIDE; FR.; DA. 1972; NO 162; PP. 264-268; BIBL. 10 REF.Serial Issue

REFLECTANCE OF VACUUM DEPOSITED MAGNESIUMHACMAN D; HEITMANN W.1973; APPL. OPT.; U.S.A.; DA. 1973; VOL. 12; NO 4; PP. 895; BIBL. 14 REF.Serial Issue

THERMAL-RADIATION PROPERTIES OF THIN METALLIC FILMS ON DIELECTRICSFORSBERG CH; DOMOTO GA.1972; IN: ANN. SOC. MECH. ENG. WINTER ANNU. MEET.; NEW YORK, N.Y., 1972; S.L.; A.S.M.E.; DA. 1972; VOL. HT-7; PP. 1-6; BIBL. 21 REF.Conference Paper

In vitro biocompatibility response of Ti-Zr-Si thin film metallic glassesKE, J. L; HUANG, C. H; CHEN, Y. H et al.Applied surface science. 2014, Vol 322, pp 41-46, issn 0169-4332, 6 p.Article

PROPAGATION LOSSES IN METAL-FILM-SUBSTRATE OPTICAL WAVEGUIDESGARMIRE EM; STOLL H.1972; I.E.E.E. J. QUANTUM ELECTRON.; U.S.A.; DA. 1972; VOL. 8; NO 10; PP. 763-766; BIBL. 13 REF.Serial Issue

TRANSIENT EDDY CURRENTS IN THIN METAL SHEETSSCHIEBER D.1972; I.E.E.E. TRANS. MAGNET.; U.S.A.; DA. 1972; VOL. 8; NO 4; PP. 775-779; BIBL. 13 REF.Serial Issue

Proceedings of the 39th International Conference on Metallurgical Coatings and Thin Films (ICMCTF 2012), San Diego, California (USA), April 23-27, 2012ABADIAS, Gregory; AOUADI, Samir; PETROV, Ivan et al.Thin solid films. 2013, Vol 528, issn 0040-6090, 278 p.Conference Proceedings

Transmission property and field distribution in metal-dielectric multilayer structureJIANG, X. Q; YUAN, H. M; ZHANG, B et al.Physica. E, low-dimentional systems and nanostructures. 2011, Vol 44, Num 3, pp 672-674, issn 1386-9477, 3 p.Article

Imaging standing surface plasmons by photon tunnelingPASSIAN, A; LEREU, A. L; WIG, A et al.Physical review B. Condensed matter and materials physics. 2005, Vol 71, Num 16, pp 165418.1-165418.6, issn 1098-0121Article

Broadband absorption spectroscopy via excitation of lossy resonance modes in thin filmsRAZANSKY, D; EINZIGER, P. D; ADAM, D. R et al.Physical review letters. 2005, Vol 95, Num 1, pp 018101.1-018101.4, issn 0031-9007Article

Chromium thin films oxidation by multipulsed laser heatingMARKEVICH, M. I; PODOLTSEV, A. S; CHAPLANOV, A. M et al.Fizika i himiâ obrabotki materialov. 2000, Num 6, pp 50-53, issn 0015-3214Article

Effect of process parameters on the optical constants of thin metal filmsTOMPKINS, H. G; BAKER, J. H; CONVEY, D et al.Surface and interface analysis. 2000, Vol 29, Num 3, pp 227-231, issn 0142-2421Conference Paper

Experimental Confirmation of Miniature Spiral Plasmonic Lens as a Circular Polarization AnalyzerWEIBIN CHEN; ABEYSINGHE, Don C; NELSON, Robert L et al.Nano letters (Print). 2010, Vol 10, Num 6, pp 2075-2079, issn 1530-6984, 5 p.Article

Deposition of metal films on an ionic liquid as a basis for a lunar telescopeBORRA, Ermanno F; SEDDIKI, Omar; ANGEL, Roger et al.Nature (London). 2007, Vol 447, Num 7147, pp 979-981, issn 0028-0836, 3 p.Article

The emission of light through thin metal films via surface plasmon- polaritonsGIANNATTASIO, Armando; WEDGE, Stephen; SMITH, Lucy H et al.Proceedings of SPIE, the International Society for Optical Engineering. 2005, issn 0277-786X, isbn 0-8194-5835-X, 2Vol, vol 1, 353-358Conference Paper

Method for measuring feature-scale planarization in copper chemical mechanical polishing processingLAURSEN, T; RUNNELS, S. R; BASAK, S et al.Journal of the Electrochemical Society. 2003, Vol 150, Num 4, pp G279-G283, issn 0013-4651Article

Giant magnetoresistance Co/Cu multilayer sensors for use in magnetic field mappingCHRISTIDES, C; STAVROYIANNIS, S; KALLIAS, G et al.Sensors and actuators. A, Physical. 1999, Vol 76, Num 1-3, pp 167-171, issn 0924-4247Conference Paper

A search for nuclear reactions in deuterated fresh iodide-titanium filmsCUEVAS, F; FERNANDEZ, J. F; SANCHEZ, C et al.Fusion technology. 1997, Vol 32, Num 4, pp 644-654, issn 0748-1896Article

Determination of thickness and optical constants of thin metal films with an extended ATR spectrumGU, J. H; CAO, Z. Q; SHEN, Q. S et al.Journal of physics. D, Applied physics (Print). 2008, Vol 41, Num 15, issn 0022-3727, 155309.1-155309.4Article

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