au.\*:("DEKKERS NH")
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DIFFERENTIAL PHASE CONTRAST IN A STEM.DEKKERS NH; DE LANG H.1974; OPTIK; DTSCH.; DA. 1974; VOL. 41; NO 4; PP. 452-456; BIBL. 6 REF.Conference Paper
ULTRAMICROSCOPY IN SCANNING MICROSCOPESBOUWHUIS G; DEKKERS NH.1980; OPTIK; DEU; DA. 1980; VOL. 56; NO 3; PP. 233-242; ABS. GER; BIBL. 6 REF.Article
A CALCULATION OF BRIGHT FIELD SINGLE-ATOM IMAGES IN STEM WITH HALF PLANE DETECTORSDEKKERS NH; DE LANG H.1978; OPTIK; DEU; DA. 1978; VOL. 51; NO 1; PP. 83-92; ABS. GER; BIBL. 5 REF.Article
A DETECTION METHOD FOR PRODUCING PHASE AND AMPLITUDE IMAGES SIMULTANEOUSLY IN A SCANNING TRANSMISSION ELECTRON MICROSCOPE.DEKKERS NH; DE LANG H.1977; PHILIPS TECH. REV.; NETHERL.; DA. 1977; VOL. 37; NO 1; PP. 1-9; BIBL. 16 REF.Article