kw.\*:("Décharge électrostatique")
Results 1 to 25 of 537
Selection :
EOS/ESD Symposium 2005STADLER, Wolfgang.Microelectronics and reliability. 2007, Vol 47, Num 7, pp 1000-1073, issn 0026-2714, 73 p.Conference Paper
Transient charge decay in lined vessels and silosJONES, T. B.IEEE transactions on industry applications. 1990, Vol 26, Num 4, pp 646-650, issn 0093-9994Conference Paper
Bipolar SCR ESD protection in a 0.25 μm Si-Ge process using subcollector region modificationVASHCHENKO, V. A; CONCANNON, A; TER BEEK, M et al.IEEE international reliability physics symposium. 2004, pp 469-473, isbn 0-7803-8315-X, 1Vol, 5 p.Conference Paper
Picosecond discharges and stick-slip friction at a moving meniscus of mercury on glassBUDAKIAN, R; WENINGER, K; HILLER, R. A et al.Nature (London). 1998, Vol 391, Num 6664, pp 266-268, issn 0028-0836Article
Absolute humidity, relative humidity: which is more important in representing severity of electrostatic dischargeWAN, F; GE, J.-X; POMMERENKE, D et al.Electronics letters. 2013, Vol 49, Num 23, pp 1451-1452, issn 0013-5194, 2 p.Article
ESD and latch-up reliability for nanometer CMOS technologiesDUVVURY, Charvaka; BOSELLI, Gianluca.International Electron Devices Meeting. 2004, pp 933-936, isbn 0-7803-8684-1, 1Vol, 4 p.Conference Paper
Effect of Discharge Gap Shape on High-Speed Electrostatic Discharge EventsMASUGI, Masao; HIRASAWA, Norihito; AKIYAMA, Yoshiharu et al.IEICE transactions on communications. 2012, Vol 95, Num 12, pp 3898-3901, issn 0916-8516, 4 p.Article
Fabrication of Fine Particles of Semiconducting Polymers by Electrospray Deposition : Recent Progress in Molecular and Organic DevicesHIROSE, Yuto; NATORI, Itaru; SATO, Hisaya et al.IEICE transactions on electronics. 2011, Vol 94, Num 2, pp 164-169, issn 0916-8524, 6 p.Article
Advanced rail clamp networks for ESD protectionSTOCKINGER, Michael; MILLER, James W; KHAZHINSKY, Michael G et al.Microelectronics and reliability. 2005, Vol 45, Num 2, pp 211-222, issn 0026-2714, 12 p.Article
Using charged device model testing to eliminate real-world ESD failuresOLNEY, A. H.Microelectronics and reliability. 1998, Vol 38, Num 1, pp 129-143, issn 0026-2714Article
La compatibilité électromagnétique appliquée aux projets spatiaux : Electronique en environnements extrêmes = Electromagnetic compatibility applied to space programs : Electronics in severe environmentsCATANI, P.REE. Revue de l'électricité et de l'électronique. 1998, Num 1, issn 1265-6534, 28, 65-73 [10 p.]Article
Effect of discharge electrode and body geometry on the relative probability and severity of the ESD event in electronic systemsGREASON, W. D.Journal of electrostatics. 1990, Vol 24, Num 2, pp 167-183, issn 0304-3886Article
ELECTRIC CHARGING AND DISCHARGING PROCESSES OF MOVING PROJECTILESTER HASEBORG JL; TRINKS H.1980; I.E.E.E. TRANS. AEROSPACE ELECTRON. SYST.; USA; DA. 1980; VOL. 16; NO 2; PP. 227-231; BIBL. 9 REF.Article
A novel gate-suppression technique for ESD protectionMENG MIAO; SHURONG DONG; MINGLIANG LI et al.Microelectronics and reliability. 2012, Vol 52, Num 8, pp 1598-1601, issn 0026-2714, 4 p.Conference Paper
On-chip system level protection of FM antenna pin with improved linearityNOTERMANS, Guido; MAKSIMOVIC, Dejan; VERMONT, Gerd et al.Microelectronics and reliability. 2011, Vol 51, Num 12, pp 2129-2136, issn 0026-2714, 8 p.Article
An ESD protection circuit for SOI technology using gate- and body-biased MOSFET'SSALMAN, Akram; MITRA, Souvick; IOANNOU, Dimitris E et al.IEEE International SOI conference. 2002, pp 45-46, isbn 0-7803-7439-8, 2 p.Conference Paper
An ultra wide band test system to test the transient electric fields and magnetic fields generated by electrostatic discharge(ESD)HUANG, Jiu-Sheng; FANG LIU; DENG, Qi-Bin et al.ISAPE 2000 : international symposium on antennas, propagation and EM theory. 2000, pp 626-629, isbn 0-7803-6377-9Conference Paper
1997 Symposium on electrical overstress/electrostatic discharge (EOS/ESD)STOJADINOVIC, N. D; PECHT, M. G; VERHAEGE, Koen G et al.Microelectronics and reliability. 1998, Vol 38, Num 11, issn 0026-2714, 156 p.Conference Proceedings
On the frequency domain specification of ESD waveformsCHANG-YU WU; RUDKO, M; YU CHANG et al.Journal of electrostatics. 1990, Vol 24, Num 2, pp 197-206, issn 0304-3886Article
A case study of ESD failures at random levels: analysis, explanation and solutionWU, T; SMEDES, T; LOKKER, J. P et al.Microelectronics and reliability. 2004, Vol 44, Num 9-11, pp 1823-1827, issn 0026-2714, 5 p.Conference Paper
Electrostatic discharge (ESD) sensitivity of thin-film hybrid passive componentsTHIET THE LAI.IEEE transactions on components, hybrids, and manufacturing technology. 1989, Vol 12, Num 4, pp 627-638, issn 0148-6411Conference Paper
SATURN'S ELECTROSTATIC DISCHARGES: COULD LIGHTNING BE THE CAUSE.BURNS JA; SHOWALTER MR; CUZZI JN et al.1983; ICARUS; ISSN 0019-1035; USA; DA. 1983; VOL. 54; NO 2; PP. 280-295; BIBL. 2 P.Article
STATIC PROTECTION IN ELECTRONICS MANUFACTURINGBERBECO GR.1980; ELECTRON. PACK. PROD.; ISSN 0013-4945; USA; DA. 1980; VOL. 20; NO 7; PP. 148-157; 6 P.; BIBL. 4 REF.Article
An ESD test reduction method for complex devices : Electrostatic Discharge ReliabilityMAKSIMOVIC, Dejan; BLANC, Fabrice; NOTERMANS, Guido et al.Microelectronics and reliability. 2009, Vol 49, Num 12, pp 1465-1469, issn 0026-2714, 5 p.Conference Paper
Gate dielectric breakdown : A focus on ESD protectionWEIR, Bonnie E; LEUNG, Che-Choi; SILVERMAN, Paul J et al.IEEE international reliability physics symposium. 2004, pp 399-404, isbn 0-7803-8315-X, 1Vol, 6 p.Conference Paper